A system is configured to receive video footage of evaporator coil slabs after they exit an automated coil brazer. The system is further configured to convert the video footage to greyscale. The system is further configured to isolate frames from the greyscale video footage. Each frame comprises an image of a different evaporator coil slab. The system is further configured to identify a plurality of feature points in a first frame and a plurality of feature points in a second frame. The system is then configured to determine that a subset of features points in each frame are rotationally invariant. The system is further configured to generate a first digital fingerprint for each frame from a binary feature vector for each point in the subset of feature points determined to be rotationally invariant.

Surgical kit inspection systems and methods are provided for inspecting surgical kits having parts of different types. The surgical kit inspection system comprises a vision unit including a first camera unit and a second camera unit to capture images of parts of a first type and a second type in each kit and to capture images of loose parts from each kit that are placed on a light surface. A robot supports the vision unit to move the first and second camera units relative to the parts in each surgical kit. One or more controllers obtain unique inspection instructions for each of the surgical kits to control inspection of each of the surgical kits and control movement of the robot and the vision unit accordingly to provide output indicating inspection results for each of the surgical kits.

A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.

One variation of a method for automatically generating a planogram for a store includes: dispatching a robotic system to autonomously navigate within the store during a mapping routine; accessing a floor map of the floor space generated by the robotic system from map data collected during the mapping routine; identifying a shelving structure within the map of the floor space; defining a first set of waypoints along an aisle facing the shelving structure; dispatching the robotic system to navigate to and to capture optical data at the set of waypoints during an imaging routine; receiving a set of images generated from optical data recorded by the robotic system during the imaging routine; identifying products and positions of products in the set of images; and generating a planogram of the shelving segment based on products and positions of products identified in the set of images.

An image evaluation device includes a determination result acquisition unit acquires a result of determining the presence or absence of a difference between an object image that is one of a plurality of images that include three or more images obtained by imaging substantially the same spatial region and each of reference images that are images other than the object image among the plurality of images and an evaluation index acquisition unit configured to acquire an evaluation index for the plurality of images on the basis of at least one of the number of determinations of the presence of the difference between the object image and each reference image and the number of determinations of the absence of the difference between the object image and each reference image.

A mounting device mounts components on a board, and performs processing of arranging discard components discarded based on a captured image on a discard loading section. A CPU of a management computer acquires an identification image in which it is possible to identify a discard component to be discarded and a captured image of the discard component, links the acquired identification image of the discard component and the captured image of the discard component, and creates a discard component arrangement image screen that includes an arrangement display area in which the identification images are arranged based on an order in which the discard components were arranged on discard loading section. The CPU of management computer then outputs the created discard component arrangement image screen.

A metrology method for use in determining one or more parameters of a three-dimensional patterned structure, the method including performing a fitting procedure between measured TEM image data of the patterned structure and simulated TEM image data of the patterned structure, determining a measured Lamellae position of at least one measured TEM image in the TEM image data from a best fit condition between the measured and simulated data, and generating output data indicative of the simulated TEM image data corresponding to the best fit condition to thereby enable determination therefrom of the one or more parameters of the structure.

Method for detecting a defect in a zone of interest of an optical lens, the method including: an image reception step, during which a plurality of images is received, each image includes a view of the zone of interest in front of a plurality of specific patterns, each specific pattern including a bright area and a dark area, and at least one image received is saturated in light intensity; a sampling step, during which each image of the plurality of images are sampled based on a common sampling pattern; a recombination step, during which a recombined image of the zone of interest is determined based on the common sampling pattern; and a defect detection step, during which a defect is detected in the zone of interest of the optical lens based on an analysis of the recombined image.

Disclosed herein is a colony analysis apparatus, which cultures microorganisms collected from food subject to microbial collection on a plurality of Petri substrates and analyzes colors and the number of the cultured microorganisms by image recognition, thereby accurately determining and analyzing the contamination level of the food subject to microbial collection by an average value of the analysis.

The present invention relates to a method for detecting changes in the ore grade of a rock face in near real time. The method includes the step of providing a scanning system having at least a hyperspectral imager, a position system, a LiDAR or range determination unit and computational resources. Further, the method involves determining a precise location of the scanning system utilising the position system. The rock face is scanned with the range determination unit to determine rock face position information. The method involves scanning the rock face with the hyperspectral imager to produce a corresponding rock face hyperspectral image. Further the method involves utilising the computational resources to fuse together the rock face position information and the corresponding rock face hyperspectral image to produce a rock face position and content information map of the rock face.