An implementation-quality synthesis process begins with a logical design of an integrated circuit and, through a series of steps, generates a fully synthesized physical design of the integrated circuit. One of the steps is clock synthesis, which generates the clock network for the integrated circuit. In certain embodiments, a method includes the following steps. A reduced clock synthesis process is applied, rather than the implementation-quality clock synthesis process. This generates a clock network for the logical design, which will be referred to as a proxy clock network because it is used as a proxy to estimate power consumption of the fully synthesized clock network. Because the reduced clock synthesis process runs much faster than the implementation-quality clock synthesis process, the front end designer may use these power estimates in the front end design process, including to explore different design variations in the logical design.

A system includes one or more processors and a computer storage medium storing instructions that cause a machine to perform operations including accessing an integrated circuit (IC) design including an initial clock tree. The operations include selecting a first driver to evaluate for resizing, the first driver being a first size and having a first leakage current and determining a baseline power consumption measurement of clock tree based on the first size and the first leakage current of the first driver. The operations include identifying a plurality of replacement drivers to replace the first driver and determining a power consumption measurement for a second driver. Based on determining that the power consumption measurement for the second driver is less than the baseline power consumption measurement replacing the first driver with the second driver and generating a layout instance based on the second driver.

Embodiments of the invention include protecting against antenna violations in a macro having a clock mesh. Aspects include obtaining a design of the macro, the design including a clock layer having a plurality of clock pins and determining a longest vertical wire and a longest horizontal wire allowed based on a design of the clock mesh. Aspects also include identifying, based at least in part on the longest vertical wire and the longest horizontal wire, a plurality of checkbox regions for a clock pin of the plurality of clock pins and calculating a total diffusion area for each of the plurality of checkbox regions. Aspects further include adding, to the design of the macro, an antenna diode to the clock pin based on a determination that the total diffusion area for any of the plurality of checkbox regions is less than a threshold value.

Embodiments of the invention include protecting against antenna violations in a macro having a clock mesh. Aspects include obtaining a design of the macro, the design including a clock layer having a plurality of clock pins and determining a longest vertical wire and a longest horizontal wire allowed based on a design of the clock mesh. Aspects also include identifying, based at least in part on the longest vertical wire and the longest horizontal wire, a plurality of checkbox regions for a clock pin of the plurality of clock pins and calculating a total diffusion area for each of the plurality of checkbox regions. Aspects further include adding, to the design of the macro, an antenna diode to the clock pin based on a determination that the total diffusion area for any of the plurality of checkbox regions is less than a threshold value.

A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs, as automation introduces TMR storage registers, memory element spacing, and clock delay/triplication with minimal designer input.

A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs, as automation introduces TMR storage registers, memory element spacing, and clock delay/triplication with minimal designer input.

Methods and systems for circuit design are described. A tool may detect a timing violation on a signal path connected to a local clock buffer in a circuit model. The local clock buffer may be configured to generate a first clock signal having a first pulse width. The tool may determine a first metric associated with a first type of timing violation, and may determine a second metric associated with a second type of timing violation different from the first type of timing violation. The detected timing violation may be one of the first type and second type of timing violations. The tool may, based on the first metric and the second metric, determine whether to retain the generation of the first clock signal or to configure the local clock buffer to generate a second clock signal having a second pulse width different from the first pulse width.

Methods and systems for circuit design are described. A tool may detect a timing violation on a signal path connected to a local clock buffer in a circuit model. The local clock buffer may be configured to generate a first clock signal having a first pulse width. The tool may determine a first metric associated with a first type of timing violation, and may determine a second metric associated with a second type of timing violation different from the first type of timing violation. The detected timing violation may be one of the first type and second type of timing violations. The tool may, based on the first metric and the second metric, determine whether to retain the generation of the first clock signal or to configure the local clock buffer to generate a second clock signal having a second pulse width different from the first pulse width.

A method for assembling heterogeneous components. The assembly process includes using a vacuum based pickup mechanism in conjunction with sub-nm precise moiré alignment techniques resulting in highly accurate, parallel assembly of feedstocks.

A method for assembling heterogeneous components. The assembly process includes using a vacuum based pickup mechanism in conjunction with sub-nm precise moiré alignment techniques resulting in highly accurate, parallel assembly of feedstocks.