A projection adjustment program which causes a computer to execute a process relating to adjustment of projection operations of a plurality of projection devices configured to perform position measurement and projection on a target object in a projection system including the plurality of projection devices. The process includes: causing a projection device to project measurement light onto the target object; causing an image capture device to receive reflection light of the measurement light, the reflection light being reflected from the target object; judging a connection relationship of a projection range of the projection device on a basis of the received reflection light of the measurement light; executing a process of the judging of the connection relationship on all processing target projection devices; generating projection position information indicating a connection relationship between projection ranges of the respective projection devices of the projection system; and displaying the generated projection position information on a display.

The present invention provides a measuring apparatus for measuring a shape of an object to be measured, comprising an emitting unit configured to emit pattern light, an optical system configured to guide the pattern light emitted from the emitting unit to the object, a deflection unit arranged between the optical system and the object and configured to deflect the pattern light emitted from the optical system, an image sensing unit configured to capture the object via the optical system and the deflection unit, and a processing unit configured to determine the shape of the object based on an image of the object captured by the image sensing unit, wherein the deflection unit comprises a diffraction grating configured to diffract the pattern light emitted from the optical system.

The present disclosure is directed to a system and a method for compensating non-linear response characteristics in measuring the shape of an object using phase-shifting deflectomerty. More particularly, the present disclosure is directed to a method for compensating non-linear response characteristics in phase-shifting deflectometry including steps of: generating a pattern by a pattern generating portion and projecting the same to a measurement object; obtaining an image of a deformed pattern reflected from the measurement object by a detector; linearizing non-linear responses on the basis of a look up table considering non-linear response characteristics of the pattern generating portion and the detector by a compensation means; and compensating phase-shifting amounts generated due to non-linear response characteristics by the compensation means.

To obtain a three-dimensional virtual reconstruction of a workpiece the workpiece is positioned on a display screen between the display screen and at least one imager wherein the imager acquires multiple images of the workpiece while (a) multiple light stripes are displayed and swept in a first directional orientation across the display screen, (b) multiple light stripes are displayed and swept in at least one second directional orientation across the display screen, and (c) multiple images for each position of the multiple light stripes at different exposure times are captured. From the multiple images, a difference caused by the workpiece in a width and a profile of the multiple light stripes is determined. That difference is used to calculate a depth value (z) of the workpiece at each imager pixel position (x, y). The calculated depth value is used to reconstruct a surface shape of the workpiece. In embodiments, the described transmittance light capture analyses are supplemented with reflectance light capture analyses.

A phase-error compensation method and device, comprising: utilizing a phase-shifting-profilometry measuring system to obtain fringe sequence charts; based on Hilbert transform, transforming the fringe sequence charts from a space domain to a Hilbert transform domain; based on least squares phase shift method, solving the phases of the fringe sequence charts in the space domain and the Hilbert transform domain respectively, and obtaining a phase chart in the space domain and a phase chart in the Hilbert transform domain; averaging the phase chart in the space domain and the phase chart in the Hilbert transform domain to obtain an average phase, and utilizing the average phase to perform phase-error compensation. The invention possesses a self-compensation mechanism, does not need any auxiliary condition, and thus meets the requirements of high-speed, high-precision and high-universality 3D digital imaging and measuring based on the phase shifting profilometry.

In a method of operating a dimensioning system with a plurality of laser scanners, a processor controls the operations of the scanners and processes the scanner signals, and further with memory for storing data delivered by the processor, the data acquired by the dimensioning system in its regular mode of operation are used to construct a three-dimensional model of surface points of the object including spatial coordinates and image intensity for each surface point. The three-dimensional model is stored in the memory. Based on the three-dimensional model, two-dimensional images from any desired viewing angle that was exposed to the scanner rays can be produced on demand to document the appearance of the object at the time the scan was taken.

A shape measuring apparatus applies, to a light beam, a periodic pattern having periodicity in a direction perpendicular to an optical axis and displaceable in the direction perpendicular to the optical axis, relatively displaces a focal point of an objective lens in a direction parallel to the optical axis, and calculates, based on amplitude of intensity of the light beam detected by a photodetector, face shape data on the object to be measured. Then, a top surface measuring step of acquiring face shape data on a top surface of the object to be measured, and a bottom surface measuring step of acquiring face shape data on a bottom surface of the object to be measured by transmitting through the top surface of the object to be measured and aligning the focal point of the objective lens on the bottom surface of the object to be measured are performed.

A three-dimension measurement device includes a moving device, a projecting device, a surface-type image-capturing device and a processing device. The moving device carries an object, and moves the object to a plurality of positions. The projecting device generates a first light to the object. The surface-type image-capturing device senses a second light generated by the object in response to the first light to generate a phase image on each of the positions. The processing device is coupled to the surface-type image-capturing device and receives the phase images. The processing device performs a region-of-interest (ROI) operation for the phase images to generate a plurality of ROI images. The processing device performs a multi-step phase-shifting operation for the ROI images to calculate the surface height distribution of the object.

Dynamic digital fringe projection (DDFP) techniques for measuring warpage. The DDFP technique generates a dynamic fringe pattern, in which a proper fringe intensity distribution is dynamically determined based on the surface reflectance of an unpainted sample in order to obtain better fringe image contrasts. The DDFP technique includes the automatic segmentation method to segment the chip package and PWB regions in an unpainted PWB assembly PWBA image. It also includes calibration methods to compensate the mismatches in coordinates and intensities between the projected and captured images.

An apparatus (100) for use in a device for generating a three-dimensional (3D) representation of a scene. The apparatus (100) comprises an emitter module (104) having an emitter for emitting a plurality of waves in a predetermined pattern, wherein the pattern has a primary axis. The apparatus (100) further comprises a static portion and a movable portion (116). The movable portion (116) is configured to allow the emitter module (104) to emit the predetermined pattern in a plurality of different arrangements depending on the position and/or orientation of the movable portion (116). A mechanical element (150) of the apparatus (100) constrains movement of the movable portion (116) so as to provide a predictable orientation of the primary axis relative to the static portion in one or more of the different arrangements.