A memory device comprises, on an integrated circuit or multi-chip module, a memory including a plurality of memory blocks, a controller, and a refresh mapping table in non-volatile memory accessible by the controller. The controller is coupled to the memory to execute commands with addresses to access addressed memory blocks in the plurality of memory blocks. The refresh mapping table has one or more entries, an entry in the refresh mapping table mapping of an address identifying an addressed memory block set for refresh to a backup block address. The controller is responsive to a refresh command sequence with a refresh block address to execute a refresh operation, and is configured to restore mapping of the refresh block address to the backup block address upon power-on of the device, to scan the refresh mapping table for a set entry, and to register the set entry in the refresh mapping table.

A memory chip is described. The memory chip includes row hammer threat detection circuitry. The memory chip includes an output. The memory chip includes backpressure signal generation circuitry coupled between the row hammer detection circuitry and the output. The backpressure signal generation signal is to generate a backpressure signal to be sent from the output in response to detection by the row hammer threat detection circuitry of a row hammer threat.

A “near miss” based refresh scheme performs refreshes to read disturbed codewords proactively (or on-demand). In one example, a controller receives a read request to a target address (e.g., from a host memory controller). The read request is sent to memory, and the memory returns the read data. ECC logic decodes the read data and determines the number of error bits in the read data. If the number of error bits is greater than a threshold, a refresh write command is sent to the command queue. If an outstanding write command to the same address is already in the queue, the refresh write can be dropped and the outstanding write command converted into a refresh write command. A data cache can service read commands to the target address until the near miss-based refresh command completes.

A memory system includes a memory device and a controller. The memory device includes a memory cell array including a normal memory cell area and a redundancy memory cell area, the redundancy memory cell area having a replacement memory cell region and a reserved memory cell region; a register suitable for generating a first signal indicating existence of the reserved memory cell region; and a fuse unit suitable for activating the reserved memory cell region based on the first signal. The controller assigns an address for accessing a reserved memory cell of the reserved memory cell region based on the first signal. A replacement memory cell in the replacement memory cell region replaces a failed memory cell in the normal memory cell region, and the reserved memory cell in the reserved memory cell region remains without replacing any failed memory cell in the normal memory cell region.

A memory system including a first central processing unit, a first memory module connected to the first central processing unit by a first channel, a second memory module connected to the first central processing unit by a second channel, and a third memory module connected to the first central processing unit by a third channel may be provided. Each of the first memory module, the second memory module, and the third memory module may be configured to write the same data in a data area thereof and a mirroring data area thereof in response to an address in a mirroring mode.

The disclosure is directed to a memory storage device and an automatic error repair method thereof. In an aspect, the memory storage device includes a connection interface configured to receive a write command and a word line address associated with the write command, a memory array including a memory bank which contains an error correction code (ECC) detector, a plurality of memory cells controlled by a word line address, and a plurality of redundant memory cells controlled by a redundant word line address, a fuse blowing controller configured to receive the word line address to blow an electrical fuse of the word line address to enable the plurality of redundant memory cells, and a memory control circuit configured to transfer data from the plurality of memory cells through a bit line into the plurality of redundant memory cells in response to the electrical fuse having been blown.

A semiconductor device according to an aspect of the present invention has: a plurality of memory cells MC; a plurality of word lines WL each coupled to a corresponding one of the plurality of memory cells MC; and a control circuit that intermittently monitors accesses to the plurality of word lines WL, stores/erases some captured row-addresses in a first number of registers, and detects, by comparison with stored addresses, in response to a first number of accesses to one of the word lines WL in a first period of time. According to the present invention, access histories can be precisely analyzed by a small-scale circuit configuration, and measures against, for example, the Row Hammer problem, etc. can be taken.

A memory device and a row-hammer refresh method thereof are provided. The memory device includes a memory array and a controller. The memory array includes a plurality of normal areas and a redundancy area adjacent to the plurality of normal areas. The redundancy area includes a plurality of first word lines and a plurality of second word lines which are alternately arranged. The controller is configured to row-hammer refresh the plurality of normal areas without row-hammer refreshing the redundancy area.

A memory device and a refresh method thereof are provided. The memory device includes a memory array and a controller. The memory array includes a plurality of normal areas and a redundancy area near the plurality of normal areas. The redundancy area includes a plurality of redundancy word lines. A plurality of boundary word lines are arranged near boundaries between the plurality of normal areas and the redundancy area. The controller refreshes the plurality of redundancy word lines in sequence, and refreshes the plurality of boundary word lines in sequence after refreshing the plurality of redundancy word lines in sequence.

A memory device and a row-hammer refresh method thereof are provided. The memory device includes a memory array and a controller. The memory array includes a plurality of normal areas and a redundancy area adjacent to the plurality of normal areas. The redundancy area includes a plurality of first word lines and a plurality of second word lines which are alternately arranged. The controller is configured to row-hammer refresh the plurality of normal areas without row-hammer refreshing the redundancy area.