A probe head of a three-dimensional coordinate measuring device according to an embodiment of the present invention includes a measurer, a first and second diaphragm, a first oscillator, and a second oscillator. The measurer extends in a first direction. The first and second diaphragms are provided at two different positions on the measurer, at a first position and a second position, respectively, and support the measurer such that the measurer is capable of displacement in a first direction. The first oscillator causes the measurer to oscillate along the first direction. The second oscillator causes a predetermined portion of the measurer between the first and second diaphragms to oscillate along each of a second direction orthogonal to the first direction, and a third direction orthogonal to both the first and second directions.

A method for configuring a device for non-destructive testing of a mechanical part, the device including an optical motion-tracking system, a non-destructive testing probe fixedly linked to a first rigid body, and a pointing device, includes steps of: learning of an origin and of axes of an examination area of the surface of the mechanical part using the pointing device, in a coordinate system linked to the optical motion-tracking system, so as to define a coordinate system linked to the examination area, learning of an origin and of axes of an emitter and receiver surface, called active surface, of the probe using the pointing device, in a coordinate system linked to the first rigid body of the probe, and determination of the position and of the orientation of the active surface of the probe, in the coordinate system linked to the examination area.

A method for configuring a device for non-destructive testing of a mechanical part, the device including an optical motion-tracking system, a non-destructive testing probe fixedly linked to a first rigid body, and a pointing device, includes steps of: learning of an origin and of axes of an examination area of the surface of the mechanical part using the pointing device, in a coordinate system linked to the optical motion-tracking system, so as to define a coordinate system linked to the examination area, learning of an origin and of axes of an emitter and receiver surface, called active surface, of the probe using the pointing device, in a coordinate system linked to the first rigid body of the probe, and determination of the position and of the orientation of the active surface of the probe, in the coordinate system linked to the examination area.

A measurement tool having a tip part consisting of polycrystalline diamond, in which the polycrystalline diamond contains at least one of dispersed nitrogen, boron, and phosphorus, the tool includes a shank part, and the tip part is provided at an end portion of the shank part.

A measurement tool having a tip part consisting of polycrystalline diamond, in which the polycrystalline diamond contains at least one of dispersed nitrogen, boron, and phosphorus, the tool includes a shank part, and the tip part is provided at an end portion of the shank part.

A shape measurement device includes a stylus configured to contact an object to be measured; a measurement arm that supports the stylus to allow the stylus to contact the object to be measured; a measurement arm part that supports the measurement arm; and a measurement arm support that supports the measurement arm part to allow the stylus to move along an outer shape of the object to be measured. The measurement arm support includes a support body provided with a movement rail formed on a top surface thereof. A body coupling block is coupled to the movement rail to move along the movement rail and is detachably coupled to the measurement arm part. The measurement arm portion includes a body provided with a block accommodation groove to accommodate the body coupling block and a position-fixing member coupled to a lower surface of the body defining the block accommodation groove.

A shape measurement device includes a stylus configured to contact an object to be measured; a measurement arm that supports the stylus to allow the stylus to contact the object to be measured; a measurement arm part that supports the measurement arm; and a measurement arm support that supports the measurement arm part to allow the stylus to move along an outer shape of the object to be measured. The measurement arm support includes a support body provided with a movement rail formed on a top surface thereof. A body coupling block is coupled to the movement rail to move along the movement rail and is detachably coupled to the measurement arm part. The measurement arm portion includes a body provided with a block accommodation groove to accommodate the body coupling block and a position-fixing member coupled to a lower surface of the body defining the block accommodation groove.

An inductive position detection configuration for stylus position measurement in a scanning probe comprises a stylus position detection portion arranged along a central axis in the probe. The stylus position detection portion includes a field generating coil configuration and top and bottom axial and rotary sensing coil configurations. The field generating coil configuration generates a changing magnetic flux, and coil signals indicate conductive disruptor element and/or stylus positions. A field generating coil coupling and crosstalk reducing configuration couples signal processing and control circuitry to the field generating coil configuration to provide a coil drive signal, and is configured to reduce crosstalk that would otherwise occur if the field generating coil configuration were directly connected to the signal processing and control circuitry without the field generating coil coupling and crosstalk reducing configuration.

A modular configuration for a scanning probe for a coordinate measuring machine include a stylus suspension module, a stylus position detection module, and a signal processing and control circuitry module. The stylus position detection module is configured to be assembled separately from the stylus suspension module before mounting to the stylus suspension module. The signal processing and control circuitry module is configured to be assembled separately from the stylus position detection module and the stylus suspension module before rigidly coupling to the stylus position detection module as part of assembling the scanning probe.

A modular configuration for a scanning probe for a coordinate measuring machine include a stylus suspension module, a stylus position detection module, and a signal processing and control circuitry module. The stylus position detection module is configured to be assembled separately from the stylus suspension module before mounting to the stylus suspension module. The signal processing and control circuitry module is configured to be assembled separately from the stylus position detection module and the stylus suspension module before rigidly coupling to the stylus position detection module as part of assembling the scanning probe.