There is provided a system and method for mask inspection, comprising: obtaining a plurality of images, each representative of a respective part of the mask; generating a CD map of the mask comprising a plurality of composite values of a CD measurement of a POI respectively derived from the plurality of images, comprising, for each given image: dividing the given image into a plurality of sections; searching for the POI in the plurality of sections, giving rise to a set of sections, each with presence of at least one of the POI therein; for each section, obtaining a value of the CD measurement using a printing threshold, giving rise to a set of values of the CD measurement corresponding to the set of sections; and combining the set of values to a composite value of the CD measurement corresponding to the given image.

In an obstacle detection apparatus, the captured image of a vicinity of a vehicle from an imaging apparatus is acquired. A three-dimensional estimation image showing a three-dimensional position of a feature point in the captured image is generated, and a three-dimensional position of an object is estimated. An attribute image in which an object in the captured image is classified into one or more classes that include at least a road-surface class is generated. The three-dimensional estimation image and the attribute image are fused, the feature points and the classes are associated, and road-surface points associated with the road-surface class are extracted. Based on the road-surface points, a road-surface height in the vicinity of the vehicle is estimated. Based on the estimated road-surface height, the three-dimensional position of the object is corrected. Based on the three-dimensional position of the object, an obstacle in the vicinity of the vehicle is detected.

A method and system for measuring the alignment between a substrate and a platform upon which it is disposed by using image processing algorithms are described herein. These algorithms automate the detection of edges of a microscope slide and the platform in a digital image. A reference line pattern in an image of the platform can be used to detect platform edges based on a computed location of the reference line pattern in the image.

A system and method are provided for collection and testing of a biologic sample in a self-diagnostic test. The system and method comprise collecting by a user of a testing device a biologic sample for use with the testing device, assigning correlative values as test results, and receiving the test results at a server disposed on a network. Some aspects include a mobile application operating on a mobile device with which the user interacts. These aspects allow advertisements and other messages to be presented to the user through the mobile application. Some aspects present different messages to the user based on the type of self-diagnostic test the user is conducting.

Embodiments disclosed herein provide for a system and method for recalibrating an augmented reality experience in mobile devices using a plurality of physical markers. The system and methods provide for realigning the digital representation to the physical world using known physical locations associated with the physical markers that map directly to the digital representation.

The present disclosure is related to an optical encoder which is configured to provide precise coding reference data by feature recognition technology. To apply the present disclosure, it is not necessary to provide particular dense patterns on a working surface. The precise coding reference data can be generated by detecting surface features of the working surface.

A collation device includes a light source unit; a camera unit that receives light emitted from the light source unit and reflected in a collation area of an object to acquire a photographed image of the collation area; and a processor configured to, by executing a program: detect a positional relationship between the light source unit and the camera unit by using the photographed image, and notify of a collation result between the photographed image and a registered image prepared in advance by using the positional relationship.

Provided are a method and apparatus for correcting positioning information, an electronic device and a storage medium, which relate to the field of artificial intelligence, in particular, to intelligent transportation technology and image processing technology. The specific implementation solution includes steps described below. A to-be-corrected image and positioning information of the to-be-corrected image are acquired. A target candidate reference image matching the to-be-corrected image is selected from candidate reference images having accurate positioning information. The positioning information of the to-be-corrected image is corrected according to accurate positioning information of the target candidate reference image. According to the solution of the present disclosure, the positioning information of the to-be-corrected image can be quickly corrected, and a guarantee is provided for accurately updating a navigation map by using the to-be-corrected image subsequently.

A camera device for detecting a stream of objects moved relative to the camera device is provided that has an image sensor for recording image data of the objects, a geometry detection sensor for measuring the objects, and a control and evaluation unit that is configured to determine at least one region of interest using measured data of the geometry detection sensor to restrict the evaluation of the image data to the region of interest. In this respect, the image sensor has a configuration unit to enable the reading of only a settable portion of the respectively recorded image data; and the control and evaluation unit is configured only to read a portion of the image data from the image sensor that is determined with reference to the region of interest.

A method of processing a wafer is provided. The method includes providing a reference plate below the wafer. The reference plate includes a reference pattern. The reference plate is imaged to capture an image of the reference pattern by directing light through the wafer. A first pattern is aligned using the image of the reference pattern. The first pattern is applied to a working surface of the wafer based on the aligning.