Improved wafer-scale testing of optoelectronic devices, such as CMOS image scan devices, is provided. A probe card includes an LED light source corresponding to each device under test in the wafer. The LED light sources provide light from a phosphor illuminated by the LED. A pinhole and lens arrangement is used to collimate the light provided to the devices under test. Uniformity of illumination can be provided by closed loop control of the LED light sources using internal optical signals as feedback signals, in combination with calibration data relating the optical signal values to emitted optical intensity. Uniformity of illumination can be further improved by providing a neutral density filter for each LED light source to improve uniformity from one source to another and/or to improve uniformity of the radiation pattern from each LED light source.

Provided is a photodetection apparatus which includes a mounting board, and an optical sensor device that includes a first surface on the mounting board side and a second surface on a side opposite to the mounting board, and is mounted on the mounting board. The optical sensor device includes an optical sensor that includes a light receiving surface on the second surface side, a signal processing circuit that is electrically connected to the optical sensor, and a lead frame that is provided on the second surface side with respect to the signal processing circuit, and shields a surface of the signal processing circuit on the second surface side. The mounting board has a conductive pattern that faces the signal processing circuit and shields a surface of the signal processing circuit on the first surface side.

An apparatus, method and system for resolving an n-number of photons from an optical source multiphoton event, the apparatus includes a cryostat includes a single-pixel superconducting nanowire single-photon detector (SNSPD) configured to receive an optical signal and therefrom produce a corresponding electrical signal, and a current bias source configured to supply a bias current to the SNSPD. The apparatus further includes a low-noise amplifier configured to produce a low-noise amplified electrical signal from the electrical signal, a signal processing circuit configured to receive the low-noise amplified electrical signal having a waveform rising edge of an n-number photon event to produce either a time-differentiated electrical signal by processing the waveform rising edge with a differentiating circuit to generate a differentiated peak corresponding to the n-number photon event, or a time-to-amplitude electrical signal by processing the waveform rising edge with a precision timing circuit to generate a rise time measurement corresponding to the n-number photon event. The apparatus further includes an amplitude discriminating device configured to determine an integer n-number photon event based on measuring a value of the n-number photon event.

An electronic device may have a display with a cover layer. An ambient light sensor may be aligned with an ambient light sensor window formed from an opening in a masking layer on the cover layer in an inactive portion of the display. To help mask the ambient light sensor window from view, the ambient light sensor window may be provided with a black coating that matches the appearance of surrounding masking layer material while allowing light to reach the ambient light sensor. The black coating may be formed from a black physical vapor deposition thin-film inorganic layer with a high index of refraction. An antireflection layer formed from a stack of dielectric layers may be interposed between the black thin-film inorganic layer and the display cover layer.

A combination sensor may include a first infrared light sensor and a second infrared light sensor. The first infrared light sensor may be configured to sense light in a first wavelength within an infrared wavelength spectrum. The second infrared light sensor may be configured to sense light in a second wavelength that is different from the first wavelength within the infrared wavelength spectrum. The first infrared light sensor and the second infrared light sensor may be stacked in relation to each other.

A display screen includes a first glass substrate including a color filter region and a light shielding region. The light shielding region includes a transparent region at a first position of the light shielding region. The display screen further includes a second glass substrate including a display control circuit. The display control circuit controls display statuses of the color filter region. The display screen also includes a light intensity sensor at a second position of the second glass substrate. The first position and the second position satisfy a preset relative positional correspondence to allow light transmitted through the first position to reach the light intensity sensor.

An ambient light sensor system may be mounted in alignment with a window in a display cover layer associated with a display in an electronic device. The ambient light sensor system may have a light diffuser layer and an infrared-light-blocking filter. The light diffuser layer may have a polymer layer with embedded light-scattering desiccant particles. An ambient light sensor in the ambient light sensor system may receive ambient light through the light diffuser layer and the infrared-light-blocking filter. The infrared-light-blocking filter may have a polymer substrate and a thin-film interference filter formed from a stack of inorganic thin-film layers on the polymer substrate. Light-scattering desiccant particles may be incorporated into the polymer substrate of the infrared-light-blocking filter. Desiccant may also be incorporated into ambient light sensor support structures.

An integrated optical tap monitor takes the form of a highly-reflective outer coating disposed over the active region of an associated photodetector. The coating is of a material that allows for a majority of the impinging optical signal to be re-directed into an output path, while passing a small portion of the signal into the photodetector's active region for monitoring purposes. The integrated configuration is small enough to be housed within a standard TO can, and additional optical components (filters, attenuators, etc.) may be co-located with the integrated tap monitor. By virtue of incorporating the monitoring function with a reflective surface, the integrated tap monitor may be substituted for a turning mirror at any place along a signal path and provide the benefit of power monitoring while also performing signal re-direction.

A beam delivery system may include: beam adjusters configured to adjust a divergence angle of a pulse laser beam; a beam sampler configured to separate a part of the pulse laser beam outputted from a first beam adjuster provided at the most downstream among the beam adjusters to acquire a sample beam; a beam monitor configured to receive the sample beam and output a monitored diameter; and a beam delivery controller configured to control the beam adjusters based on the monitored diameter. The beam delivery controller may adjust each of beam adjusters other than the first beam adjuster selected one after another from the most upstream so that the monitored diameter at the beam monitor becomes a predetermined value specific to the beam adjuster, and adjust the first beam adjuster so that the pulse laser beam becomes focused at a position downstream of a target position.

This invention is directed to attenuating a beam output without changing the beam position and the beam diameter. A high-output optical attenuator includes a first reflector that totally reflects incident light and causes first reflected light serving as reflected light of the incident light to enter a second reflecting portion, a second reflector that reflects the first reflected light and causes second reflected light serving as reflected light of the first reflected light to enter a third reflecting portion, a third reflector that reflects the second reflected light and causes third reflected light serving as reflected light of the second reflected light to enter a fourth reflecting portion, and a fourth reflector that reflects the third reflected light as fourth reflected light having the same optical axis as the optical axis of the incident light. At least two of the second reflector, the third reflector, and the fourth reflector are half mirrors.