Systems, apparatuses and methods may provide for memory controller technology including first logic to trigger, via an initial request, a hard-read and a soft-read, wherein the hard-read is to generate hard-bit information and the soft-read is to generate first soft-bit information and second soft-bit information, conduct a first error correction on the hard-bit information, and issue a subsequent request for at least the second soft-bit information if the first error correction is unsuccessful. Additionally, memory device technology may include a plurality of memory cells and second logic to conduct the hard-read and the soft-read from a memory cell in the plurality of memory cells in response to the initial request, send the hard-bit information to the controller, and withhold at least the second soft-bit information from the controller until the subsequent request is received.

According to one embodiment, a memory system includes a non-volatile memory and a memory controller. The non-volatile memory includes a plurality of parallel operation elements each including a memory cell. The memory controller is configured to control the plurality of parallel operation elements. In reading data from the non-volatile memory, the memory controller is configured to sequentially instruct the plurality of parallel operation elements to perform a sense operation of sensing data stored in the memory cell included in each of the plurality of parallel operation elements. In a case where an operation period of the sense operation of any one of the plurality of parallel operation elements is expired, the memory controller instructs the one of the plurality of parallel operation elements to perform a transfer operation for the data without checking a status of the one of the plurality of parallel operation elements.

A memory system includes a memory chip and a memory controller. The memory chip has a first plane and a second plane. A threshold voltage corresponding to multiple bit data is set for each of the memory cells. The memory controller causes the memory chip to execute a first read process on the first plane and the second plane in parallel by using a plurality of first read voltages different from each other for the first plane and the second plane. The first read process being a process of reading a data group of one bit among the multiple bits by using the first read voltages. The memory controller subsequently adjusts the voltage levels of the first read voltages on the basis of the data group read from the memory cells of the first plane and the data group read from the memory cells of the second plane.

Permutation coding for improved memory cell operations are described. An example apparatus can include an array of memory cells each programmable to a plurality of states. A controller coupled to the array is configured to determine an encoded data pattern stored by a number of groups of memory cells. Each of the number of groups comprises a set of memory cells programmed to one of a plurality of different collective state permutations each corresponding to a permutation in which the cells of the set are each programmed to a different one of the plurality of states to which they are programmable. The controller is configured to determine the encoded data pattern by, for each of the number of groups, determining the one of the plurality of different collective state permutations to which the respective set is programmed by direct comparison of threshold voltages of the cells of the set.

Permutation coding for improved memory cell operations are described. An example apparatus can include an array of memory cells each programmable to a plurality of states. A controller coupled to the array is configured to determine an encoded data pattern stored by a number of groups of memory cells. Each of the number of groups comprises a set of memory cells programmed to one of a plurality of different collective state permutations each corresponding to a permutation in which the cells of the set are each programmed to a different one of the plurality of states to which they are programmable. The controller is configured to determine the encoded data pattern by, for each of the number of groups, determining the one of the plurality of different collective state permutations to which the respective set is programmed by direct comparison of threshold voltages of the cells of the set.

An in-memory multiply and accumulate circuit includes a memory array, such as a NOR flash array, storing weight values W.sub.i,n. A row decoder is coupled to the set of word lines, and configured to apply word line voltages to select word lines in the set. Bit line bias circuits produce bit line bias voltages for the respective bit lines as a function of input values X.sub.i,n on the corresponding inputs. Current sensing circuits are connected to receive currents in parallel from a corresponding multimember subset of bit lines in the set of bit lines, and to produce an output in response to a sum of currents.

In a method for operating a semiconductor memory device including a plurality of memory blocks, the method includes: receiving a read command for a first memory block among the plurality of memory blocks; referring to a block read count value corresponding to the first memory block; determining whether the block read count value has reached a first threshold value; and performing a read operation on the first memory block, based on the determined result.

There are provided a memory system and an operating method thereof. A memory system includes: a plurality of storage regions, each including a plurality of memory cells; and a controller configured to provide a plurality of read retry sets, determine an applying order of the plurality of read retry sets based on characteristics of a read error occurred in a first storage region among the plurality of storage regions, and apply at least one of the read retry sets, based on the applying order, for a read retry operation performed on the first storage region.

A memory device includes a memory cell array with memory strings including a first and second select transistor and memory cells between the first and second select transistors. Each memory string has a bit line connected thereto. A different word line is connected to each of the memory cells of a memory strings. A control circuit is configured to execute a first read operation in which data is read at the same time from memory cells connected to all the bit lines and a second read operation in which data is read from memory cells connected to a first subset of bit lines and a shield voltage is applied to a second subset of bit lines in the plurality of bit lines. The controller selects the first or second read operation for execution according to the number of read voltage levels required for determining data in the memory cells.

In a method for operating a semiconductor memory device including a plurality of memory blocks, the method includes: receiving a read command for a first memory block among the plurality of memory blocks; referring to a block read count value corresponding to the first memory block; determining whether the block read count value has reached a first threshold value; and performing a read operation on the first memory block, based on the determined result.