G05B2219/37634

MACHINE TOOL
20180354088 · 2018-12-13 · ·

A machine tool is configured so that: a first frequency band comprising the main shaft characteristic vibration frequency and a second frequency band comprising the mechanical structure characteristic vibration frequency are set; thresholds are stored for each of the set frequency bands; vibration components are extracted for each of the frequency bands from the output of a vibration sensor; and when the vibration amplitude exceeds a threshold in either of the frequency bands, an alarm is sounded.

SMART BOX FOR AUTOMATIC FEATURE TESTING OF SMART PHONES AND OTHER DEVICES
20180316443 · 2018-11-01 ·

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

Smart box for automatic feature testing of smart phones and other devices

An automated test system for testing smart devices is presented. The system includes a system controller coupled to a smart device, wherein the system controller includes a memory with test logic and a processor. The system also includes an enclosure with a plurality of components. The plurality of components include (a) a robotic arm with a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; (b) a platform with a device holder, wherein the device holder is operable to hold a smart device inserted therein; (c) an audio capture and generator device; and (d) a microphone. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

Smart box for automatic feature testing of smart phones and other devices

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

Control system
12350844 · 2025-07-08 · ·

Provided is a control system that can control the operation of a robot with high accuracy. A control system 1 is provided with a sensor 44 that detects an acceleration that is based on the vibration of a robot 3, an interpolation unit 222 that interpolates a plurality of pieces of sensor data detected by the sensor 44, and a data generation unit 223 that generates combined data having a short sampling period on the basis of a plurality of pieces of interpolation data obtained through interpolation by the interpolation unit 222.

Substrate processing apparatus, method of manufacturing semiconductor device, and recording medium

There is provided a configuration that includes: at least one transfer mechanism configured to transfer a substrate and at least one processing mechanism configured to process the substrate; an earthquake detector configured to detect an earthquake; and a controller configured to control the at least one transfer mechanism and the at least one processing mechanism according to a detection result of the earthquake detector, wherein the controller is configured to be capable of performing a stopping operation of the at least one transfer mechanism according to a P wave (initial tremor wave) and an S wave (principal fluctuation wave).