A processor includes an execution pipeline that includes a plurality of execution stages, execution pipeline control logic, and a debug system. The execution pipeline control logic is configured to control flow of an instruction through the execution stages. The debug system includes a debug pipeline and debug pipeline control logic. The debug pipeline includes a plurality of debug stages. Each debug pipeline stage corresponds to an execution pipeline stage, and the total number of debug stages corresponds to the total number of execution stages. The debug pipeline control logic is coupled to the execution pipeline control logic. The debug pipeline control logic is configured to control flow through the debug stages of debug information associated with the instruction, and to advance the debug information into a next of the debug stages in correspondence with the execution pipeline control logic advancing the instruction into a corresponding stage of the execution pipeline.

A processor includes an execution pipeline that includes a plurality of execution stages, execution pipeline control logic, and a debug system. The execution pipeline control logic is configured to control flow of an instruction through the execution stages. The debug system includes a debug pipeline and debug pipeline control logic. The debug pipeline includes a plurality of debug stages. Each debug pipeline stage corresponds to an execution pipeline stage, and the total number of debug stages corresponds to the total number of execution stages. The debug pipeline control logic is coupled to the execution pipeline control logic. The debug pipeline control logic is configured to control flow through the debug stages of debug information associated with the instruction, and to advance the debug information into a next of the debug stages in correspondence with the execution pipeline control logic advancing the instruction into a corresponding stage of the execution pipeline.

A test device and a method are provided in the invention. The test device includes a first connection interface, a storage device, a processor and a second connection interface. The first connection interface is coupled to a device under test (DUT) and obtains power information from the DUT according to a first instruction. The storage device stores the power information. The processor is coupled to the first connection interface and storage device, when the first connection interface is coupled to the DUT, sends the first instruction to the first connection interface, receives the power information from the first connection interface, and stores the power information in the storage device. The second connection interface is coupled to an external controlling system, sends the power information to the external controlling system and receives a test instruction from the external controlling system to test the DUT.

A system, apparatus, and method for testing blocks of a system on a chip (SOC) are described herein. An SOC, in accordance with various embodiments, may include a serial communication interface configured to multiplex, serialize, and/or parallelize signals streams from selected blocks of the SOC to an off-chip test unit through an off-chip serial communication interface. Other embodiments may be described and claimed.

An evaluation board and a method for evaluating Phase Locked Loop (PLL) timing devices. The evaluation board includes an input and output circuit disposed on a circuit board along with control logic, and a plurality of PLL-timed physical devices that are identical to the physical devices used in the customer's communication system. A first connector receptacle and a second connector receptacle are coupled to the control logic and to one or more of the PLL-timed physical devices, and are configured to receive a PLL card including a PLL timing device. A third connector receptacle is coupled in series between the first connector receptacle and the second connector receptacle and is configured to receive a backplane emulator card having electrical characteristics emulating a backplane of the customer's communication system.

A method for analyzing noise spectrum of an electronic device includes storing a waveform data including a plurality of data points, the waveform data is obtained by measuring a target signal from the electronic device, removing data points corresponding to a background noise fluctuation based on a smooth curve of the waveform data, data points considered candidates for peaks are extracted from the waveform data, classifying the extracted data points based on a distance between adjacent data points in order to discriminate a cluster of distant data points from data points closely positioned to dominant peaks, determining the dominant peaks based on the cluster of distant data points such that the data points closely positioned to the dominant peaks are ignored, each dominant peak corresponds to the characteristic of the electronic device, and outputting the dominant peaks as an analysis result for the electronic device.

Examples for servicing a computing device by a servicing agent are described. In an example, the servicing agent receives a first set of information which includes device information corresponding to the computing device. Further, the servicing agent receives a second set of information during a second session, wherein the second set of information is received through a user input and is indicative of a state of the computing device. The servicing agent further processes the first set of information and the second set of information to determine a diagnostic test. The servicing agent causes to execute the diagnostic test on the computing device.

Manufacturers perform tests on chips before the chips are shipped to customers. However, defects can occur on a chip after the manufacturer testing and when the chips are used in a system or device. The defects can occur due to aging or the environment in which the chip is employed and can be critical; especially when the chips are used in systems such as autonomous vehicles. To verify the structural integrity of the IC during the lifetime of the product, an in-system test (IST) is disclosed. The IST enables self-testing mechanisms for an IC in working systems. The IST mechanisms provide structural testing of the ICs when in a functional system and at a manufacturer's level of testing. Unlike ATE tests that are running on a separate environment, the IST provides the ability to go from a functional world view to a test mode.

Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.

Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.