A memory system includes a non-volatile memory and a memory controller. The non-volatile memory includes a memory cell array having pages. The memory system is configured to execute a first operation method and a second operation method. The memory system includes a control information storage unit in which a first value is set for pages having a write operation speed that is slower than a first speed, and a second value is set for pages having a write operation speed that is equal to or higher than the first speed. The memory system is configured to, at the time of write operation, select the first operation method for a target page having the first value and perform the write operation using the first operation method, and select the second operation method for a target page having the second value and perform the write operation using the second operation method.

Devices and techniques for NAND temperature data management are disclosed herein. A command to write data to a NAND component in the NAND device is received at a NAND controller of the NAND device. A temperature corresponding to the NAND component is obtained in response to receiving the command. The command is then executed to write data to the NAND component and to write a representation of the temperature. The data is written to a user portion and the representation of the temperature is written to a management portion that is accessible only to the controller and segregated from the user portion.

A non-volatile data storage device includes memory cells arranged in a plurality of blocks and a memory controller coupled to the memory cells for controlling operations of the memory cells. The memory controller is configured to determine if a given block is a bad m-bit multi-level block. In an m-bit multi-level block, each memory cell is an m-bit multi-level cell (MLC), m being an integer equal to or greater than 2. Upon determining that the given block is a good m-bit multi-level block, the memory controller assigns the given block to be an m-bit multi-level user block. Upon determining that the given block is a bad m-bit multi-level block, the memory controller determines if the given block is a good n-bit block. In an n-bit block, each memory cell is an n-bit cell, n being an integer less than m. Upon determining that the given block is a good n-bit block, the memory controller assigns the given block to be an n-bit user block or an n-bit write-buffer block.

A non-volatile storage system includes a control circuit connected to non-volatile memory cells provides for progressive writing of data. That is, existing data is overwritten by new data without performing a traditional erase operation that changes the threshold voltage of the memory cells back to the traditional or original erase state. In one example, new data is written on top of old data using shifted threshold voltage distributions. Some embodiments include writing MLC data over SLC data, using intermediate erase threshold voltage distributions and/or automatically detecting which threshold voltage distributions are currently being used to store data.

An electronic device comprising first blocks and second blocks of an array comprising memory cells. The memory cells in the first and second blocks comprise memory pillars extending through a stack. The memory pillars comprise a charge blocking material laterally adjacent to the stack, a storage nitride material laterally adjacent to the charge blocking material, a tunnel dielectric material laterally adjacent to the storage nitride material, a channel material laterally adjacent to the tunnel dielectric material, and a fill material between opposing sides of the channel material. One or more of the storage nitride material and the tunnel dielectric material in the first blocks differ in thickness or in material composition from one or more of the storage nitride material and the tunnel dielectric material in the second blocks. Additional electronic devices are disclosed, as are methods of forming an electronic device and related systems.

A memory device according to one embodiment includes a memory cell array, bit lines, amplifier units, a controller, and a register. The memory cell array includes a memory cell that stores data nonvolatilely. The bit lines are connected to the memory cell array. The sense amplifier units are connected to the bit lines, respectively. The controller performs a write operation. The register stores status information of the write operation. The memory cell array includes a first storage region specified by a first address. The plurality of sense amplifier modules include a buffer region capable of storing data.

A memory system includes a controller and a flash memory including a plurality of first blocks. The controller writes a value having a first number of bits per memory cell to a plurality of second blocks, and writes a value having a second number of bits per memory cell to a plurality of third blocks among the first blocks. The second number is more than the first number. The controller writes data from a host device to the second blocks and transcribes valid data from the second blocks to the third blocks. The controller controls the number of second blocks in the first blocks according to an order of completion of the data writing to one or more third blocks and an amount of valid data stored in each of the one or more third blocks.

A memory device includes a first memory group including plural first non-volatile memory cells capable of storing multi-bit data, and a second memory group including plural second non-volatile memory cells capable of storing single-bit data. A program operation controller builds the multi-bit data based on data inputted from an external device, performs a logical operation regarding partial data among the multi-bit data to generate a parity, programs the parity in the second memory group after programming the partial data in the first memory group, perform a verification operation regarding the partial data after a sudden power-off (SPO) occurs, recovers the partial data based on the parity and a result of the verification operation, and programs recovered partial data in the first memory group.

A storage device includes a memory device including a first memory region, a second memory region, and a third memory region, the first memory region having a lowest bit-density relative to the second memory region and the third memory region, a second memory region having a medium bit-density relative to the first memory region and the third memory region, and a third memory region having a highest bit-density relative to the first memory region and the second memory region; and a controller configured to control the memory device The controller is configured to distribute data received from a host to the first to third memory regions based on attributes of the data, to determine a current state based on a data distribution amount for each of the first to third memory regions and a respective size of each of the first to third memory regions, and to perform an action of increasing or decreasing a size of the second memory region under the current state based on a reinforcement learning result for mitigating a reduction in lifespan of the third memory region.

Storage device programming methods, systems and devices are described. A method may generate a mapping of data based on a set of data, the mapping of data including a first mapped data and a second mapped data. The method may include performing a first programming operation to write, in a first mode, the first mapped data to the memory device. The method may include storing the second mapped data to a cache. The method may include generating a second set of data, based on an inverse mapping of the mapping of data including the second mapped data from the cache and the first mapped data from the memory device, for writing, in a second mode, to the memory device, wherein the second set of data includes the set of data, and the first mode and the second mode correspond to different modes of writing to the memory device.