A register-transfer level signal mapping construction method and device, wherein the register-transfer level signal mapping construction method comprises: acquiring register-transfer level codes and netlist level codes corresponding to the register-transfer level codes; constructing a circuit according to the register-transfer level codes and the netlist level codes; separating the circuit into a plurality of modules according to syntax of the circuit in a hardware description language; determining a correspondence relationship between the plurality of modules with logic verification methods; acquiring register-transfer level signals of a mapping relationship to be established; and determining netlist level signals corresponding to the register-transfer level codes according to the correspondence relationship between the plurality of modules. A mapping relationship between signals in the register-transfer level signals and signals in the netlist level codes is directly established, which can be implemented easily and done at low cost, and modification of the chip after logic synthesis is convenient.

A register-transfer level signal mapping construction method and device, wherein the register-transfer level signal mapping construction method comprises: acquiring register-transfer level codes and netlist level codes corresponding to the register-transfer level codes; constructing a circuit according to the register-transfer level codes and the netlist level codes; separating the circuit into a plurality of modules according to syntax of the circuit in a hardware description language; determining a correspondence relationship between the plurality of modules with logic verification methods; acquiring register-transfer level signals of a mapping relationship to be established; and determining netlist level signals corresponding to the register-transfer level codes according to the correspondence relationship between the plurality of modules. A mapping relationship between signals in the register-transfer level signals and signals in the netlist level codes is directly established, which can be implemented easily and done at low cost, and modification of the chip after logic synthesis is convenient.

A Register Transfer Level (RTL) representation is recovered from a netlist representing an integrated circuit (IC). The netlist is converted to a graph comprising nodes belonging to a set of node types and edges connecting the nodes. The set of node types includes an instance node type representing an electronic component and a wire node type representing signal transfer between components. The graph is converted to a standardized graph by replacing subgraphs of the graph with standardized subgraphs. An RTL representation of the standardized graph is generated by operations including building signal declarations in a hardware description language (HDL) from the wire nodes of the standardized graph and building signal assignments in the HDL from instance nodes of the standardized graph.

A Register Transfer Level (RTL) representation is recovered from a netlist representing an integrated circuit (IC). The netlist is converted to a graph comprising nodes belonging to a set of node types and edges connecting the nodes. The set of node types includes an instance node type representing an electronic component and a wire node type representing signal transfer between components. The graph is converted to a standardized graph by replacing subgraphs of the graph with standardized subgraphs. An RTL representation of the standardized graph is generated by operations including building signal declarations in a hardware description language (HDL) from the wire nodes of the standardized graph and building signal assignments in the HDL from instance nodes of the standardized graph.

The present disclosure provides methods and devices for simulating a design, wherein the design comprises a main class with parameters and a plurality of instances of the main class, wherein the plurality of instances comprise a first instance and a second instance. The method includes: determining, by analyzing the design, a plurality of secondary classes associated with instantiating the main class, wherein the plurality of secondary classes are used as the parameters of the main class and comprise a first secondary class corresponding to the first instance and a second secondary class corresponding to the second instance; translating the design to generate a first temporary code associated with the plurality of instances; generating, based on the first temporary code, a plurality of instance machine codes corresponding to the plurality of instances; and simulating the design based on the plurality of instance machine codes.

The present disclosure provides methods and devices for simulating a design, wherein the design comprises a main class with parameters and a plurality of instances of the main class, wherein the plurality of instances comprise a first instance and a second instance. The method includes: determining, by analyzing the design, a plurality of secondary classes associated with instantiating the main class, wherein the plurality of secondary classes are used as the parameters of the main class and comprise a first secondary class corresponding to the first instance and a second secondary class corresponding to the second instance; translating the design to generate a first temporary code associated with the plurality of instances; generating, based on the first temporary code, a plurality of instance machine codes corresponding to the plurality of instances; and simulating the design based on the plurality of instance machine codes.

Disclosed are a system and a method for optimizing integrated circuit layout based on neural network. The system according to an exemplary embodiment of the present disclosure includes: a placement information generation unit generating placement information indicating placement positions of circuit blocks; a placement information filtering unit predicting a minimum substrate area required for placing the circuit blocks according to the generated placement information and when a predicted minimum substrate area does not correspond to a predetermined reference area range, discarding the generated placement information and requesting the placement information generation unit to generate subsequent placement information; and an EDA tool control unit providing the generated placement information to the EDA tool when the predicted minimum substrate area corresponds to the reference area range, and controlling the EDA tool to measure consumption power, performance, and an area of the target integrated circuit based on the generated placement position information.

Disclosed are a system and a method for optimizing integrated circuit layout based on neural network. The system according to an exemplary embodiment of the present disclosure includes: a placement information generation unit generating placement information indicating placement positions of circuit blocks; a placement information filtering unit predicting a minimum substrate area required for placing the circuit blocks according to the generated placement information and when a predicted minimum substrate area does not correspond to a predetermined reference area range, discarding the generated placement information and requesting the placement information generation unit to generate subsequent placement information; and an EDA tool control unit providing the generated placement information to the EDA tool when the predicted minimum substrate area corresponds to the reference area range, and controlling the EDA tool to measure consumption power, performance, and an area of the target integrated circuit based on the generated placement position information.

The present disclosure provides a method and an apparatus for testing a semiconductor device. The method includes providing an active area in an integrated circuit design layout; grouping the active area into a first region and a second region; calculating a first self-heating temperature of the first region of the active area; calculating a second self-heating temperature of the second region of the active area; and determining an Electromigration (EM) evaluation based on the first self-heating temperature and the second self-heating temperature.

The present disclosure provides a method and an apparatus for testing a semiconductor device. The method includes providing an active area in an integrated circuit design layout; grouping the active area into a first region and a second region; calculating a first self-heating temperature of the first region of the active area; calculating a second self-heating temperature of the second region of the active area; and determining an Electromigration (EM) evaluation based on the first self-heating temperature and the second self-heating temperature.