Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Systems and methods are disclosed for generation and testing of integrated circuit designs with point-to-point connections between modules. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. For example, type parameterization may be used to generate point-to-point connections in a flexible manner. For example, a point-to-point connection between the source module and the sink module that includes one or more named wires specified by bundle type may be automatically generated based on using the bundle type as a type parameterization input. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

A method, a computer system, and a computer program product for scan chain wirelength optimization is provided. Embodiments of the present invention may include obtaining root nodes details from the root nodes. Embodiments of the present invention may include optimizing a connectivity of the root nodes. Embodiments of the present invention may include identifying a best start node and a best end node for each of the root nodes. Embodiments of the present invention may include optimizing child nodes in each of the root nodes. Embodiments of the present invention may include determining that a wirelength of a full tour is shorter or longer than a nearest neighbor. Embodiments of the present invention may include applying or skipping a solution.

A method, a computer system, and a computer program product for scan chain wirelength optimization is provided. Embodiments of the present invention may include obtaining root nodes details from the root nodes. Embodiments of the present invention may include optimizing a connectivity of the root nodes. Embodiments of the present invention may include identifying a best start node and a best end node for each of the root nodes. Embodiments of the present invention may include optimizing child nodes in each of the root nodes. Embodiments of the present invention may include determining that a wirelength of a full tour is shorter or longer than a nearest neighbor. Embodiments of the present invention may include applying or skipping a solution.

A method for automatically verifying validity of application of a refinement rule includes calculating a set of values that characterize a hierarchy of elements of the emulation. A currently calculated value for a first element at a first level of the hierarchy is compared with a previously calculated value that characterized the first element at a previous time. If the currently calculated value is the same as the previously calculated value, application of the refinement rule is determined to be valid for unnamed entities of the first element. If the currently calculated value is different from the previously calculated value, each currently calculated value that characterizes a lower level element at a lower level of the hierarchy is compared with a corresponding previously calculated value to identify a change and it is determined whether the change invalidates application of the refinement rule to an unnamed entity of the emulation.

Approaches for simulating a circuit include receiving simulation input data from a testbench executing on a computer system by a simulator interface executing on the computer system. The simulator interface receives simulation output data the according to a hardware bus protocol specified by a simulated circuit for communication and simulates handshaking with the simulated circuit according to the hardware bus protocol in response to receiving the simulation input data and simulation output data. The simulator interface provides the simulation input data to the simulated circuit by according to the hardware bus protocol and provides the simulation output data to the testbench.

Approaches for simulating a circuit include receiving simulation input data from a testbench executing on a computer system by a simulator interface executing on the computer system. The simulator interface receives simulation output data the according to a hardware bus protocol specified by a simulated circuit for communication and simulates handshaking with the simulated circuit according to the hardware bus protocol in response to receiving the simulation input data and simulation output data. The simulator interface provides the simulation input data to the simulated circuit by according to the hardware bus protocol and provides the simulation output data to the testbench.

A circuit information generating apparatus includes a switching section that switches wiring between a base module and an extension module, an address acquisition section acquiring identification information of the extension module, a wiring information acquisition section, a firmware acquisition section acquiring firmware that operates the extension module, a wiring information rewriting section identifying circuit configuration information of each extension module based on the identification information, and rewrites a part of the wiring information based on the circuit configuration information, a circuit information generating section generating circuit information based on the circuit configuration information of the extension module and the rewritten wiring information, and a firmware generating section rewrites definition information of the wiring included in the firmware, based on the rewritten wiring information, and generates information indicating a circuit configuration of an electronic circuit configured using the extension module connected with the base module and serving a specific function.