A hybrid light measurement method for measuring a three-dimensional profile comprises: Step 1 using a MEMS laser projector to realize projection of a laser stripe and a fringe pattern: and Step 2 performing matching to obtain a parallax, and incorporating a binocular stereo vision to perform reconstruction. The present disclosure employs MEMS projection technology to realize a hybrid measurement system capable of performing laser stripe measurement and fringe pattern measurement, thereby realizing quick measurement of three-dimensional profiles of objects having different surface properties. The present disclosure enables laser stripe measurement and fringe pattern measurement to be performed by the same measurement system without needing any additional hardware equipment. The projection device used in the present disclosure enables projection of multiple laser stripes, thereby increasing measurement precision and speed.

A three-dimensional shape measurement device includes a controller, in which the controller starts a process in which a plurality of different phase pattern images is projected by a projector, whenever the phase pattern image is projected by the projector before a rising time elapses, the rising time being a time until the luminance of light does not temporally change after a light source of the projector applies the light, and measures a three-dimensional shape of a target object onto which the phase pattern image is projected on the basis of a captured image obtained by the camera after the process is performed.

Provided are a signal source space sensing method and apparatus, and an active sensing system. The method includes: a controller controls a signal transmitter to transmit a first signal to an object to be tested; the controller controls a signal receiver to receive a second signal, which is obtained after the first signal is transmitted by the object; the controller determines a coordinate relationship between the spatial position of said object and a signal source space according to the first signal and the second signal, wherein the signal source space is a coordinate space where the first signal transmitted by the signal transmitter is located; and the controller maps the second signal back to the signal source space according to the coordinate relationship between the spatial position of the object and the signal source space, to obtain a signal source space signal so as to reconstruct a sensing signal.

An inspection apparatus for inspecting the appearance of an inspection target object is provided. The inspection apparatus according to one embodiment of the present disclosure includes a support part configured to hold an inspection target object such that a side surface of the inspection target object faces a predetermined direction, a light source configured to irradiate light toward the inspection target object, a diffusion reflector configured to diffusely reflect at least a part of the irradiated light to irradiate the reflected light to the side surface of the inspection target object, and at least one inspection part configured to inspect the inspection target object by receiving the light reflected from the inspection target object and the diffusion reflector.

A non-transitory computer-readable storage medium stores a projection adjustment program which, when executed by a processor, causes a computer to execute a process relating to adjustment of projection operations of projection devices configured to perform position measurement and projection on a target object in a projection system including the projection devices. The process includes: causing a first projection device to project invisible measurement light onto the target object; causing a second projection device to receive reflection light reflected from the target object; judging a connection relationship of a projection range of the first projection device on the basis of the received reflection light; executing a process of the judging of the connection relationship on all processing target projection devices; and generating projection position information indicating a connection relationship between projection ranges of the respective projection devices and displaying the projection position information on a display unit.

A system for determining the surface structure of an object, the system comprising a first assembly including an illumination source, and a binary mask to generate a binary pattern, the binary mask disposed between the illumination source and a defocusing element to modify the binary pattern to provide a continuously modulated fringe pattern to illuminate the surface of the object.

A system and method for metrology and profilometry using a light field generator are disclosed. For this purpose, a system such as an optical analysis system scans a sample using light, and detects light reflected off a sample in various ways. The system operates different operational modes including a backscatter intensity, a triangulation, and an interferometric mode. For this purpose, the optical analysis system includes one or more optical angle modulation systems, such as surface acoustic wave (SAW) modulators, that emit light, a sample holder, and a scanning system that scans the one or more SAW modulators relative to the sample holder. The system performs tomographic reconstructions of information generated by the scans to create 3D maps/volume datasets of the sample.

A switchable fringe pattern illuminator includes an optical path switch configured to receive light and dynamically control an amount of light that is provided to a first waveguide and an amount of light that is provided to a second waveguide. A first projector configured to generate a first fringe pattern using light from the first waveguide. The first fringe pattern illuminates a first portion of a target area. A second projector configured to generate a second fringe pattern using light from the second waveguide. The second fringe pattern illuminates a second portion of a target area. The illuminator may be part of a depth camera assembly (DCA). The DCA is configured to capture images of a portion of the target area. The DCA is further configured to determine depth information for an object in the target area based in part on the captured images.

An estimation method includes projecting a pattern image onto an object via a zoom lens, generating imaging data by capturing the pattern image on the object, estimating, based on the imaging data, a position of a principal point of the zoom lens during the projection of the pattern image, and estimating, based on a first characteristic value representing a characteristic of the zoom lens at time when the principal point of the zoom lens is present in a first position and a second characteristic value representing a characteristic of the zoom lens at time when the principal point of the zoom lens is present in a second position, a characteristic value representing a characteristic of the zoom lens at time when the principal point of the zoom lens is present in the estimated position.

The present disclosure is directed to a system and a method for compensating non-linear response characteristics in measuring the shape of an object using phase-shifting deflectometry. More particularly, the present disclosure is directed to a method for compensating non-linear response characteristics in phase-shifting deflectometry including steps of: generating a pattern by a pattern generating portion and projecting the same to a measurement object; obtaining an image of a deformed pattern reflected from the measurement object by a detector; linearizing non-linear responses on the basis of a look up table considering non-linear response characteristics of the pattern generating portion and the detector by a compensation means; and compensating phase-shifting amounts generated due to non-linear response characteristics by the compensation means.