A method for the development of a compilation process for a quantum circuit on a quantum processor, includes an implementation step of the compilation method including an iteration loop successively including: a step of simulation of a given implementation of the logical qubits on the physical qubits of the quantum processor; a step of detecting, in the quantum circuit, ineffective quantum gate(s); a step of estimating the number of quantum swap gates to be inserted into the quantum circuit so that all of the quantum gates of the quantum circuit are effective; and a retroaction step, by way of a simulated annealing, involving a new step of simulation, until attaining, whereupon all the quantum gates are effective: either a minimum threshold of the number of estimated quantum value swap gates between two physical qubits, or a maximum threshold of iterations in the loop.

A method for the development of a compilation process for a quantum circuit on a quantum processor, includes an implementation step of the compilation method including an iteration loop successively including: a step of simulation of a given implementation of the logical qubits on the physical qubits of the quantum processor; a step of detecting, in the quantum circuit, ineffective quantum gate(s); a step of estimating the number of quantum swap gates to be inserted into the quantum circuit so that all of the quantum gates of the quantum circuit are effective; and a retroaction step, by way of a simulated annealing, involving a new step of simulation, until attaining, whereupon all the quantum gates are effective: either a minimum threshold of the number of estimated quantum value swap gates between two physical qubits, or a maximum threshold of iterations in the loop.

A system and method for designing an electrical component comprises a model extraction engine configured to generate a model based on a set of parameters, a simulator configured to simulate the generated model and measure performance, a rule-set usable to determine changes to the set of parameters, and an inference engine configured to change salience values of expert rules included in the rule set. The salience value determines when and if an expert rule is used to change the set of parameters. One or more microprocessors are configured to determine design characteristics of the electrical component by iteratively performing, until measured performance is within tolerance, the steps of generating a model based on an updated version of the set of parameters, simulating the generated model, measuring performance of the generated model, and updating the set of parameters using the rule-set if the measured performance is not within the predefined tolerance.

The present invention provides a graphical view of this connected network that allows the user to navigate throughout a network. The graph view consists of a series of nodes that correspond to a set of test, testbench, design or coverage items in the simulation. Various nodes in the network are colored or shaped differently to represent either test, class, stimulus, testbench, design or coverage points. The graph may be drawn so that all items that occur at the same time are lined up in the same horizontal or vertical region, to give the user an intuitive view of time going left to right or top to bottom.

A method includes assigning a default voltage value to a net in an integrated circuit (IC) schematic, generating a simulation voltage value of the net by performing a circuit simulation on the net using the assigned default voltage value, and modifying the IC schematic to include a voltage value associated with the net. The voltage value associated with the net and included in the modified IC schematic is based on a comparison between the assigned default voltage value and the simulation voltage value of the net.

A method includes assigning a default voltage value to a net in an integrated circuit (IC) schematic, generating a simulation voltage value of the net by performing a circuit simulation on the net using the assigned default voltage value, and modifying the IC schematic to include a voltage value associated with the net. The voltage value associated with the net and included in the modified IC schematic is based on a comparison between the assigned default voltage value and the simulation voltage value of the net.

The present disclosure provides a method for adjusting implant parameter conditions in semiconductor processing by wafer and by wafer zone using in-line measurements from previous operations and a feed-forward computer model. The feed-forward model is based on a sensitivity map of in-line measured data and its effect of electrical performance. Feed-forward computer models that adjust implant parameters by wafer and by zone improve both wafer-to-wafer and within wafer electrical uniformity in semiconductor devices.

The present disclosure provides a method for adjusting implant parameter conditions in semiconductor processing by wafer and by wafer zone using in-line measurements from previous operations and a feed-forward computer model. The feed-forward model is based on a sensitivity map of in-line measured data and its effect of electrical performance. Feed-forward computer models that adjust implant parameters by wafer and by zone improve both wafer-to-wafer and within wafer electrical uniformity in semiconductor devices.

A method is disclosed for designing an analog computer that implements a trained recurrent neural network. A computer simulates a wave-based physical system including a wave propagation domain, a boundary layer that approximates a boundary condition, a source of waves, probes for measuring properties of propagated waves, a material within a central region of the wave propagation domain. The simulation also includes a discretized numerical model of a differential equation describing dynamics of wave propagation in the physical system. The simulation is trained with sequential training data by inputing samples of the training data at the source in batches, computing for each batch measured properties of propagated waves at the probes, evaluating for each batch a loss function between the measured properties of propagated waves at the probes and correct classification, and minimizing the loss function with respect to physical characteristics of the material within a central region of the simulation domain using gradient-based optimization.

A method for selecting components in a radiation tolerant electronic system, comprising, determining ionizing radiation responses of COTS devices under various radiation conditions, selecting a subset of the COTS devices whose radiation responses satisfy threshold radiation levels, applying mathematical models of the COTS devices for post-irradiation conditions to determine radiation responses to ionizing radiation; implementing a radiation-tolerant architecture using COTS devices from the selected subset, the implemented circuit may be tested for robustness to ionizing radiation effects without repeated destructive tests of the hardware circuit by using the mathematical models for simulating response to the ionizing radiation, and implementing a multi-layer shielding to protect the implemented circuit under various radiation conditions.