In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.

In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.

In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.

An image display device includes an image light generation unit configured to generate image light, a projection system optical unit configured to project the image light, a correction system optical unit configured to correct aberrations, a first diffraction element configured to deflect the image light incident on a first incident surface, and a second diffraction element configured to deflect the image light incident on a second incident surface. The projection system optical unit, the second diffraction element, the correction system optical unit, and the first diffraction element are arranged in this order in a direction of the image light emitted from the image light generation unit, and the image light deflected and dispersed into rays of respective wavelengths by the second diffraction element is focused by the first diffraction element.

An image display device includes an image light generation unit configured to generate image light, a projection system optical unit configured to project the image light, a correction system optical unit configured to correct aberrations, a first diffraction element configured to deflect the image light incident on a first incident surface, and a second diffraction element configured to deflect the image light incident on a second incident surface. The projection system optical unit, the second diffraction element, the correction system optical unit, and the first diffraction element are arranged in this order in a direction of the image light emitted from the image light generation unit, and the image light deflected and dispersed into rays of respective wavelengths by the second diffraction element is focused by the first diffraction element.

In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.

In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.

A holographic characterization and playback apparatus is provided, which includes a light source, an optical path-forming optical system for separating the light emitted from the light source into a probe light and a reference light of different polarizations, and combining optical paths of the probe light and the reference light.

In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.

In a case where (i) a reflectance calculated from a reflected light amount obtained from a longest pit (P1max) or a longest space (S1max) in a first pit row is defined as a first reflectance and (ii) a reflectance calculated from a reflected light amount obtained from a longest pit (P2max) or a longest space (S2max) in the second pit row is defined as a second reflectance, the first pit row is formed such that the first reflectance becomes substantially identical with the second reflectance.