Patent classifications
G11C7/106
Data synthesizer
A data synthesizer includes a first input circuit, a second input circuit, and an output circuit. The first input circuit is configured to latch a first data under control of a first latch clock signal. The second input circuit is configured to latch a second data under control of the first latch clock signal. A phase of the first data is the same as a phase of the second data. The output circuit is connected to the first input circuit and the second input circuit. The output circuit is configured to output the first data and the second data in sequence.
MEMORY WITH SCAN CHAIN TESTING OF COLUMN REDUNDANCY LOGIC AND MULTIPLEXING
A memory is provided in which a scan chain covers the redundancy logic for column redundancy as well as the redundancy multiplexers in each column. The redundancy logic includes a plurality of redundancy logic circuits arranged in series. Each redundancy logic circuit corresponds to a respective column in the memory. Each column is configured to route a shift-in signal through its redundancy multiplexers during a scan mode of operation.
Data control circuit for increasing maximum and minimum tolerance values of skew between DQS signal and clock signal during write operation and associated memory device
A data control circuit includes a first latch circuit, a self-block circuit, a second latch circuit, a third latch circuit, a first data timing-labeled signal generating circuit, and a second data timing-labeled signal generating circuit. The first latch circuit is arranged to receive a data window signal. The self-block circuit is coupled to the first latch circuit, and is arranged to generate a protection signal. The second latch circuit is coupled to the self-block circuit, and is arranged to output a first data timing-labeled signal. The third latch circuit is coupled to the second latch circuit, and is arranged to generate a second data timing-labeled signal. The first data timing-labeled signal generating circuit is arranged to generate a third data timing-labeled signal. The second data timing-labeled signal generating circuit is arranged to generate a fourth data timing-labeled signal.
PAGE BUFFER CIRCUITS IN THREE-DIMENSIONAL MEMORY DEVICES
The present disclosure provides page buffer circuits of 3D NAND devices. In some embodiments, the page buffer circuit comprises a first bit line segment sensing branch connected to a first bit line segment of a bit line, and a second bit line segment sensing branch connected to a second bit line segment of the bit line. The first bit line segment sensing branch and the second bit line segment sensing branch are parallel connected to a sensing node of the page buffer circuit. In some embodiments, the first bit line segment sensing branch comprises a first sense latch and a first bit line pre-charge path, and the second bit line segment sensing branch comprises a second sense latch and a second bit line pre-charge path.
WEAK PRECHARGE BEFORE WRITE DUAL-RAIL SRAM WRITE OPTIMIZATION
A method for accessing a memory cell includes enabling precharging of a bit line of the memory cell before a next access of the memory cell. The method includes disabling the precharging after a first interval if the next access is a write. The method includes disabling the precharging after a second interval if the next access is a read. The first interval is shorter than the second interval.
Processing-in-memory (PIM) device
A processing-in-memory (PIM) device includes a first group of storage regions, a second group of storage regions, and a plurality of multiplication/accumulation (MAC) operators. The MAC operators are configured to communicate with the first and second groups of storage regions through a global data input/output (GIO) line. A first storage region corresponding to a storage region of the first group of storage regions, a second storage region corresponding to a storage region of the second group of storage regions, and a first MAC operator corresponding to a MAC operator of the plurality of MAC operators constitute a MAC unit. The first MAC operator is configured to receive first data and second data from the first and second storage regions, respectively, through the GIO line to perform a MAC arithmetic operation of the first and second data and to output a result of the MAC arithmetic operation.
Sense Amplifier Mapping and Control Scheme for Non-Volatile Memory
A data storage includes a memory array including a plurality of memory cells, and peripheral circuitry disposed underneath the memory array. The peripheral circuitry includes an M-tier sense amplifier (SA) circuit including X stacks of SA latches, wherein each SA latch is respectively coupled to a bit line of a memory cell of the plurality of memory cells; and an N-tier memory cache data (XDL) circuit including Y stacks of XDL latches, wherein M is less than N, and X is greater than Y. The peripheral circuitry further includes data path circuitry coupling (i) each SA latch of the X stacks of SA latches to (ii) a respective XDL latch of the Y stacks of XDL latches.
Data transfer in port switch memory
The present disclosure includes apparatuses and methods related to data transfer in memory. An example apparatus can include a first number of memory devices coupled to a host via a first number of ports and a second number of memory devices coupled to the first number of memory device via a second number of ports, wherein a first number of commands are executed to transfer data between the first number of memory devices and the host via the first number of ports and a second number of commands are executed to transfer data between the first number of memory device and the second number of memory device via the second number of ports.
COMPUTING MEMORY SYSTEMS
Memories, memory controllers, and computing systems and their methods of operation are disclosed. In some embodiments, a method of accessing a memory includes accessing a first bit line corresponding to a sense amplifier and accessing a second bit line corresponding to the sense amplifier. In some embodiments, a memory controller includes a second memory configured to store data of a second data type. In some embodiments, a method includes operating a memory in a second mode in response to receiving an input to change the operation of the memory from a first mode to the second mode.
MEMORY DEVICE
A memory device according to the present invention may comprise: a memory cell array in which memory cells are connected in matrix form to word lines and bit lines; a plurality of mergers connected in series to transfer data that is read from a selected memory cell among the memory cells included in the memory cell array and is transformed into one of a direct current form or a pulse form; and a sorter that synchronizes an edge of first output data, output by one of the plurality of mergers, with an edge of a control pulse, thereby delaying the edge of the first output data. First data, which is either data bit “0” or data bit “1”, can be input to the mergers in the form of a direct current of first logic, and second data, which is another piece of data, can be input to the mergers in the form of a pulse that changes from the first logic to the second logic and back to the first logic. When the first data is input, the sorter can allow the first data to pass as-is and output the first data as second output data in the form of a direct current of the first logic. When a first edge that changes from the second logic to the first logic is input, the sorter can delay the first edge by synchronizing the same with a rising edge or falling edge of the control pulse, and output the first edge as the second output data.