A method for recovering a clock signal from a data signal by using a clock recovery module is described. Edge timings of the data signal are accumulated. The edge timings accumulated are transformed into one reference bit period. A time offset for the reference bit period is determined. A reference clock signal is determined based on the time offset. The number of bits within a system clock of the clock recovery module is determined. The clock signal is recovered based on the reference clock signal and the number of bits. Further, a clock recovery module as well as a computer program are described.

A semiconductor device has a timer unit and a processing unit. The timer unit includes a binary counter, a first converter that converts a first count value output from the binary counter to a gray code to output as first gray code data. The processing unit includes a first synchronizer that captures the first gray code data transferred from the timer unit in synchronization with the system clock signal and outputs the captured first gray code data as second gray code data, and a fault detection unit that generates a data for fault detection based on the first gray code data transferred from the timer unit and compares a second count value based on the second gray code data with a third counter value based on the data for fault detection.

The invention relates to a method for providing a fault-tolerant global time via a time server in a distributed real-time computer system, wherein the time server comprises four components which are connected to one another via a bi-directional communication channel. At a priori defined periodic, internal synchronization times, each of the four components transmits an internal synchronization message, which is simultaneously transmitted to the other three components, from which each internal computer of a component determines a correction term for the tick counter contained in its component and corrects the reading of the local tick counter by this correction term.

A system is provided for synchronizing clocks. The system includes a plurality of devices in a network, each device having a local clock. The system is configured to synchronize the local clocks according to a primary spanning tree, where the primary spanning tree has a plurality of nodes connected through a plurality of primary links, each node of the plurality of nodes representing a respective device of the plurality of devices. The system is also configured to compute a backup spanning tree before a failure is detected in the primary spanning tree, wherein the backup spanning tree includes one or more backup links that are different from the primary links. As such, upon detection of a failure in the primary spanning tree, the system reconfigures the plurality of devices such that clock synchronization is performed according to the backup spanning tree.

A clock fractional divider module which is formed as, comprises or has integrated therein a dual-core lock step unit. The dual-core lock step unit is configured in order to realize a clock fractional division arrangement, mechanism or process accompanied by an error detection, recognition and/or correction arrangement, mechanism or process.

A method for detecting faults in a memory system includes performing an operation on at least one memory cell of the memory system. The method also includes receiving, during performance of the operation, a first clock cycle count for a first pulse of a charge pump associated with the at least one memory cell. The method also includes receiving, during performance of the operation, a second clock cycle count for a second pulse of the charge pump. The method also includes determining whether a fault will occur based on a difference between the first clock cycle count and the second clock cycle count.

A clock data recovery circuit includes a deglitch filter circuit and a timer circuit. The deglitch filter circuit is configured to remove pulses of less than a predetermined duration from a data signal to produce a deglitched data signal. The timer circuit is coupled to the deglitch filter, and is configured to compare a duration of a pulse of the deglitched data signal to a threshold duration, and identify the pulse as representing a logic one based on the duration of the pulse exceeding the threshold duration.

A method for detecting faults in a memory system includes performing an operation on at least one memory cell of the memory system. The method also includes receiving, during performance of the operation, a first clock cycle count for a first pulse of a charge pump associated with the at least one memory cell. The method also includes receiving, during performance of the operation, a second clock cycle count for a second pulse of the charge pump. The method also includes determining whether a fault will occur based on a difference between the first clock cycle count and the second clock cycle count.

A circuit and methods of operation thereof are provided for robust protection against soft errors. The circuit includes a first set of storage elements coupled to and configured to sample a set of data inputs at a first set of times. The circuit includes a second set of storage elements coupled to and configured to sample the set of data inputs at a second set of times. A first parity generator generates a first parity check for the set of data inputs and a second parity generator generates a second parity check for output of the first set of storage elements. An error correction unit compares the first parity check and the second parity check to detect occurrences of error conditions in the circuit. The error correction unit may control output or operating characteristics of the circuit as a result of error conditions detected.

A memory device includes a path state check circuit configured to check states of signal transmission paths, each signal transmission path including a data transmission path and a clock transmission path of the memory device. The path state check circuit includes a sampling circuit configured to perform a sampling operation by using pattern data that has passed through the data transmission path and a clock signal that has passed through the clock transmission path, and generate sample data, and a management circuit configured to generate a comparison of the sample data with the pattern data and manage check result information indicating whether a re-training operation for the memory device is to be performed, based on a result of the comparison.