Provided is a change degree deriving device including a receiving unit that receives an image obtained by capturing a known color body and an object while focusing on the object, the known color body including plural of color samples, each of which has a known color numerical value, and a detection image, and a detecting unit that detects a focus deviation of the color samples in the image, based on the detection image.

A method and a system for achieving a self-adaptive surround sound. The method comprises: recognizing specific positions of a room and a user in the room by using an object recognition technology, capturing focusing images of recognized objects by controlling a camera using a focusing control technology, and recording corresponding focusing parameters (S110); calculating position information of the room relative to the camera and position information of the user relative to the camera according to the images and the parameters (S120); calculating sound beams that can achieve the surround sound at the position of the user in said room according to aforesaid calculated position information of the room and the user (S130); obtaining parameters of a filter group according to the calculated sound beams, and adjusting the filter group of a loudspeaker array according to the parameters (S140); and playing an audio signal via the loudspeaker array after the audio signal is filtered by the filter group that has been adjusted according to the parameters to form surround sound at the position of the user in the room (S150).

A substrate to be inspected includes a first pattern constructed with a repetitive pattern that is not resolved by a wavelength of a light source, and at least one alignment mark that is arranged on the same plane as the first pattern. The alignment mark includes a second pattern constructed with a repetitive pattern that is not resolved by the wavelength of the light source, and a programmed defect that is provided in the second pattern and not resolved by the wavelength of the light source. A focus offset is adjusted such that the strongest signal of the programmed defect is obtained with respect to a base value of a gradation value in an optical image of the programmed defect by capturing the optical image while changing a focal distance between the surface in which the first pattern is provided and an optical system.

A method of an electronic device for automatically focusing on a moving object is provided. The method includes generating, by a processor, at least one focal code based on information comprising depth information of the moving object obtained using at least one previous position of the moving object, focusing, by the processor, on at least one portion of the moving object based on the at least one focal code, and capturing, by a sensor, at least one image of the moving object comprising the at least one portion of the moving object.

A first restoration processing section 110 and a second restoration processing section 120 perform restoration processing on images (luminance data Y), which are successively captured by an image capture section, using a first filter 102, which is a restoration filter generated corresponding to a point spread function of an optical system, and a second filter 104 of which a restoration strength is weaker than that of the first filter 102. Depending on a result of determination which is input from an in-focus determination section 150 and indicates whether or not the image at the current time point is in a target in-focus state, a selection section 122 selects and outputs either luminance data Y.sub.A which is processed using the first filter 102 or luminance data Y.sub.B which is processed using the second filter 104.

An inspection method for inspecting a substrate by using an optical image obtained by irradiating the substrate with light from a light source through an optical unit, and causing the light reflected by the substrate to be incident to a sensor, includes adjusting a focus offset value such that a focal distance for setting the signal-to-noise ratio of a programmed defect to the maximum level, is obtained by acquiring the optical image while changing a focal distance between the surface in which a first pattern is provided and the optical unit. The substrate includes the first pattern, a second pattern on the same plane as the first pattern, the programmed defect in the second pattern, and a third pattern on the same plane as the first pattern. The existence of a defect is detected by acquiring the optical image of the first pattern after the focus offset is adjusted.

Configurations are disclosed for a health system to be used in various healthcare applications, e.g., for patient diagnostics, monitoring, and/or therapy. The health system may comprise a light generation module to transmit light or an image to a user, one or more sensors to detect a physiological parameter of the user's body, including their eyes, and processing circuitry to analyze an input received in response to the presented images to determine one or more health conditions or defects.

Configurations are disclosed for a health system to be used in various healthcare applications, e.g., for patient diagnostics, monitoring, and/or therapy. The health system may comprise a light generation module to transmit light or an image to a user, one or more sensors to detect a physiological parameter of the user's body, including their eyes, and processing circuitry to analyze an input received in response to the presented images to determine one or more health conditions or defects.

Methods of acquiring a through-focus scanning optical microscopy (TSOM) image and inspecting a semiconductor device are provided. A method of acquiring the TSOM image includes: acquiring a plurality of actual images of different focal positions and out-of-focus degrees (distances) of the actual images with respect to an inspection object through an optical tool; acquiring a plurality of virtual images having different focal positions from the actual images and the focal positions thereof, based on the actual images and the out-of-focus degrees of the actual images; and acquiring a TSOM image of the inspection object by using the actual images and the virtual images. According to a method of acquiring the TSOM image and the method of inspecting the semiconductor device, it is possible to acquire high-precision TSOM images of the object with less effort and time and to inspect the semiconductor device efficiently and at low cost.

A method including automatically segmenting regions of images of a focal stack into segment regions; and based, at least partially, upon selection of one or more of the segment regions, generating a refocused image which induces different ones of the segment regions from at least two of the images of the focal stack. An apparatus including an image segmentator for a focal stack of images, where the image segmentator is configured to automatically form segment regions for each of the images; and a focal stack fuser configured to fuse the focal stack of images into a refocused image, where the refocused image comprises different ones of the segment regions from at least two of the images of the focal stack.