The present disclosure provides systems and methods for diagnosing disease. In some aspects, an imaging system is provided that includes a light source configured to illuminate a retina of the eye with light, one or more imaging devices configured to receive light returned from the retina to generate one or more spatial-spectral images of the retina, and a computing device configured to receive the one or more spatial-spectral images of the retina, evaluate the one or more spatial-spectral images, and identify one or more biomarkers indicative of a neurogenerative pathology.

Provided is image processing unit that causes computer to perform: a spatter candidate region detection step of performing, for each of input images obtained by capturing workpiece during arc welding, detection of a spatter candidate region based on a pixel value indicating brightness of a pixel included in the input images; a reflected light region identification step of identifying, in the spatter candidate region detected in the spatter candidate region detection step, a reflected light region in which reflected light of arc light is shown, based on color information of a reference pixel included in the spatter candidate region; and a spatter number identification step of identifying, as the number of spatters, the number of spatter candidate regions obtained by removing the reflected light region identified in the reflected light region identification step in the spatter candidate region detected in the spatter candidate region detection step.

A light emitting unit emits infrared rays. An imaging element converts incident infrared rays into an electric signal and outputs the electric signal. A control unit estimates a light emission timing at which infrared rays are emitted from another infrared imaging device based on an infrared picture generated based on the electrical signal output from the imaging element, and performs control to cause the light emitting unit to emit infrared rays in a period in which the infrared rays are not emitted from the another infrared imaging device.

A method for obtaining a Fourier ptychography image using a smartphone comprises the steps of: (a) sequentially providing illumination of different angles to the sample by sequentially displaying, according to a first pattern composed of point light sources at different positions, the point light sources of the first pattern on a display of the smartphone; (b) obtaining an image for each illumination angle of the sample using a camera of the smartphone whenever illumination of different angles is provided by the point light sources of the first pattern; and (c) restoring a first Fourier ptychography image using a plurality of images for each illumination angle obtained using the camera of the smartphone.

Embodiments are directed to a sensing system that employs beams to scan paths across an object such that sensors may the beams reflected by the scanned object. Events may be provided based on the detected signals and the paths such that each event may be associated with a sensor and event metrics. Crossing points for each sensor may be determined based on where the paths intersect the scanned object such that events associated with each sensor are associated with the crossing points for each sensor. Each crossing point of each sensor may be compared to each correspondent crossing point of each other sensor. Actual crossing points may be determined based on the comparison and the crossing points for each sensor. Position information for each sensor may be determined based on the actual crossing points.

Methods, systems, and computer readable media for generating a three-dimensional reconstruction of an object with reduced distortion are described. In some aspects, a system includes at least two image sensors, at least two projectors, and a processor. Each image sensor is configured to capture one or more images of an object. Each projector is configured to illuminate the object with an associated optical pattern and from a different perspective. The processor is configured to perform the acts of receiving, from each image sensor, for each projector, images of the object illuminated with the associated optical pattern and generating, from the received images, a three-dimensional reconstruction of the object. The three-dimensional reconstruction has reduced distortion due to the received images of the object being generated when each projector illuminates the object with an associated optical pattern from the different perspective.

One example system comprises a LIDAR sensor that rotates about an axis to scan an environment of the LIDAR sensor. The system also comprises one or more cameras that detect external light originating from one or more external light sources. The one or more cameras together provide a plurality of rows of sensing elements. The rows of sensing elements are aligned with the axis of rotation of the LIDAR sensor. The system also comprises a controller that operates the one or more cameras to obtain a sequence of image pixel rows. A first image pixel row in the sequence is indicative of external light detected by a first row of sensing elements during a first exposure time period. A second image pixel row in the sequence is indicative of external light detected by a second row of sensing elements during a second exposure time period.

The present invention provides a processing apparatus (10) including an acquisition unit (11) that acquires an image including a product, a detection unit (12) that detects, from the image, a target region being a region including an observation target, a computation unit (13) that computes an evaluation value of an image of the target region, and a registration unit (14) that registers the image as an image for learning, when the evaluation value satisfies a criterion.

In a sample observation device, an image acquisition unit 6 acquires a plurality of pieces of image data of a sample in a Y-axis direction, and an image generation unit generates luminance image data on luminance of the sample on the basis of the plurality of pieces of image data, binarizes luminance values of each of the plurality of pieces of image data to generate a plurality of pieces of binarized image data, and generates area image data on an existing area of the sample on the basis of the plurality of pieces of binarized image data.

A substrate inspection apparatus configured to inspect a substrate with an image obtained by imaging a surface of the substrate includes a holder 31 configured to hold the substrate; a first light source unit 51 configured to emit visible light to the substrate held by the holder 31; a second light source unit 52 configured to emit infrared light to the substrate held by the holder 31; a first imaging sensor configured to capture a visible light image of the surface of the substrate by receiving first reflected light emitted from the substrate as a result of radiating the visible light; and a second imaging sensor configured to capture an infrared light image of the surface of the substrate by receiving second reflected light emitted from the substrate as a result of radiating the infrared light.