Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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11/00
Measuring arrangements characterised by the use of optical techniques
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G01B11/02
for measuring length, width or thickness
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G01B11/06
for measuring thickness; ; e.g. of sheet material
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G01B11/0683
measurement during deposition or removal of the layer
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