G01J1/0414

On-board light source calibration
11297255 · 2022-04-05 · ·

An example method includes recording dark images on an image sensor on-board an orbital vehicle during flight, which include a first image recorded before the orbital vehicle is over a predefined location on the Earth and a second image recorded after the orbital vehicle is over the predefined location; and recording third and fourth images on the image sensor during flight based on illumination from a light source that is on-board, with the third image being recorded before the orbital vehicle is over the predefined location and the fourth image being recorded after the orbital vehicle is over the predefined location. A fifth image is recorded on the image sensor during flight while the predefined location on the Earth is visible to the image sensor. The fifth image is based on light from a ground-based calibration system. The light source is calibrated during flight based on the five images.

Light-emitting device
11835380 · 2023-12-05 · ·

A light-emitting device includes a plurality of light-emitting elements, a photodetector, an optical member and a bonding portion. The light-emitting elements include a first light-emitting element configured to emit first light and a second light-emitting element configured to emit second light. The photodetector is configured to receive a part of light emitted from each of the light-emitting elements. The photodetector has a first bonding surface. The optical member has a second bonding surface and a first inner side surface. The first inner side surface is continuous from the second bonding surface. The light emitted from each of the plurality of light-emitting elements is configured to pass through the optical member. The bonding portion bonds the photodetector and the optical member with the bonding portion being in contact with the first bonding surface, the second bonding surface, and at least a part of the first inner side surface.

Electromagnetic wave detection apparatus, program, and information acquisition system

An electromagnetic wave detection apparatus (10) includes a switch (16), a first detector (19), and a second detector (20). The switch (16) includes an action surface (as) with a plurality of pixels (px) disposed thereon. The switch (16) is configured to switch each pixel (px) between the first state and the second state. In the first state, the pixels (px) cause electromagnetic waves incident on the action surface (as) to travel in a first direction (d1). In the second state, the pixels (px) cause the electromagnetic waves incident on the action surface (as) to travel in a second direction (d2). The first detector (19) detects the electromagnetic waves that travel in the first direction (d1). The second detector (20) detects the electromagnetic waves that travel in the second direction (d2).

SYSTEMS AND METHODS FOR RECORDING SIMULTANEOUSLY VISIBLE LIGHT IMAGE AND INFRARED LIGHT IMAGE FROM FLUOROPHORES
20220067934 · 2022-03-03 ·

The invention provides systems and methods for imaging a sample. In various embodiments, the invention provides a system comprising an image sensor, a laser for emitting excitation light for an infrared or near-infrared fluorophore, a visible light source, a notch beam splitter, a notch filter, a synchronization module, an image processing unit, an image displaying unit, and light-conducting channels. In various embodiments, the present invention provides a system comprising an image sensor, a laser for emitting excitation light for an infrared or near-infrared fluorophore, a laser clean-up filter, a notch filter, a white light source, an image processing unit, an image displaying unit, and light-conducting channels. In accordance with the present invention, the image sensor can detect both visible light and infrared light.

LASER ENERGY MEASURING DEVICE, AND LASER ENERGY MEASURING METHOD
20210310862 · 2021-10-07 ·

A laser energy measuring device with which laser light radiated onto a substrate can be evaluated accurately. The laser energy measuring device includes: inside or outside an illuminating optical system, a first beam splitter which reflects laser light by any one of P-polarized reflection and S-polarized reflection; a second beam splitter which performs the other of P-polarized reflection and S-polarized reflection with respect to first reflected light reflected by the first beam splitter; a first measuring unit which measures energy of second reflected light reflected by the second beam splitter; and a second measuring unit which measures energy of transmitted light that has been transmitted through the second beam splitter.

Light Detection using an Aperture
20210255033 · 2021-08-19 ·

The present disclosure relates to limitation of noise on light detectors using an aperture. One example implementation includes a system. The system includes a lens disposed relative to a scene. The lens focuses light from the scene. The system also includes an aperture defined within an opaque material. The system also includes a waveguide having a first side that receives light focused by the lens and transmitted through the aperture. The waveguide guides the received light toward a second side of the waveguide opposite to the first side. The waveguide has a third side extending between the first side and the second side. The system also includes an array of light detectors that intercepts and detects light propagating out of the third side of the waveguide.

Adaptive Laser Beam Shaping

A method for adaptively splitting a coherent primary light beam, comprising producing a desired far-field distribution by phase modulating the primary light beam with a Spatial Light Modulator (SLM), the primary coherent light beam being directed to reflect on a display element of the spatial light modulator, thereby avoiding any moving elements to shape the primary coherent light beam, extracting from the primary light beam, after it has passed the spatial light modulator, a monitoring beam and a main beam, measuring the monitoring beam with a camera, directing the desired far-field distribution in the monitoring beam on a sensor surface of the camera. In a first option, the method comprises guiding the primary beam through a first focusing element (L1) that is configured to focus the far-field distribution onto a focusing plane of the first focusing element as a real output distribution, and focusing the far-field distribution in the monitoring beam onto the sensor surface of the camera by means of the first focusing element. In a second option, the method comprises guiding the monitoring beam through a second focusing element (L2) that is configured to focus the far-field distribution on the sensor surface of the camera. For either the first or the second option, the method further comprises adjusting a dynamic range of the camera using a variable intensity regulator to control the intensity of the incoming monitoring beam as a function of the far-field distribution, and configuring a closed loop to enable a phase calculation for the display element of the spatial light modulator, whereby an output signal from the camera is input into the closed loop for a plurality of iterations of a phase-calculation algorithm performed by a controller, wherein in the first option, the first focusing element is used, excluding the second focusing element, and in the second option, the second focusing element is used, excluding the first focusing element.

Optical detection system with light sampling
11067433 · 2021-07-20 · ·

System, including methods and apparatus, for optical detection. The system may comprise a light source to generate a beam of light, an optical element including a light guide and an exit window, and at least one detector.

Photo-detection system comprising photo-detection apparatus including light-shielding film, optically-coupled layer, and photodetector and arithmetic circuit

A photo-detection system includes: a photo-detection apparatus including a light-shielding film, an optically-coupled layer, and a photodetector including first and second photo-detection cells; and an arithmetic circuit that generates, based on first signals and second signals, third signals each representing coherence of light having entered a position of each of the first and second photo-detection cells and generates at least one selected from the group consisting of an average value of the third signals, a standard deviation of the third signals, a ratio between the standard deviation and the average value, and a ratio between an average value of a first portion of the third signals based on light having entered the positions of the first photo-detection cells and an average value of a second portion of the third signals based on light having entered the positions of the second photo-detection cells.

Laser beam profile measurement device
11067438 · 2021-07-20 · ·

A laser beam profile measurement device includes: a plate-like or block-like fluorescence generation element including an incidence surface on which a laser light is incident and an emission surface from which the laser light is emitted; a light separation element for separating fluorescence from the laser light, the fluorescence generated in the fluorescence generation element and emitted from the emission surface; and an image element for receiving the fluorescence. The fluorescence generation element includes a first film formed on the incidence surface thereof. The first film has a wavelength-to-reflectance characteristic of transmitting a wavelength λ1 of the laser light and reflecting a wavelength λ2 of the fluorescence. The first film has a wavelength-to-reflectance characteristic of transmitting a wavelength λ1 of the laser light and reflecting a wavelength λ2 of the fluorescence. The light separation element may include a second film having a wavelength-to-reflectance characteristic of transmitting the wavelength λ2 and reflecting the wavelength λ1 or a third film having a wavelength-to-reflectance characteristic of reflecting the wavelength λ2 and transmitting the wavelength λ1. The first film may further have a wavelength-to-reflectance characteristic of reflecting a wavelength λ0 between the wavelength λ1 and the wavelength λ2, while the second film may further have a wavelength-to-reflectance characteristic of reflecting the wavelength λ0. Alternatively, the first film may further have the wavelength-to-reflectance characteristic of reflecting the wavelength λ0 between the wavelength λ1 and the wavelength λ2, while the third film may further have a wavelength-to-reflectance characteristic of transmitting the wavelength λ0.