A method and system for migrating an existing ASIC design from one semiconductor fabrication process to another are disclosed herein. In some embodiments, a method for migrating the existing ASIC design comprises parsing the gate-level netlist one row at a time into one or more standard cells forming the ASIC design, forming a plurality of mapping tables having mapping rules for mapping the parsed one or more standard cells into equivalent target standard cells implemented in the second semiconductor fabrication process, mapping the parsed one or more standard cells into the equivalent target standard cells using the plurality of mapping tables, and generating a target gate-level netlist describing the ASIC design in terms of the equivalent target standard cells.

An integrated circuit (IC) test engine extracts an input to output propagation delay for each cell instance of each of a plurality of cell types in an IC design from an SDF file for the IC design. The IC test engine extracts a node slack of each cell instance of each of the plurality of cell types of the IC design from a node slack report. The IC test engine also generates cell-aware test patterns for each cell instance of each cell type in the IC design to test a fabricated IC chip that is based on the IC design for defects corresponding to a subset of a plurality of candidate defects characterized in the plurality of fault rules files. Each cell-aware test pattern is configured to sensitize and propagate a transition along the longest possible path to test small delay defects in cell instances of the fabricated IC chip.

An integrated circuit (IC) test engine extracts an input to output propagation delay for each cell instance of each of a plurality of cell types in an IC design from an SDF file for the IC design. The IC test engine extracts a node slack of each cell instance of each of the plurality of cell types of the IC design from a node slack report. The IC test engine also generates cell-aware test patterns for each cell instance of each cell type in the IC design to test a fabricated IC chip that is based on the IC design for defects corresponding to a subset of a plurality of candidate defects characterized in the plurality of fault rules files. Each cell-aware test pattern is configured to sensitize and propagate a transition along the longest possible path to test small delay defects in cell instances of the fabricated IC chip.

A system receives a logic design of a circuit of an integrated circuit and apply a reduced synthesis process to the logical design of the integrated circuit. The reduced synthesis process is less computation intensive compared to the optimized digital implementation synthesis process and generates a netlist having suboptimal delay. The system provides the generated netlist as input to a timing analysis that alters the standard delay computation (through scaling and other means) to predict the timing of a fully optimized netlist. The reduced synthesis process has faster execution time compared to the optimized digital implementation synthesis process but results in comparable performance, power and area that is within a threshold of the results generated using optimized digital implementation synthesis process.

A system receives a logic design of a circuit of an integrated circuit and apply a reduced synthesis process to the logical design of the integrated circuit. The reduced synthesis process is less computation intensive compared to the optimized digital implementation synthesis process and generates a netlist having suboptimal delay. The system provides the generated netlist as input to a timing analysis that alters the standard delay computation (through scaling and other means) to predict the timing of a fully optimized netlist. The reduced synthesis process has faster execution time compared to the optimized digital implementation synthesis process but results in comparable performance, power and area that is within a threshold of the results generated using optimized digital implementation synthesis process.

Provided are a method and a device for electrical DRC of an integrated circuit. The method includes: acquiring a parasitic parameter netlist of the integrated circuit; receiving a circuit simulation result of the integrated circuit and electrical DRC rules; and performing electrical DRC on the integrated circuit based on the parasitic parameter netlist, the circuit simulation result and the electrical DRC rules.

Provided are a method and a device for electrical DRC of an integrated circuit. The method includes: acquiring a parasitic parameter netlist of the integrated circuit; receiving a circuit simulation result of the integrated circuit and electrical DRC rules; and performing electrical DRC on the integrated circuit based on the parasitic parameter netlist, the circuit simulation result and the electrical DRC rules.

Hardware description language (HDL) code for an integrated circuit (IC) design may be parsed to obtain an IC design parse tree. A transformation pattern may include a first pattern and a second pattern. The transformation pattern may be parsed to obtain a transformation pattern parse tree. The IC design parse tree and the transformation pattern parse tree may be used to identify a portion of the HDL code that matches the first pattern. The identified portion of the HDL code may be transformed based on the second pattern to obtain a transformed portion of the HDL code. The portion of the HDL code may be replaced by the transformed portion of the HDL code.

Hardware description language (HDL) code for an integrated circuit (IC) design may be parsed to obtain an IC design parse tree. A transformation pattern may include a first pattern and a second pattern. The transformation pattern may be parsed to obtain a transformation pattern parse tree. The IC design parse tree and the transformation pattern parse tree may be used to identify a portion of the HDL code that matches the first pattern. The identified portion of the HDL code may be transformed based on the second pattern to obtain a transformed portion of the HDL code. The portion of the HDL code may be replaced by the transformed portion of the HDL code.

A method comprises creating an electronic module design having a plurality of electronic components and defining a model of functional behavior of a subset of the plurality of electronic components, the subset of the plurality of electronic components excluding a first electronic component. Functional behavior of the first electronic component is defined in a user-defined functional design intent file based on a first template, and a power behavior of the first electronic component is defined in a user-defined power design intent file based on a second template. A simulation file is generated based on the model of functional behavior and based on the functional behavior and the power behavior of the first electronic component. The simulation file is run to simulate operation of the electronic module design. A performance status is determined of the electronic module design in response to running the simulation file.