A multi-bit flip-flop includes a first flip-flop, a second flip-flop and a first inverter. The first flip-flop has a first driving capability. The second flip-flop has a second driving capability different from the first driving capability. The first inverter is configured to receive a first clock signal on a first clock pin, and is configured to generate a second clock signal inverted from the first clock signal. The first flip-flop and the second flip-flop are configured to share at least the first clock pin.

Embodiments herein include detecting a transformation in a circuit layout before clock tree synthesis is performed, and in response, estimating a latency offset, relative to a global latency value, for a clock pin in a clock gate circuit. Moreover, the embodiments includes determining, based on the latency offset, a timing constraint for combinational logic configured to generate an enable signal for the clock gate circuit and adjusting the circuit layout based on the timing constraint to affect when the combinational logic generates the enable signal.

A method includes receiving a physical circuit design file that includes physical circuit partitions that are each mapped to a respective chip. The physical circuit partitions are connected to one another by a respective timing path having an original delay. The method further includes determining a slack budget of the respective timing path, and determining a delay upper bound value based on a shortest timing path delay and the slack budget. Further, the method includes updating the delay upper bound of the respective timing path based on the slack budget, assigning an interconnection delay upper bound to a physical interconnection between at least two chips based on the updated slack budget of the respective timing path, determining a multiplexing data ratio (XDR) based on at least the interconnection delay upper bound of the physical interconnection, and performing routing between the at least two chips based on the XDR.

A method, system, and compute program product use a generalized macro or a generalized macro timing abstract for a timing analysis in a specific timing context. The method includes setting up a timer, and determining a divide ratio of each external clock divider of one or more external clock dividers associated with the generalized macro or the generalized macro timing abstract programmatically as a function of another value. The method also includes performing the timing analysis using the divide ratios of the one or more external clock dividers. Obtaining a physical implementation of an integrated circuit is based on the timing analysis.

An apparatus for monitoring operation of a design under test (DUT) comprises an incoming clock edge input to detect active clock edges provided to a monitored clock gate; an outgoing clock edge input to detect active clock edges sent from the monitored clock gate; an enable input to detect enable signals provided to the monitored clock gate and any leaf clock gates; a protocol input to receive protocol signals; an upstream clocking input connected to detect active clock edges output from upstream clock gates; and a downstream clocking input connected to detect active clock edges output from downstream clock gates. The apparatus also comprises a memory in communication with the inputs for storing values from the inputs, and a processor in communication with the memory and the inputs, the processor programmed to determine spurious and missing active clock edges sent from the monitored clock gate. The apparatus also comprises a clock categorization output to output the determination of the active clock edges from the monitored clock gate as missing or spurious.

Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

Systems and methods are disclosed for generation and testing of integrated circuit designs with clock crossings between clock domains and reset crossings between reset domains. These may allow for the rapid design and testing (e.g. silicon testing) of processors and SoCs. Clock crossings may be automatically generated between modules, inferring the values of design parameters, such as a signaling protocol (e.g. a bus protocol), directionality, and/or a clock crossing type (e.g., synchronous, rational divider, or asynchronous), of a clock crossing. Reset crossings may be automatically generated in a similar manner. For example, implicit classes may be used to generate clock crossings or reset crossings in a flexible manner. For example, these system and methods may be used to rapidly connect a custom processor design, including one or more IP cores, to a standard input/output shell for a SoC design to facilitate rapid silicon testing of the custom processor design.

A method includes providing a first clock tree including a root clock and a plurality of levels of integrated clock gates (ICGs) under the root clock. The plurality of levels of ICGs in the first clock tree is flattened to generate a second clock tree including a plurality of ICGs in a same level under the root clock. A fake module is formed to reserve a region between the root clock and the plurality of ICGs. The fake module includes the root clock as a first input, and a first plurality of outputs coupled to clock-inputs of the plurality of ICGs. A skew balancing is performed on the second clock tree using a clock tree synthesis (CTS) tool to generate a third clock tree, wherein no buffers are inserted into the fake module, and wherein buffers are inserted by the CTS tool under the plurality of ICGs.

A system and method to generate a clock domain-independent abstract of a component in an integrated circuit design. The method includes performing an initial analysis of the component using an initial clock value for each clock domain type, the clock domain types including a functional clock and a test clock, executing an abstractor to obtain a reduced order model of the initial analysis as a clock domain-dependent abstract, and obtaining original constraints associated with one or more circuit elements within the component from the clock domain-dependent abstract. Generating generalized constraints is based on clock domain-dependent constraints among the original constraints, and generating the clock domain-independent abstract is based on the generalized constraints. The method also includes obtaining a physical implementation based on one or more analyses using the clock domain-independent abstract.

A soft error-mitigating semiconductor design system and associated methods that tailor circuit design steps to mitigate corruption of data in storage elements (e.g., flip flops) due to Single Events Effects (SEEs). Required storage elements are automatically mapped to triplicated redundant nodes controlled by a voting element that enforces majority-voting logic for fault-free output (i.e., Triple Modular Redundancy (TMR)). Storage elements are also optimally positioned for placement in keeping with SEE-tolerant spacing constraints. Additionally, clock delay insertion (employing either a single global clock or clock triplication) in the TMR specification may introduce useful skew that protects against glitch propagation through the designed device. The resultant layout generated from the TMR configuration may relax constraints imposed on register transfer level (RTL) engineers to make rad-hard designs. as automation introduces TMR storage registers, memory element spacing, and clock delay/triplication with minimal designer input.