The technology disclosed relates to runtime execution of configuration files on reconfigurable processors with varying configuration granularity. In particular, the technology disclosed relates to a runtime logic that is configured to receive a set of configuration files for an application, and load and execute a first subset of configuration files in the set of configuration files and associated application data on a first reconfigurable processor. The first reconfigurable processor has a first level of configurable granularity. The runtime logic is further configured to load and execute a second subset of configuration files in the set of configuration files and associated application data on a second reconfigurable processor. The second reconfigurable processor has a second level of configurable granularity that is different from the first level of configurable granularity.

Disclosed is a capability test method based on a joint test support platform. The method includes steps of describing an initial capability in a test, combining a capability to be developed based on the initial capability, and determining an evaluation strategy and a joint task background information of the test. Further, the method includes generating a logical shooting range for the joint test support platform according to the joint task background information, developing a test scenario according to the joint task background information and the logical shooting range, decomposing the test scenario, determining a test plan corresponding to the test scenario, executing the test according to the test plan, analyzing and evaluating a test result of the test, and generating one or more joint capability evaluation reports for the test.

A method, computer program product, and/or system is disclosed for identifying special cases for testing an integrated circuit that includes defining interesting cases, preferably by a user; obtaining an instruction from an instruction set architecture (ISA); determining that there is an interesting case for the obtained instruction; computing (i) a size of the input space (I.sub.0) of the ISA, and (ii) an interesting case space (I.sub.i) which is an input space leading to the interesting case for the obtained instruction; obtaining a special case fraction by dividing the interesting case space (I.sub.i) by the input space (I.sub.0); determining a special case fraction (I.sub.i)/(I.sub.0) is less than a threshold; and identifying, in response to the special case fraction being less than the threshold, the interesting case as a special case. In an approach the special case is documented.

Methods and apparatus for automatic qubit calibration. In one aspect, a method includes obtaining a plurality of qubit parameters and data describing dependencies of the plurality of qubit parameters on one or more other qubit parameters; identifying a qubit parameter; selecting a set of qubit parameters that includes the identified qubit parameter and one or more dependent qubit parameters; processing one or more parameters in the set of qubit parameters in sequence according to the data describing dependencies, comprising, for a parameter in the set of qubit parameters: performing a calibration test on the parameter; and performing a first calibration experiment or a diagnostic calibration algorithm on the parameter when the calibration test fails.

Aspects of the present disclosure provide a processor having: an execution unit configured to execute machine code instructions, at least one of the machine code instructions requiring multiple cycles for its execution; instruction memory holding instructions for execution, wherein the execution unit is configured to access the memory to fetch instructions for execution; an instruction injection mechanism configured to inject an instruction into the execution pipeline during execution of the at least one machine code instruction fetched from the memory; the execution unit configured to pause execution of the at least one machine code instruction, to execute the injected instruction to termination, to detect termination of the injected instruction and to automatically recommence execution of the at least one machine code instruction on detection of termination of the injected instruction.

In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Lockstep comparators and related methods are described. An example apparatus includes self-test logic circuitry having first outputs, and comparator logic including selection logic having first inputs and second outputs, ones of the first inputs coupled to the first outputs, first detection logic having second inputs and third outputs, the second inputs coupled to the second outputs, second detection logic having third inputs and fourth outputs, the third inputs coupled to the third outputs, latch logic having fifth inputs and fifth outputs, the third output and the fourth output coupled to the fifth inputs, and error detection logic having sixth inputs coupled to the fifth inputs.

The present invention provides a smart overclocking method for a computer device with a multi-core CPU and abasic input/output system (BIOS) where an overclocking database is stored therein, which comprises: booting the computer device, logging in the BIOS and performing an overclocking function; acquiring overclocking parameters from the overclocking database; conducting adjustment/settlement of the clock rate and the voltage of the multi-core CPU based on the overclocking parameters; conducting a Heavy Load Testing (HLT) on the multi-core CPU; reading out working results data of the multi-core CPU and determining whether any of them have exceeded limits. Hence, overclocking can be completed within 10 min. or less, without causing shut down of the computer device, and without causing working temperature or working voltage of multi-core CPU to be higher than 90° C. or 1500 mV during Heavy Load Testing (HLT).

A system and method for a virtual processor base/virtual execution context arrangement. The disclosed arrangement utilizes chiplets comprising core logic and defined instruction sets. The chiplets are adapted to operate in conjunction with one or more active execution contexts to enable the execution of particular processes. In particular, the defined instruction sets includes a instructions for processor debugging. The system and method support the compartmentalization of such debugging instructions so as to provide enhanced processor and process security.

This document describes apparatuses, systems, and techniques directed to a modular system validation platform for computing devices. The modular system validation platform includes an interface board for interfacing a host with a peripheral. The interface board includes an apparatus identifier, a first connector configured to couple to the host, and a second connector configured to couple to the peripheral. The interface board comprises interface circuitry that can be reconfigured to enable different peripherals to operate with the host using the same interface board. The interface circuitry enables the interoperability between the host and the peripheral by distributing power from the host to the peripheral and facilitating communications between the host and the peripheral. By using the reconfigurable interface board to test and troubleshoot the interoperability of the processor and the peripheral, resources, time and costs spent during the design and testing phases of computing devices may be minimized.