In a general aspect, a photonic quantum network is disclosed. In some implementations, microwave modes and optical modes are generated on first and second quantum processing units (QPUs) by operation of a first transducer device of the first QPU and a second transducer device of the second QPU. The microwave modes are transmitted within the first and second QPUs from the first and second transducer devices to respective first and second qubit devices. The optical modes are transmitted from the first and second QPUs to an interferometer device. By operation of the interferometer device, output signals are generated on respective output channels based on the optical modes from the first and second QPUs. Based on the output signals detected by operation of photodetector devices coupled to the respective output channels, quantum entanglement transferred to the first and second qubit devices by the microwave modes is identified.

An interferometer and an imager may include a tunable light source, a beam splitter, a digital imager, and a processor system. The tunable light source may be configured to emit a beam. The beam splitter may be configured to direct the beam toward a sample with a floor surface and a raised surface feature. The digital imager may be configured to receive a reflected beam and to generate an image based on the reflected beam. The reflected beam may be a coherent addition of a first reflection of the beam off a reference plate and a second reflection of the beam off the raised surface feature and third reflection of the beam off the floor surface. The processor system may be coupled to the digital imager and may be configured to determine a distance between the reference surface and the feature surface based on the image. A second digital imager may also be configured to receive a reflected beam and scattered beam to generate a two-dimensional grayscale image of the surface based on these beams and may also be configured to receive fluorescent light generated by the incident light to generate a two-dimensional gray scale an image of the surface based on fluorescent emission.

An interferometer and an imager may include a tunable light source, a beam splitter, a digital imager, and a processor system. The tunable light source may be configured to emit a beam. The beam splitter may be configured to direct the beam toward a sample with a floor surface and a raised surface feature. The digital imager may be configured to receive a reflected beam and to generate an image based on the reflected beam. The reflected beam may be a coherent addition of a first reflection of the beam off a reference plate and a second reflection of the beam off the raised surface feature and third reflection of the beam off the floor surface. The processor system may be coupled to the digital imager and may be configured to determine a distance between the reference surface and the feature surface based on the image. A second digital imager may also be configured to receive a reflected beam and scattered beam to generate a two-dimensional grayscale image of the surface based on these beams and may also be configured to receive fluorescent light generated by the incident light to generate a two-dimensional gray scale an image of the surface based on fluorescent emission.

A multimodality system includes first and second modalities, a catheter, and a processor. The catheter collects fluorescent light from a plurality of locations of a sample which has been irradiated with excitation light of the second modality; a detector detects intensity of the fluorescent light received from the plurality of locations as a function of an angle α formed between the normal to the sample surface and the optical axis of the excitation light. A processor calculates the angle α at each of the plurality of locations based on radiation of the first modality incident on the sample, and corrects the intensity of the detected fluorescent light using a calibration factor g(α). The calibration factor g(α) is a function of the angle α calculated at two or more of the plurality of locations. The angle α is composed of a transversal angle α.sub.t and an axial angle α.sub.a.

Defects are detected using data acquired from an interference channel and a polarization modification channel in an interferometer. The interference objective splits a polarized illumination beam into a reference illumination that is reflected by a reference surface without modification to the polarization, and a sample beam that is reflected by a sample surface, that may modify the polarization. Light from the sample beam with no change in polarization is combined with the reference illumination and directed to the interference channel, which may measure the reflectivity and/or topography of the sample. Light from the sample beam with modified polarization is directed to the polarization modification channel. The intensity of the light detected at the polarization modification channel may be used, along with the reflectivity and topography data to identify defects or other characteristics of the sample.

Methods for performing imaging reflectometry measurements include determining a representative reflectance intensity value using multiple images of a measurement area that includes a particular structure and/or using a plurality of pixels each associated with the particular structure within the measurement area. A parameter associated with the particular structure is determined using the representative reflectance intensity value.

An interferometer detection system, including a beam splitter receiving a collimated light signal and splitting the signal into a first light signal and a second light signal. The system includes a first mirror receiving and reflecting the first light signal along a first path. The system includes a second mirror receiving and reflecting the second light signal along a second path via a transparent material. The system includes a 2D photosensor array configured to receive from the beam splitter the reflected first light signal merged with the reflected second light signal double passing through the transparent material and configured to generate an interference fringe pattern. A non-sinusoidal interference fringe pattern indicates geometrical variation between a wavefront of the reflected first light signal along the first path and a wavefront of the reflected second light signal double passing through the transparent material along the second path.

The present disclosure provides a compressed ultrafast imaging velocity interferometer system for any reflector, comprising a light source and target system, an etalon interference system, a compressed ultrafast imaging system, a timing control system and a data processing system. An imaging device in the traditional imaging velocity interferometer system for any reflector is replaced by a compressed ultrafast imaging system, a compressed ultrafast Photography (CUP) is introduced in an imaging process, multi-frame images, i.e. three-dimensional images for two-dimensional space and one-dimensional time, are reconstructed via a single measurement by a CUP-VISAR two-dimensional ultrafast dynamic image imaging, a complete dynamic process of a two-dimensional interference fringes image is restored, and spatiotemporal evolution information of a shock wave is effectively acquired, improving an imaging performance of the imaging velocity interferometer system for any reflector in dimension, and achieving a goal that could not be achieved before.

An image acquisition apparatus includes a light source configured to emit light, a dividing unit configured to divide the light from the light source into reference light and measurement light, an image forming unit configured to form a tomographic image of a subject based on interfered light in which return light from the subject irradiated with the measurement light and the reference light are interfered, a focus adjusting unit configured to adjust a focus of the measurement light, an optical-path-length adjusting unit configured to adjust an optical path length of the reference light, and a control unit configured to adjust the optical path length of the reference light by controlling the optical-path-length adjusting unit according a change in an optical path length of the measurement light caused by adjustment of the focus using the focus adjusting unit.

The invention relates to a measurement system for optically measuring an object, comprising a dental camera and an optical attachment. In this case the optical attachment comprises at least one lens, which is shaped and arranged in such a way that the optical attachment has a negative focal length so that a measurement field or a measurement volume of the dental camera is enlarged by the optical attachment.