In a stacked integrated circuit device, there are two components, one in a first of the die and another in a second of the die. Each of the components is provided with two output connections, one leading above and one leading below the die, and two input connections, one leading above and one leading below the die, either of the two die. As a result of the redundancy, both die may be used in either position in the stacked structure. If either of the die is used as the top die, it sends data on its second output path and receives data on its second input path. On the other hand, when one of the die is used as the bottom die, it sends data on its first output path and receives data on its first input path. In this way, the same design may be used for the connections between each of the die.

In different example embodiments, a system-on-chip is provided. The system-on-chip can have a control circuit with a plurality of control circuit areas, wherein the control circuit is configured to control a device, a security circuit which has a separately secured key memory and a hardware accelerator for cryptographic operations, wherein the security circuit is configured to electively enable either a read-only access or a read and write access to at least one of the control circuit areas, wherein the security circuit is furthermore configured to provide a communication path by means of the key memory and the hardware accelerator for the secured communication with a diagnostic system disposed outside the security circuit, to make the selection between the read access and the read and write access to the at least one selected area of the control circuit depending on a certificate supplied to the security circuit and authenticated by means of information stored in the key memory, and to execute the read access or the read and write access.

In different example embodiments, a system-on-chip is provided. The system-on-chip can have a control circuit with a plurality of control circuit areas, wherein the control circuit is configured to control a device, a security circuit which has a separately secured key memory and a hardware accelerator for cryptographic operations, wherein the security circuit is configured to electively enable either a read-only access or a read and write access to at least one of the control circuit areas, wherein the security circuit is furthermore configured to provide a communication path by means of the key memory and the hardware accelerator for the secured communication with a diagnostic system disposed outside the security circuit, to make the selection between the read access and the read and write access to the at least one selected area of the control circuit depending on a certificate supplied to the security circuit and authenticated by means of information stored in the key memory, and to execute the read access or the read and write access.

In general, a device comprising a processor and a memory may be configured to perform various aspects of the techniques described in this disclosure. The processor may conduct, based on configuration parameters, each of a plurality of simulation iterations within the test environment to collect a corresponding plurality of simulation datasets representative of operating states of the network device. The processor may perform a regression analysis with respect to each of the plurality of configuration parameters and each of the plurality of simulation datasets to generate a light weight model representative of the network device that predicts an operating state of the network device. The processor may output the light weight model for use in a computing resource restricted network device to enable prediction of the operating state of the computing resource restricted network device when configured with the configuration parameters. The memory may store the light weight model.

In general, a device comprising a processor and a memory may be configured to perform various aspects of the techniques described in this disclosure. The processor may conduct, based on configuration parameters, each of a plurality of simulation iterations within the test environment to collect a corresponding plurality of simulation datasets representative of operating states of the network device. The processor may perform a regression analysis with respect to each of the plurality of configuration parameters and each of the plurality of simulation datasets to generate a light weight model representative of the network device that predicts an operating state of the network device. The processor may output the light weight model for use in a computing resource restricted network device to enable prediction of the operating state of the computing resource restricted network device when configured with the configuration parameters. The memory may store the light weight model.

In an embodiment, an electronic circuit includes: a plurality of signal channels; a signal collection circuit configured to determine an action of the electronic circuit based on channel signals from the plurality of signal channels; and a first signal management circuit coupled between the plurality of signal channels and the signal collection circuit, the first signal management circuit including: a set of internal registers, a set of user registers, and a decoder configured to program the set of internal registers based on a content of the set of user registers, where the first signal management circuit is configured to receive the channel signals via the plurality of signal channels, generate first aggregated signals based on the received channel signals and a content of the set of internal registers, and transmitting the first aggregated signals to the signal collection circuit.

In an embodiment, an electronic circuit includes: a plurality of signal channels; a signal collection circuit configured to determine an action of the electronic circuit based on channel signals from the plurality of signal channels; and a first signal management circuit coupled between the plurality of signal channels and the signal collection circuit, the first signal management circuit including: a set of internal registers, a set of user registers, and a decoder configured to program the set of internal registers based on a content of the set of user registers, where the first signal management circuit is configured to receive the channel signals via the plurality of signal channels, generate first aggregated signals based on the received channel signals and a content of the set of internal registers, and transmitting the first aggregated signals to the signal collection circuit.

An integrated circuit chip includes a plurality of function blocks; a mode controller configured to convert an input signal, received from an external device through an input/output pin, into an input pattern and test mode setting data which include a plurality of bits, and to output the test mode setting data and a mode switching enable signal when a secure pattern generated therein is the same as the input pattern; and a mode setting module configured to control the plurality of function blocks to operate in a test mode according to the mode setting data, in response to the test mode switching enable signal.

An integrated circuit chip includes a plurality of function blocks; a mode controller configured to convert an input signal, received from an external device through an input/output pin, into an input pattern and test mode setting data which include a plurality of bits, and to output the test mode setting data and a mode switching enable signal when a secure pattern generated therein is the same as the input pattern; and a mode setting module configured to control the plurality of function blocks to operate in a test mode according to the mode setting data, in response to the test mode switching enable signal.

In various examples, permanent faults in hardware component(s) and/or connections to the hardware component(s) of a computing platform may be predicted before they occur using in-system testing. As a result of this prediction, one or more remedial actions may be determined to enhance the safety of the computing platform (e.g., an autonomous vehicle). A degradation rate of a performance characteristic associated with the hardware component may be determined, detected, and/or computed by monitoring values of performance characteristics over time using fault testing.