An imaging system for creating an image of a target object comprising a mirror mounted on a gimbal and arranged to rotate about at least one axis, a gimbal drive unit configured to control the orientation of the gimbal, and a camera having its optical axis directed onto the mirror in order that an image reflected in the mirror is within a field of view of the camera, wherein the control unit is arranged to position the gimbal such that a reflection of a target object is within a field of view of the camera.

A method of structural masking for progressive health monitoring of a structural component includes receiving a current image of the structural component. A processor aligns the current image and a reference image of the structural component. The processor performs a structure estimation on the current image and the reference image to produce a current structure estimate image and a reference structure estimate image. The processor generates a structural mask from the reference structure estimate image. The processor masks the current structure estimate image with the structural mask to identify one or more health monitoring analysis regions including a potential defect or damaged area appearing in the masked current structure estimate image that does not appear in the reference structure estimate image.

The disclosure described herein is directed to a computerized system and method of grading and authenticating collectibles utilizing digital imaging devices and processes to provide an objective, standardized, consistent high-resolution grading of collectible objects, such as but not limited to sport and non-sport trading cards. The disclosure eliminates the subjectivity present in the human grading process and overcomes the inherent limitations of the human eye.

The purpose of the present invention is to provide a pattern matching device and computer program that carry out highly accurate positioning even if edge positions and numbers change. The present invention proposes a computer program and a pattern matching device wherein a plurality of edges included in first pattern data to be matched and a plurality of edges included in second pattern data to be matched with the first pattern data are associated, a plurality of different association combinations are prepared, the plurality of association combinations are evaluated using index values for the plurality of edges, and matching processing is carried out using the association combinations selected through the evaluation.

A system and method of detecting damage to a component may include a first sensor and a processor. The method may include the steps of receiving, by the processor, a first data for the component from a first sensor, aligning, by the processor, the first data with a reference model, determining, by the processor, a feature dissimilarity between the first data and the reference model, classifying, by the processor, the feature dissimilarity, and determining, by the processor, a probability that the feature dissimilarity indicates damage to the component.

A machine vision system for automatically identifying and inspecting objects is disclosed, including composable vision-based recognition modules and a decision algorithm to perform the final determination on object type and quality. This vision system has been used to develop a Projectile Identification System and an Automated Tactical Ammunition Classification System. The technology can be used to create numerous other inspection and automated identification systems.

A method of automatically detecting damage following a loss causing incident is disclosed. The method includes capturing image information about a group of physical objects in their initial states and comparing these with image information about the group of physical objects in their modified states following a loss causing incident. The method includes detecting discrepancies between the initial and modified states and automatically assesses the degree of damage and/or loss.

Implementations of the present disclosure include receiving a training image, providing a hash pattern that is representative of the training image, applying a plurality of filters to the training image to provide a respective plurality of filtered training images, identifying a filter to be associated with the hash pattern based on the plurality of filtered training images, and storing a mapping of the filter to the hash pattern within a set of mapping in a data store.

At least three dark field images of a feature on a semiconductor wafer can be formed using an optical inspection system. Each of the at least three dark field images is from a different channel of the optical inspection system using an aperture that is fully open during image generation. The dark field images can be fused into a pseudo wafer image that is aligned with a corresponding design. This alignment can improve care area placement.

An inspection apparatus includes: a hardware processor that: conducts an inspection on an image by comparing a scanned image with a correct image, the image being formed on paper in accordance with a print job, the scanned image being generated by reading the image, the correct image serving as a reference for the inspection of the image; and determines whether a page is a target for the inspection in accordance with a type of the paper on which the image will be formed according to print setting of the print job, wherein the hardware processor conducts the inspection on the image on a page that has been determined to be the target for the inspection by the hardware processor, and does not conduct the inspection on the image on a page that has been determined to not be the target for the inspection.