An optical information processing device writes and reads information on an information recording medium having recording layers. The optical information processing device includes: first and second light sources; a light condensing element that condenses light from the first and second light sources on the medium; a first photodetector that receives light reflected by the medium after being emitted from the first light source and generates a first focusing error signal; a second photodetector that receives light reflected by the medium after being emitted from the second light source and generates a second focusing error signal; and a focusing control circuit that controls the light condensing element by using the first focusing error signal in such a manner that the light from the second light source is condensed on each of the recording layers. The second focusing error signal is used to add a correction to the focusing control circuit.

An optical information processing device writes and reads information on an information recording medium having recording layers. The optical information processing device includes: first and second light sources; a light condensing element that condenses light from the first and second light sources on the medium; a first photodetector that receives light reflected by the medium after being emitted from the first light source and generates a first focusing error signal; a second photodetector that receives light reflected by the medium after being emitted from the second light source and generates a second focusing error signal; and a focusing control circuit that controls the light condensing element by using the first focusing error signal in such a manner that the light from the second light source is condensed on each of the recording layers. The second focusing error signal is used to add a correction to the focusing control circuit.

An optical encoder is provided. The encoder includes an optical disc mounted on a shaft, the optical disc containing pit and land markings; an optical pickup unit for an optical disc that receives light from the optical disc and supplies as an output an electrical signal representative of the received light, comprising: a reading head objective lens, and dynamic steering actuators that control the focus and tracking of the reading head objective lens; a processor that receives as an input the electrical signal from the optical pickup unit and reports motion of the substrate based on the received at least one electrical signal.

An optical encoder is provided. The encoder includes an optical disc mounted on a shaft, the optical disc containing pit and land markings; an optical pickup unit for an optical disc that receives light from the optical disc and supplies as an output an electrical signal representative of the received light, comprising: a reading head objective lens, and dynamic steering actuators that control the focus and tracking of the reading head objective lens; a processor that receives as an input the electrical signal from the optical pickup unit and reports motion of the substrate based on the received at least one electrical signal.

A system includes a polarization selective optical element configured to diffract a light reflected by an object into a plurality of signal lights. The system also includes at least one optical sensor configured to receive the signal lights and generate a plurality of tracking signals for tracking the object.

A system includes a polarization selective optical element configured to diffract a light reflected by an object into a plurality of signal lights. The system also includes at least one optical sensor configured to receive the signal lights and generate a plurality of tracking signals for tracking the object.

An improved optical encoder uses an optical pick-up unit that provides for degrees of freedom in the tracking and focus axes that are unavailable in conventional optical encoders thereby improving the encoders' performance. In an embodiment the encoder employs an optical disc marked with pits and lands which may be arranged in a spiral pattern. The optical disc is mounted on the shaft whose motion is to be monitored by the optical encoder. The encoder may be arranged to read the markings on the optical disc using the three-beam pickup method.

An improved optical encoder uses an optical pick-up unit that provides for degrees of freedom in the tracking and focus axes that are unavailable in conventional optical encoders thereby improving the encoders' performance. In an embodiment the encoder employs an optical disc marked with pits and lands which may be arranged in a spiral pattern. The optical disc is mounted on the shaft whose motion is to be monitored by the optical encoder. The encoder may be arranged to read the markings on the optical disc using the three-beam pickup method.

Embodiments herein provide systems and methods for forming an optical component. A method may include providing a plurality of proximity masks between a plasma source and a workpiece, the workpiece including a plurality of substrates secured thereto. Each of the plurality of substrates may include first and second target areas. The method may further include delivering, from the plasma source, an angled ion beam towards the workpiece, wherein the angled ion beam is then received at one of the plurality of masks. A first proximity mask may include a first set of openings permitting the angled ion beam to pass therethrough to just the first target area of each of the plurality of substrates. A second proximity mask may include a second set of openings permitting the angled ion beam to pass therethrough just to the second target area of each of the plurality of substrates.

Embodiments herein provide systems and methods for forming an optical component. A method may include providing a plurality of proximity masks between a plasma source and a workpiece, the workpiece including a plurality of substrates secured thereto. Each of the plurality of substrates may include first and second target areas. The method may further include delivering, from the plasma source, an angled ion beam towards the workpiece, wherein the angled ion beam is then received at one of the plurality of masks. A first proximity mask may include a first set of openings permitting the angled ion beam to pass therethrough to just the first target area of each of the plurality of substrates. A second proximity mask may include a second set of openings permitting the angled ion beam to pass therethrough just to the second target area of each of the plurality of substrates.