A system and method for generating a netlist of a memory device includes receiving a logical netlist file including memory instances and placement information for the memory device. Each memory instance includes leaf cells. Further, a location of a first leaf cell and a location of a second leaf cell of the leaf cells of a first memory instance is determined based on the placement information. A first net segment between the first leaf cell and the second leaf cell is generated based on the location and parasitic elements of the first leaf cell and the location and parasitic elements of the second leaf cell. A parasitic netlist is generated based on the first net segment and the parasitic elements of the first leaf cell and parasitic elements of the second leaf cell.

A system and method for generating a netlist of a memory device includes receiving a logical netlist file including memory instances and placement information for the memory device. Each memory instance includes leaf cells. Further, a location of a first leaf cell and a location of a second leaf cell of the leaf cells of a first memory instance is determined based on the placement information. A first net segment between the first leaf cell and the second leaf cell is generated based on the location and parasitic elements of the first leaf cell and the location and parasitic elements of the second leaf cell. A parasitic netlist is generated based on the first net segment and the parasitic elements of the first leaf cell and parasitic elements of the second leaf cell.

Systems and techniques that facilitate partitioned template matching and/or symbolic peephole optimization are provided. In various embodiments, a system can comprise a template component, which can perform template matching on a Clifford circuit associated with a set of qubits. In various aspects, the system can comprise a partition component, which can partition, prior to the template matching, the Clifford circuit into a computation stage, a Pauli stage, and a SWAP stage. In various instances, the template matching can be performed on the computation stage. In various embodiments, the system can comprise a symbolic component, which can select a subset of qubits from the set of qubits, rewrite at least one entangling gate in the computation stage such that a target of the at least one entangling gate is in the subset of qubits, and replace the at least one rewired entangling gate with a symbolic Pauli gate. In various cases, the symbolic Pauli gate can be a Pauli gate that is controlled by a symbolic variable. In various aspects, the system can comprise a peephole component, which can perform peephole optimization on the subset of qubits with the symbolic Pauli gate by implementing a dynamic programming algorithm.

A system and method for characterizing a memory instance. Characterizing a memory instance includes obtaining a memory instance comprising a plurality of leaf cells. Each of the plurality of leaf cells comprises components. First channel connected components from the components within each of the plurality of leaf cells are determined, and a first super leaf cell is generated by combining a first two or more leaf cells of the plurality of leaf cells based on the first channel connected components. Further, an updated memory instance is generated based on the first super leaf cell, and a timing model is determined for the updated memory instance.

A defect map may be created by merging defects at locations on multiple dies that include copies of an integrated circuit (IC). Layout shapes or nets may be determined that overlap with the defects in the defect map. Next, connectivity between the layout shapes or nets may be determined. The defects may then be grouped into defect groups based on the connectivity between the layout shapes or nets, where each defect group comprises defects that overlap with layout shapes or nets that are electrically connected to each other.

A defect map may be created by merging defects at locations on multiple dies that include copies of an integrated circuit (IC). Layout shapes or nets may be determined that overlap with the defects in the defect map. Next, connectivity between the layout shapes or nets may be determined. The defects may then be grouped into defect groups based on the connectivity between the layout shapes or nets, where each defect group comprises defects that overlap with layout shapes or nets that are electrically connected to each other.

Examples provide a method of virtualizing a hardware accelerator in a virtualized computing system. The virtualized computing system includes a hypervisor supporting execution of a plurality of virtual machines (VMs). The method includes: receiving a plurality of sub-programs at a compiler in the hypervisor from a plurality of compilers in the respective plurality of VMs, each of the sub-programs including a hardware-description language (HDL) description; combining, at the compiler in the hypervisor, the plurality of sub-programs into a monolithic program; generating, by the compiler in the hypervisor, a circuit implementation for the monolithic program, the circuit implementation including a plurality of sub-circuits for the respective plurality of sub-programs; and loading, by the compiler in the hypervisor, the circuit implementation to a programmable device of the hardware accelerator.

An automated system and method of determining power sequencing risks (e.g. power-up, power-down time sequences) for complex computer circuits with multiple independent power supplies. The system operates by logical consideration of the topological arrangement of MOSFETs and other devices in standard netlists. The system inspects the various devices and automatically traces DC circuit paths to DC power rails. The system then evaluates, as a type of logical existence proof, and on a per MOSFET device level, if due to assignment to different DC power levels, various factors, such as forward-biased diodes, floating MOSFET gate, and other risk factors could ever occur. The system generates comprehensive records of such risks and can output an overall analysis of a circuit reporting on both problematic power sequences, as well as circuit design factors that may be sub-optimal from a power sequence perspective.

An automated system and method of determining power sequencing risks (e.g. power-up, power-down time sequences) for complex computer circuits with multiple independent power supplies. The system operates by logical consideration of the topological arrangement of MOSFETs and other devices in standard netlists. The system inspects the various devices and automatically traces DC circuit paths to DC power rails. The system then evaluates, as a type of logical existence proof, and on a per MOSFET device level, if due to assignment to different DC power levels, various factors, such as forward-biased diodes, floating MOSFET gate, and other risk factors could ever occur. The system generates comprehensive records of such risks and can output an overall analysis of a circuit reporting on both problematic power sequences, as well as circuit design factors that may be sub-optimal from a power sequence perspective.

A method comprising categorizing nodes of a fabricated circuit as being priority nodes and nodes as being inferior nodes; evaluating a first priority node by automatically designating for verification the first priority node, and ascertaining whether a measured signal from the first priority node meets a pass-fail criterion for the first priority node; evaluating, when the measured signal from the first priority node meets the pass-fail criterion, a second priority node by automatically designating for verification the second priority node, and ascertaining whether a measured signal from the second priority node meets a pass-fail criterion for the second priority node; and evaluating, when the measured signal from the first priority node does not meet the pass-fail criterion, a first inferior node, by automatically designating for verification the first inferior node, and ascertaining whether a measured signal from the first inferior node meets a pass-fail criterion for the first inferior node.