A display panel and a testing method thereof, the display panel including a product region and a cutting region, and the product region including a display sub-region and a non-display sub-region. The display panel includes a flexible substrate, a thin film transistor layer, an organic light-emitting layer, a encapsulation layer, and a touch layer. The touch layer includes touch electrodes and touch leads. An end of each of the touch leads is connected to a corresponding touch electrode, the other end of each of the touch leads extends from the non-display sub-region to the cutting region, and a density of the touch leads in the cutting region is less than a density of the touch leads in the non-display sub-region.

A method for detecting a Direct Memory Access (DMA) address capability at high address values when testing PCIe devices is disclosed. The method includes enabling an input/output (I/O) memory management unit (IOMMU); remapping physical addresses to virtual addresses at a high end of an address range; adding a peripheral component interconnect express (PCIe) device; and mapping physical memory addresses to high value memory addresses.

In a controller (10), a CPU device #1 has a first authority to manage a peripheral device #1, and is a management device for the peripheral device #1. Each of a CPU device #2 and a CPU device #3 is a general device that has a second authority, which is lower than the first authority, for the peripheral device #1. Upon failing to read data from the peripheral device #1, the general device executes a diagnosis on the peripheral device #1 based on the second authority. The diagnosis by the general device causes the CPU device #1, which is the management device for the peripheral device #1, to receive an error notification indicating the error in the peripheral device #1. Upon receiving the error notification, the CPU device #1, which is the management device, handles the error in the peripheral device #1 based on the first authority.

Devices, systems, and methods for event input device testing are described herein. In some examples, one or more embodiments include a controller comprising a memory and a processor to execute instructions stored in the memory to cause a first event input device of a group of event input devices to perform an automated test process, and determine whether a second event input device of the group of event input devices has detected a hazard event while the first event input device is performing the automated test process.

A method for configuring a touch sensor system is provided. The method may be performed automatically by a controller of the system. The system comprises a touch panel operatively coupled to the controller, where the touch panel comprises a plurality of transmit electrodes and a plurality of receive electrodes. The method comprises selectively and individually driving, by the controller, at least one of the transmit electrodes. For each driven transmit electrode, signal outputs from one or more of the receive electrodes are received while the transmit electrode is driven. One or more characteristics of the touch panel is determined as a function of the signal outputs from the receive electrodes. At least one operation setting of the controller is configured based on the one or more characteristics. The one or more characteristics of the touch panel may include a number of transmit electrodes and a number of receive electrodes.

A merged infrastructure for manufacturing and lifecycle management of both hardware and software is disclosed. In various embodiments, a library comprising a superset of device drivers is stored, the superset including for each of a plurality of supported systems a corresponding set of device drivers for devices comprising that supported system. A context in which a processor is deployed is determined, the context being associated with a specific corresponding one of the plurality of supported systems. The library is used to provision based on the determined context at least a subset of devices accessible by the processor in the context in which the processor is deployed.

An anomaly detector includes a writing unit that writes anomaly detection data readable by an external diagnostic device to an external memory when an anomaly is detected in an on-board device. Further, the anomaly detector includes a determination unit that determines whether a failure is occurring in a memory, which is used when a processor is operated during the writing unit performs the writing. Also, the anomaly detector includes a resetting unit that resets the memory by activating a specified one of reset functions of the processor when the determination unit determines that a failure is occurring in the memory. When the determination unit determines that a failure is occurring in the memory, the writing unit writes the anomaly detection data after the memory is reset by the specified one of the reset functions.

Systems and methods are provided for monitoring the status of a touchscreen at a display assembly. Signals are transmitted to the touchscreen. Where signals received from the touchscreen are modified in a manner inconsistent with expected touch input, a type and a location of damage to the touchscreen is determined based on the signals received from the touchscreen, and a visual representation is generated at a remote device of the type and the location of the damage at the touchscreen.

An electronic device, which can enter a debug mode, comprising: a plurality of buttons, wherein a layout of the buttons correspond to one of a first button layout and a second button layout; a processing circuit, configured to control the electronic device to enter a debug mode when at least two of the buttons are pressed to meet a predetermined button combination. The processing circuit controls the electronic device to perform a first test corresponding to the first button layout or to perform a second test corresponding to the second button layout to detect which one of the first button layout and the second button layout does the electronic device correspond to.

The present application provides a touch control substrate, a test method thereof, and a manufacturing method of a touch control screen. The touch control substrate includes touch control electrodes, test terminals, and electrical connection members. Each of the test terminals is connected to two adjacent touch control electrodes. Each of the electrical connection members corresponds to each of the touch control electrodes. The touch control electrodes are electrically connected to the test terminals through the electrical connection members. The touch control electrodes form a series circuit through the corresponding electrical connection members and the corresponding test terminals.