The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

An X-ray imaging system includes an X-ray detector; a plurality of X-ray sources configured to illuminate the detector from different perspectives; a shutter in a transmission plane between each X-ray source controlling transmission of X-rays from each X-ray source to the detector; and a processor configured to receive and process X-ray data from the detector. The shutter may be configured to illuminate the detector alternately with each X-ray source. The processor may determine 3D information about an object from the processed X-ray data. Also provided are methods for processing X-ray data and different embodiments of shutters to alternately illuminate X-ray detectors.

A collimator assembly for an x-ray optical system having a Soller slit for collimation of x-ray radiation with respect to a direction of an axis (z) of the Soller slit, wherein the Soller slit has a plurality of lamellae spaced apart from one another and having lamella planes parallel to one another, is characterized in that the Soller slit comprises a plurality of segments which are arranged along the axis and are separated from one another. The arrangement also has a collimator frame for enclosing and guiding the plurality of segments, and at least one of the plurality of segments is displaceable with respect to the collimator frame and relative to other segments. A simple but nonetheless accurate adjustment of the spectral resolution of an x-ray spectrometer to a respective different analytical application is thus enabled in a compact and cost-effective manner.

The present disclosure provides a system and method for X-ray imaging. The method of calculating scatter in an X-ray image may include forming a modulated X-ray image. The method of forming the modulated X-ray image may include acquiring X-rays through a collimator module and an imaged object in sequence to generate an X-ray image group; the acquisition may be performed during a movement of the collimator module in a first direction and the X-ray image group may include a plurality of X-ray images acquired at different times during the movement of the collimator; extracting sub-zones from the plurality of X-ray images in the X-ray image group; combining the sub-zones in the first direction to form the modulated X-ray image. In the present disclosure, an intensity distribution of the X-rays may be adjusted flexibly using a collimator without adding any extra hardware. In addition, scatter components in the X-ray images may be calculated to eliminate the scatter in the X-ray images finally.

Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.

An x-ray chopper wheel assembly, and corresponding method, include a chopper wheel having a solid area configured to block x-ray radiation received at a source side of the chopper wheel from an x-ray source. The chopper wheel defines one or more openings configured to pass x-ray radiation from the source side of the chopper wheel to an output side of the chopper wheel. The assembly further includes a source-side scatter plate arranged relative to the chopper wheel with a source-side gap in a range of approximately 0.2 mm to approximately 2.0 mm between the source-side scatter plate and the source side of the chopper wheel. The assembly and method can be used to limit leakage of scattered x-rays from the assembly, such as to safe levels for operation, while being significantly lighter than existing confinement enclosures.

An x-ray scanning assembly includes a disk chopper wheel configured to be irradiated by an x-ray beam and to block x-ray radiation of the x-ray beam, the wheel having a rim and a center. The disk chopper wheel defines therein two or more radial slits extending radially toward a rim and a center of the wheel, the slits configured to pass x-ray radiation of the x-ray beam therethrough and having at least two respective, distinct widths. An x-ray beam collimation system includes an x-ray source configured to output x-ray radiation; a collimator configured to receive the x-ray radiation form a collimated x-ray fan beam to be received at a chopper wheel. The collimated x-ray fan beam has a cross-sectional length and a cross-sectional width, smaller than the length, measured at the chopper wheel. The collimator includes a width adjustor configured to adjust width of the fan beam.

The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.

Collimation device for an X-ray detection system, the collimation device comprising: a collimator comprising a substantially planar support made of a material with partial or zero radiotransparency, the support being rotatably movable about an axis of rotation (Δ) which passes through the support and which is perpendicular to a first face of the support which acts as an X-ray plane of incidence referred to as the main plane of the support (P), the support (D) being provided on the first face with a slit which is completely transparent to X-rays and which is configured to generate an X-ray flow when the collimator is exposed to an X-ray source, the slit extending longitudinally in the main plane of the support along an axis located at a non-zero distance (d) from the axis of rotation (Δ), the slit extending through the entire thickness of the support.

A chopper wheel assembly includes a collimator configured to narrow an x-ray beam, a chopper wheel has a planar surface configured to face in a direction of the collimator and a housing configured to receive the chopper wheel. The chopper wheel includes a central axis, a plurality of slits in the planar surface, a first projection extending from the planar surface in a direction of the collimator and a second projection extending from the planar surface in the direction of the collimator. The slits extend in radially-outward direction relative to the central axis. The first projection is located radially outward of the plurality of slits and the second projection is located radially inward of the plurality of slits. Each projection is provided for 360 degrees about the central axis. The housing includes an interior wall including a first groove configured to receive the first projection and a second groove configured to receive the second projection with the chopper wheel received within the housing.