Systems and devices can include an error injection register comprising error injection parameter information. The systems and devices can also include error injection logic circuit to read error injection parameter information from the error injection register, and inject an error into a flow control unit (Flit); and protocol stack circuitry to transmit the Flit comprising the error on a multilane link. The injected error can be detected by a receiver and used to test and characterize various aspects of a link, such as bit error rate, error correcting code, cyclic redundancy check, replay capabilities, error logging, and other characteristics of the link.

A test method includes: generating an error correction code according to a base data; dividing the base data into a plurality of base data sections; generating a plurality of candidate testing data according to the base data, wherein each of the candidate testing data has a plurality of testing data sections, and each of the testing data sections corresponds to each of the base data sections; and, performing a plurality of testing schemes. Each of the testing schemes includes: generating a plurality of write-in test data according to the plurality of candidate testing data, and writing the plurality of write-in test data with the error correction code into a tested device continuously; reading a plurality of mode register values of the tested device and a plurality of readout data from the tested device; and generating a test result according to the plurality of mode register value and the readout data.

Error injection techniques involve, while a data storage system is in an error injection mode, injecting information representing an error of a storage device array into a first switch, such that the information representing the error is passed from a first downstream port of the first switch to a computing device through a second switch, the first and second switches being connected to the storage device array via downstream ports, and the first downstream port being connected to a second downstream port of the second switch; and determining error handling capability of the data storage system by obtaining a handling result of the information representing the error from the computing device. Accordingly, errors from storage devices can be simulated to facilitate detecting error handling in the entire I/O path comprehensively.

Systems, apparatuses and methods may provide for technology that detects a startup of a system on chip (SoC) and injects, during the startup, one or more domain startup errors into a plurality of domains on the SoC. Additionally, the technology may determine whether the domain startup error(s) were detected during the startup. In one example, the plurality of domains include one or more fabric interfaces.

A semiconductor memory device which includes a memory cell array, an error injection register set, a data input buffer, a write data generator, and control logic. The error injection register set stores an error bit set, including at least one error bit, based on a first command. The error bit set is associated with a data set to be written in the memory cell array. The data input buffer stores the data set to be written in the memory cell array based on a second command. The write data generator generates a write data set to be written in the memory cell array based on the data set and the error bit set. The control logic controls the error injection register set and the data input buffer.

A device for supporting a test mode for memory testing according to an example embodiment of the inventive concepts may include a memory configured to receive and store writing data and output reading data from the stored writing data; an error correction code (ECC) engine configured to generate the writing data by encoding input data and to generate output data by correcting error bits of N bits or less included in receiving data when N is a positive integer; and an error insertion circuit configured to provide the reading data to the ECC engine as the receiving data in a normal mode and to provide data obtained by inverting at least one bit of less than N bits of the reading data to the ECC engine as the receiving data in the test mode.

A method, apparatus and system for providing a cloud-based disaster recovery test include receiving, at a cloud-based computing platform, a request for a disaster recovery test of at least a portion of a client's data network, in response to the received request, creating an isolated network in the cloud-based computing platform, cloning, in the isolated network, machines and configurations of the at least the portion of the client's data network to be included in the cloud-based disaster recovery test, reserving resources of the cloud-based computing platform based on the cloned machines and configurations of the at least the portion of the client's data network and an associated data handler to be deployed in the cloud-based disaster recovery test, and enabling the cloned machines for use by the client for performing the cloud-based disaster recovery test in the cloud-based computing platform.

One example includes a system. The system includes an error injection system. The error injection system includes an error injector to store a programmable control structure to define a memory error. The error injector being further used to inject the memory error into a respective one of a plurality of memory storage elements associated with a memory system at a predetermined address via an address controller and to determine if the memory error at the predetermined address associated with the respective one of the plurality of memory storage elements is corrected via error-correcting code (ECC) memory associated with the memory system.

In embodiments, an apparatus may comprise random access memory (RAM); an error detecting and/or correcting code (EDCC) encoder to generate and add an error detecting and/or correcting code to a datum being written into the memory for storage; and an EDCC decoder to use the error detecting and/or correcting code added to the datum to correct one or more bits of error in the datum when the datum with the added error detecting and/or correcting code is read back from the RAM. Further, the apparatus may include an error detection and/or correction checker to inject one or more bits of error into the datum when the datum with the added error and/or correcting code is read back from the RAM, and check whether the EDCC decoder is able to correct the one or more bits of error injected into the datum.

There is a need to detect faults on a path between a memory access circuit and a shared resource, faults in a logic circuit, and faults in the shared resource. A semiconductor device includes: a first memory access circuit; a second memory access circuit to check the first memory access circuit; a memory that outputs a memory address based on a first access address input from the first memory access circuit; a duplexing comparison circuit that compares the first access address with a second access address output from the second memory access circuit; a first address comparison circuit that compares the first access address with the memory address; and an error control circuit that outputs a control signal based on a comparison result from the duplexing comparison circuit and a comparison result from the first address comparison circuit.