An example data processing engine (DPE) for a DPE array in an integrated circuit (IC) includes a core, a memory including a data memory and a program memory, the program memory coupled to the core, the data memory coupled to the core and including at least one connection to a respective at least one additional core external to the DPE; support circuitry including hardware synchronization circuitry and direct memory access (DMA) circuitry each coupled to the data memory, and a stall circuit coupled to the core configured to stall or resume the core in response to one or more inputs.

In a debugging method for an integrated circuit device which has multiple processing cores, a debugging breakpoint is activated at a first processor core in the integrated circuit device. Upon activation, the debugging breakpoint stops execution of instructions in the first processor core and the debugging breakpoint is communicated to a second processor core in the integrated circuit device.

To detect an abnormality in an interrupt control system without completely depending on dualization of a circuit, without the need to create a test pattern for a built-in self-test by spending time, and without considerably increasing an amount of power consumption. A test interrupt request is generated periodically using a timer or the like in an interrupt signal system from an interrupt controller to a central processing unit, the state of an interrupt request flag within the interrupt controller is checked in an interrupt processing routine, and in the case where it is detected that the same interrupt request flag is kept in a set state twice or more in succession, it is supposed that there is a high possibility that a failure has occurred in the interrupt signal system and it is considered that there is an abnormality.

Embodiments herein provide a testing apparatus (whether physical or simulated) for testing a non-core MMU in a processor chip. Unlike core MMUs, non-core MMUs may be located in a part of the processor chip outside of the processing cores in the chip. Instead of being used to perform address translation requests sent by the processing core, the non-core MMUs may be used by other hardware modules in the processor chip such as compression engines, crypto engines, accelerators, etc. In one embodiment, the testing apparatus includes a MMU testor that transmits the translation requests to the non-core MMU which tests its functionality. Using the data provided in the translation requests, the non-core MMU performs virtual to physical address translations. The non-core MMU transmits the results of these translations to the MMU testor which compares these results to expected results to identify any design flaws in the non-core MMU.

Embodiments herein provide a testing apparatus (whether physical or simulated) for testing a non-core MMU in a processor chip. Unlike core MMUs, non-core MMUs may be located in a part of the processor chip outside of the processing cores in the chip. Instead of being used to perform address translation requests sent by the processing core, the non-core MMUs may be used by other hardware modules in the processor chip such as compression engines, crypto engines, accelerators, etc. In one embodiment, the testing apparatus includes a MMU testor that transmits the translation requests to the non-core MMU which tests its functionality. Using the data provided in the translation requests, the non-core MMU performs virtual to physical address translations. The non-core MMU transmits the results of these translations to the MMU testor which compares these results to expected results to identify any design flaws in the non-core MMU.

To detect an abnormality in an interrupt control system without completely depending on dualization of a circuit, without the need to create a test pattern for a built-in self-test by spending time, and without considerably increasing an amount of power consumption. A test interrupt request is generated periodically using a timer or the like in an interrupt signal system from an interrupt controller to a central processing unit, the state of an interrupt request flag within the interrupt controller is checked in an interrupt processing routine, and in the case where it is detected that the same interrupt request flag is kept in a set state twice or more in succession, it is supposed that there is a high possibility that a failure has occurred in the interrupt signal system and it is considered that there is an abnormality.

Embodiments herein provide a testing apparatus (whether physical or simulated) for testing a non-core MMU in a processor chip. Unlike core MMUs, non-core MMUs may be located in a part of the processor chip outside of the processing cores in the chip. Instead of being used to perform address translation requests sent by the processing core, the non-core MMUs may be used by other hardware modules in the processor chip such as compression engines, crypto engines, accelerators, etc. In one embodiment, the testing apparatus includes a MMU testor that transmits the translation requests to the non-core MMU which tests its functionality. Using the data provided in the translation requests, the non-core MMU performs virtual to physical address translations. The non-core MMU transmits the results of these translations to the MMU testor which compares these results to expected results to identify any design flaws in the non-core MMU.

Embodiments herein provide a testing apparatus (whether physical or simulated) for testing a non-core MMU in a processor chip. Unlike core MMUs, non-core MMUs may be located in a part of the processor chip outside of the processing cores in the chip. Instead of being used to perform address translation requests sent by the processing core, the non-core MMUs may be used by other hardware modules in the processor chip such as compression engines, crypto engines, accelerators, etc. In one embodiment, the testing apparatus includes a MMU testor that transmits the translation requests to the non-core MMU which tests its functionality. Using the data provided in the translation requests, the non-core MMU performs virtual to physical address translations. The non-core MMU transmits the results of these translations to the MMU testor which compares these results to expected results to identify any design flaws in the non-core MMU.

To detect an abnormality in an interrupt control system without completely depending on dualization of a circuit, without the need to create a test pattern for a built-in self-test by spending time, and without considerably increasing an amount of power consumption. A test interrupt request is generated periodically using a timer or the like in an interrupt signal system from an interrupt controller to a central processing unit, the state of an interrupt request flag within the interrupt controller is checked in an interrupt processing routine, and in the case where it is detected that the same interrupt request flag is kept in a set state twice or more in succession, it is supposed that there is a high possibility that a failure has occurred in the interrupt signal system and it is considered that there is an abnormality.

A memory device and a control method of the memory device are provided. The control method includes: providing access count values to memory rows of the memory device respectively when the memory row are accessed; performing a refresh operation on the memory rows sequentially and resetting the access count values sequentially in response to a refresh command; receiving an interrupt command to interrupt the refresh operation, wherein the refresh operation is interrupted when performing on an interrupt memory row; completing the refresh operation on the interrupt memory row; and recharging at least one adjacent memory row next to the interrupt memory row.