An integrated circuit design method includes receiving an integrated circuit design, and determining a floor plan for the integrated circuit design. The floor plan includes an arrangement of a plurality of functional cells and a plurality of tap cells. Potential latchup locations in the floor plan are determined, and the arrangement of at least one of the functional cells or the tap cells is modified based on the determined potential latchup locations.

A method in certain embodiments includes using a computer system that includes an EDA tool to generate a layout of an IC device; searching, using a statistical method such as Bayesian optimization process, for one or more input variable parameters, such as the dimensions of the IC device and the dimensions of the voltage areas in the IC device, that results in an optimal characteristic, such as power, performance or area (PPA) of the IC device, subject to a limiting condition, such as one determined using a cost function. A computer system including one or more EDAs configured to perform the method is also disclosed.

A method in certain embodiments includes using a computer system that includes an EDA tool to generate a layout of an IC device; searching, using a statistical method such as Bayesian optimization process, for one or more input variable parameters, such as the dimensions of the IC device and the dimensions of the voltage areas in the IC device, that results in an optimal characteristic, such as power, performance or area (PPA) of the IC device, subject to a limiting condition, such as one determined using a cost function. A computer system including one or more EDAs configured to perform the method is also disclosed.

A method of designing a layout of a semiconductor integrated circuit, including receiving input data defining the semiconductor integrated circuit; determining a first layout of the semiconductor integrated circuit by performing a placement and routing (P&R) procedure based on the input data, wherein the first layout includes a plurality of blocks, a plurality of standard cells, a plurality of power wirings, a plurality of ground wirings, a plurality of clock wirings, and a plurality of signal wirings; selecting a target region of the first layout, wherein the target region is capable of accommodating at least one additional power wiring and at least one additional ground wiring; and determining a second layout of the semiconductor integrated circuit by modifying the first layout to include the at least one additional power wiring and the at least one additional ground wiring in the target region.

A method of designing a layout of a semiconductor integrated circuit, including receiving input data defining the semiconductor integrated circuit; determining a first layout of the semiconductor integrated circuit by performing a placement and routing (P&R) procedure based on the input data, wherein the first layout includes a plurality of blocks, a plurality of standard cells, a plurality of power wirings, a plurality of ground wirings, a plurality of clock wirings, and a plurality of signal wirings; selecting a target region of the first layout, wherein the target region is capable of accommodating at least one additional power wiring and at least one additional ground wiring; and determining a second layout of the semiconductor integrated circuit by modifying the first layout to include the at least one additional power wiring and the at least one additional ground wiring in the target region.

Described are technologies of all-digital camouflage circuits. The camouflage circuit can include a first chain of inverters, synthesized with a first standard cell with a first transistor threshold, and a second chain of inverters, synthesized with a second standard cell with a second transistor threshold that is different than the first transistor threshold. A first flip-flop receives a first output of the first chain as a data input and a second output of the second chain as a clock input. A second flip-flop receives the second output as a data input and the first output of the first chain as a clock input. Given the different transistor thresholds, one flip-flop always outputs an active signal that corresponds to an input signal applied to the first chain and the second chain. The other flip-flop always output a constant signal, such an always low signal.

Described are technologies of all-digital camouflage circuits. The camouflage circuit can include a first chain of inverters, synthesized with a first standard cell with a first transistor threshold, and a second chain of inverters, synthesized with a second standard cell with a second transistor threshold that is different than the first transistor threshold. A first flip-flop receives a first output of the first chain as a data input and a second output of the second chain as a clock input. A second flip-flop receives the second output as a data input and the first output of the first chain as a clock input. Given the different transistor thresholds, one flip-flop always outputs an active signal that corresponds to an input signal applied to the first chain and the second chain. The other flip-flop always output a constant signal, such an always low signal.

This application discloses a fault tolerant computation method and device for a quantum Clifford circuit with reduced resource requirement. The method includes decomposing a quantum Clifford circuit into s logic Clifford circuits and preparing auxiliary quantum states corresponding to the s logic Clifford circuits. For each logic Clifford circuit, the method further includes teleporting an input quantum state corresponding to the logic Clifford circuit to an auxiliary qubit, processing a quantum state obtained after the teleportation by the logic Clifford circuit to obtain a corresponding output quantum state; measuring a corresponding error symptom based on the input quantum state and the auxiliary quantum state; and performing error correction on the output quantum state according to the error symptom to obtain an error-corrected output quantum state.

Methods for converting an n-bit number into an m-bit number for situations where n>m and also for situations where n<m, where n and m are integers. The methods use truncation or bit replication followed by the calculation of an adjustment value which is applied to the replicated number.

Methods for converting an n-bit number into an m-bit number for situations where n>m and also for situations where n<m, where n and m are integers. The methods use truncation or bit replication followed by the calculation of an adjustment value which is applied to the replicated number.