A computer-implemented method is provided for redundancy reduction for driving test scenarios. The method includes receiving an original test set of driving scenarios and a driving model which simulates a vehicle behavior under a driving scenario inputted to the driving model. The method includes, for each driving scenario of the original test set, obtaining vehicle dynamics timeseries data as an output of the driving model. The method includes determining similar driving scenarios by comparing driving model outputs. The method additionally includes creating a new test set of driving scenarios by discarding duplicated ones of the similar driving scenarios from the original test set.

A method includes receiving data characterizing digital content from a repository of digital content. The method also includes receiving data characterizing a right to use the digital content from a store configured to sell a right to use the digital content to a customer associated with a non-destructive testing device. The method further includes performing an inspection of machinery using the non-destructive testing device based on the received digital content and the received right to use the digital content. The inspection can be performed by one or more of executing, using, and displaying the digital content. Related systems, devices, and non-transitory computer-readable mediums are also described.

A method includes receiving data characterizing digital content from a repository of digital content. The method also includes receiving data characterizing a right to use the digital content from a store configured to sell a right to use the digital content to a customer associated with a non-destructive testing device. The method further includes performing an inspection of machinery using the non-destructive testing device based on the received digital content and the received right to use the digital content. The inspection can be performed by one or more of executing, using, and displaying the digital content. Related systems, devices, and non-transitory computer-readable mediums are also described.

In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

In various examples, one or more components or regions of a processing unit—such as a processing core, and/or component thereof—may be tested for faults during deployment in the field. To perform testing while in deployment, the state of a component subject to test may be retrieved and/or stored during the test to maintain state integrity, the component may be clamped to communicatively isolate the component from other components of the processing unit, a test vector may be applied to the component, and the output of the component may be compared against an expected output to determine if any faults are present. The state of the component may be restored after testing, and the clamp removed, thereby returning the component to its operating state without a perceivable detriment to operation of the processing unit in deployment.

Various embodiments described herein provide for in-service scanning and correction of stored data for achieving functional safety. For some embodiments, a data scanning and correction system periodically reads data from different portions (e.g., addresses) of a storage device (e.g., memory) implemented with ECC to detect any errors in the data. If an error is detected, the data scanning and correction system generates corrected data and rewrites the corrected data to the portion of the storage device. The data scanning and correction system may continuously cycle this process through different portions of the storage device to detect and correct errors while the storage device is in-service.

A system, apparatus, and method for testing blocks of a system on a chip (SOC) are described herein. An SOC, in accordance with various embodiments, may include a serial communication interface configured to multiplex, serialize, and/or parallelize signals streams from selected blocks of the SOC to an off-chip test unit through an off-chip serial communication interface. Other embodiments may be described and claimed.

An integrated circuit includes an intellectual property core, scan data pipeline circuitry configured to convey scan data to the intellectual property core, and scan control pipeline circuitry configured to convey one or more scan control signals to the intellectual property core. The integrated circuit also includes a wave shaping circuit configured to detect a trigger event on the one or more scan control signals and, in response to detecting the trigger event, suppress a scan clock to the intellectual property core for a selected number of clock cycles.

This disclosure relates to techniques for updating a memory map maintained by processing circuitry that is coupled to programmable logic circuitry. One of the techniques may involve detecting reconfiguration of a device component formed on a portion of the programmable logic circuitry using monitoring circuitry. The technique may further include generating a notification event based on the reconfiguration of the device component using the monitoring circuitry. The notification event may then be sent to the processing circuitry using the monitoring circuitry. The technique may further involve updating, using the processing circuitry, the memory map based on the notification event.

This disclosure relates to techniques for updating a memory map maintained by processing circuitry that is coupled to programmable logic circuitry. One of the techniques may involve detecting reconfiguration of a device component formed on a portion of the programmable logic circuitry using monitoring circuitry. The technique may further include generating a notification event based on the reconfiguration of the device component using the monitoring circuitry. The notification event may then be sent to the processing circuitry using the monitoring circuitry. The technique may further involve updating, using the processing circuitry, the memory map based on the notification event.