A system and method for facilitating testing of peripheral devices is disclosed. The system can be a USB virtual device that storing a plurality of class libraries associated with a set of peripheral nodes. The plurality of class libraries enable communication between a peripheral node and a testing platform. The system receives an access request from the testing platform for initiating a test cycle on a target peripheral node from the set of peripheral nodes. The system activates a class library associated with the target peripheral node, from the plurality of class libraries for enabling communication between the testing platform and the target peripheral node. Further, the system transmits an acknowledgement message to the testing platform to initiate the test cycle on the target peripheral node, using the class library, based on a test suit corresponding to the target peripheral node.

Systems, methods, and apparatus for testing devices adapted for connection to other devices using universal serial bus (USB) are disclosed. Devices to be tested are caused to enter a special mode of operation when resistance measured at one or more terminals of a USB Type-C connector have values associated with the special mode of operation. One or more operations of the device are automatically initiated when the resistance coupled to the at least one terminal of the connector has a measured value that matches one of a set of resistance values maintained by the device. The one or more operations may include configuring a power management circuit based on the measured value, and entering a mode of operation that controls startup of at least one processor on the device when the measured value matches a first resistance value.

A variety of applications can include systems and methods that include a memory system tester having an analyzer coupled to a test flow controller. The test flow controller can be arranged to generate test signals to a memory system with the analyzer arranged to couple to test pads of a package platform for the memory system. The analyzer can provide data to the test flow controller to conduct testing and/or debugging of the memory system, with the data based on real time monitoring of the test pads of the package platform. In various embodiments, the analyzer can provide data feedback to the test flow controller in real time such that the test flow controller can control the flow of test signals to the memory system in real time. Additional apparatus, systems, and methods are disclosed.

An interconnect offload component arranged to operate in an offloading mode, and a memory access component for enabling access to a memory element for functional data transmitted over a debug network of a signal processing device.

In the offloading mode the interconnect offload component is arranged to receive functional data from an interconnect client component for communication to a destination component, and forward at least a part of the received functional data to a debug network for communication to the destination component via the debug network.

The memory access component is arranged to receive a debug format message transmitted over the debug network, extract functional data from the received debug format message, said functional data originating from an interconnect client component for communication to a memory element, and perform a direct memory access to the memory element comprising the extracted functional data.

A serial interface, such as a serial peripheral interface (SPI), with improved diagnostic coverage is disclosed. The serial interface includes a data verification module that selects an error detection value in response to a mode signal indicating if the transmitting device is in user mode or test mode. For example, the data verification module computes a cyclic redundancy check (CRC) value and selects either the computed CRC value or its inverse based on the mode. The receiving device can determine the mode of the transmitting device based on the error detection value used. The serial interface further includes a read detector for clearing the transmit data buffer after data is read out. The serial interface may further include a loopback circuit for verifying that the data output from an output pin matches the data from the transmit data buffer.

A bus monitoring device and method, a non-transitory computer-readable storage medium, and an electronic device are disclosed. The bus monitoring method may include: arranging monitoring nodes in a bus, with each monitoring node arranged in one of subsystems to be tested of the bus, where the monitoring nodes are connected in series in a ring topology (202); acquiring a test vector and sending a test message according to the test vector to one of the monitoring nodes to transmit the test message across the monitoring nodes, the test vector being configured to instruct each monitoring node to execute the test message and acquire test information of the respective subsystem to be tested, where the test information is configured to indicate information of the bus of the respective subsystem to be tested when the monitoring node executes the test message (204).

An accelerator manager monitors and logs performance of multiple accelerators, analyzes the logged performance, determines from the logged performance of a selected accelerator a desired programmable device for the selected accelerator, and specifies the desired programmable device to one or more accelerator developers. The accelerator manager can further analyze the logged performance of the accelerators, and generate from the analyzed logged performance an ordered list of test cases, ordered from fastest to slowest. A test case is selected, and when the estimated simulation time for the selected test case is less than the estimated synthesis time for the test case, the test case is simulated and run. When the estimated simulation time for the selected test case is greater than the estimated synthesis time for the text case, the selected test case is synthesized and run.

An application processor includes a central processing unit, a root complex that communicates with at least one external device under control of the central processing unit and generates a state change interrupt when an operation state changes, and an interrupt aggregation and debug unit that performs debugging on at least one component associated with the state change interrupt depending on the state change interrupt.

A serial-connection is tested by transmitting a PRBS generated using a kth-order monic-polynomial from transmission-circuitry to reception-circuitry, and determining operation is proper based upon the PRBS received. The PRBS is formed by generating x intermediate-words of the PRBS, x being a result of an integer-divide between a total number of bits in the PRBS and a bit-width of a serializer that transmits the PRBS, generating a leading-word of the PRBS as having first y-bits of the PRBS as its LSBs, y being based upon a modulo-divide between the total number of bits in the PRBS and x, and generating a trailing-word of the PRBS as having last z-bits of the PRBS as its MSBs, z being based upon a difference between a result of the modulo-divide and y. The PRBS is transmitted sequentially as the leading-word of the PRBS, the intermediate-words of the PRBS, and the trailing-word of the PRBS.

A judgment method for hardware compatibility is disclosed. The judgment method is operated with a first electrical device and a second electrical device having a plurality of transmission interfaces. The judgment method is started after the first electrical device electrically connected to one of the transmission interfaces of the second electrical device. The judgment method includes an interface information capturing process, a compatibility comparison process, a compatibility determination process and a recommendation execution process. In the interface information capturing process, the interface information of the transmission interface of the second electrical device connected to the first electrical device is captured. In the compatibility comparison process, the interface information is compared with a compatibility database to obtain a comparison result. In the compatibility determination process, the comparison result is compared with the interface information of another transmission interface of the second electrical device to obtain a determination result. In the recommendation execution process, a recommendation information is provided according to the determination result.