A method for performing a refresh operation based on system characteristics is provided. A The method includes determining that a current operation condition of a memory component is in a first state and detecting a change in the operation condition from the first state to a second state. The method further includes determining a range of the operation condition to which the second state belongs. The method further includes determining a refresh period associated with the range of the operation condition, the refresh period corresponding to a period of time between a first time when a write operation is performed on a segment of the memory component and a second time when a refresh operation is to be performed on the segment. The method further includes performing the refresh operation on the memory component according to the refresh period.

A semiconductor device includes a command decoder and a period signal generation circuit. The command decoder generates a first entry command and a first exit command based on a first internal chip selection signal and a first internal control signal and generates a second entry command and a second exit command based on a second internal chip selection signal and a second internal control signal. The period signal generation circuit generates a period signal based on the first entry command, the second entry command, the first exit command, the second exit command, and the period signal.

Embodiments of the disclosure are drawn to apparatuses, systems, and methods for dynamic targeted refresh steals. A memory bank may receive access commands and then periodically enter a refresh mode, where auto-refresh operations and targeted refresh operations are performed. The memory bank may receive a refresh management command based on a count of access commands directed to the memory bank. Responsive to the refresh management signal, a panic targeted refresh operation may be performed on the memory bank. A number of times the refresh management signal was issued may be counted, and based on that count a next periodic targeted refresh operation may be skipped.

A system and method for refreshing memory cells of a memory device includes storing each bit of a B-bit word in a different sub-array of a memory device. Each of the bits is associated with a bit position, and the memory device includes a plurality of sub-arrays. The system and method also include determining a refresh interval for a plurality of the bit positions based upon a relative importance of the plurality of the bit positions to a performance of a machine learning or signal processing task involving the B-bit word. The refresh interval is based upon a fidelity metric and a resource metric. The system and method further include refreshing the plurality of sub-arrays based upon the refresh interval determined for the plurality of bit positions, and dynamically updating the refresh interval for the plurality of bit positions upon receiving a new fidelity metric or a new resource metric.

A method for performing a refresh operation based on system characteristics is provided. The method includes determining that a current operating condition of a memory component is in a first state. The method also includes detecting a change in the operating condition from the first state to a second state. The method further includes setting a refresh period associated with the memory component based on the change of the operating condition. The refresh period corresponds to a period of time between a first time when a write operation is performed on a segment of the memory component and a second time when a refresh operation is to be performed on the segment. Moreover, the method includes performing the refresh operation according to the refresh period.

Apparatuses and methods related to implementing refresh and access modes for memory. The refresh and access modes can be used to configure a portion of memory. The portions of memory can correspond to protected regions of memory. The refresh and access modes can influence the security level of data stored in the protected regions of memory.

A method for performing a refresh operation based on system characteristics is provided. The method includes determining that a current operating condition of a memory component is in a first state. The method also includes detecting a change in the operating condition from the first state to a second state. The method further includes setting a refresh period associated with the memory component based on the change of the operating condition. The refresh period corresponds to a period of time between a first time when a write operation is performed on a segment of the memory component and a second time when a refresh operation is to be performed on the segment. Moreover, the method includes performing the refresh operation according to the refresh period.

Embodiments of the disclosure are drawn to apparatuses and methods for timing refresh operations in a memory device. An apparatus may include an oscillator that provides a periodic signal to one or more refresh timer circuits. Each of the refresh timer circuits is associated with a respective memory bank in the memory device. The refresh timer may include a counter block and a control logic block. The control logic block may gate the periodic signal to the counter block. The counter block may count the row active signal time and the row precharge time. The counter signals may be used by the control logic block to output a number of pumps of a refresh operation.

Disclosed herein is an apparatus that includes a memory cell array including a plurality of memory cells, a first counter circuit configured to periodically update a count value during a first operation mode, a burst clock generator configured to successively generate a burst pulse predetermined times when the count value indicates a predetermined value, and a row address control circuit configured to perform a refresh operation on the memory cell array in response to the burst pulse.

Methods, apparatuses, and systems for staggering refresh operations to memory arrays in different dies of a three-dimensional stacked (3DS) memory device are described. A 3DS memory device may include one die or layer of that controls or regulates commands, including refresh commands, to other dies or layers of the memory device. For example, one die of the 3DS memory may delay a refresh command when issuing the multiple concurrent memory refreshes would cause some problematic performance condition, such as high peak current, within the memory device.