A light sensor includes a fixer tube, a sensor component, and holder. The sensor component is disposed at a bottom terminal of the fixer tube and fixed to the fixer tube. The sensor component senses incident lights. The holder is movably coupled to the fixer tube. The holder encompasses the sensor component. The holder further includes a first opening. The sensor component faces the first opening for receiving incident lights passing through the first opening. The holder further moves along an axis of the fixer tube for adjusting an incident light angle of the sensor component.

Imaging systems may include tunable polarization filters. A tunable polarization filter may be integrated directly into an image sensor package. For example, the tunable polarization filter may serve as cover glass for the image sensor package. Tunable polarization package glass may be incorporated into image sensor packages that have air gaps between the image sensor and the cover glass or that have transparent adhesive between the image sensor and the cover glass. The tunable polarization layer may be controlled at a global level, at a sub-array level, or at a pixel level. In some cases, the tunable polarization layer may be a tunable polarization filter. In this example, the direction of the polarization filter is tuned. In other cases, the tunable polarization layer may be a tunable polarization rotator. In this example, the tunable polarization layer selectively rotates the polarization of light that passes through the tunable polarization layer.

A light sensor includes a fixer tube, a sensor component, and holder. The sensor component is disposed at a bottom terminal of the fixer tube and fixed to the fixer tube. The sensor component senses incident lights. The holder is movably coupled to the fixer tube. The holder encompasses the sensor component. The holder further includes a first opening. The sensor component faces the first opening for receiving incident lights passing through the first opening. The holder further moves along an axis of the fixer tube for adjusting an incident light angle of the sensor component.

Herein disclosed is an optoelectronic unit measuring device comprising an objective lens, an imaging lens, a photographing lens, and a focus adjustment module disposed in a first light path. The objective lens receives a first testing light and converts the first testing into a second testing light. The imaging lens receives the second testing light and converts the second testing light into a third testing light. The photographing lens receives the third testing light and measures beam characteristic. The focus adjustment module selectively provides a first light transmitting member in the first light path, and adjusts the third testing light to focus at a first focus position or a second focus position. Wherein the focus adjustment module comprises a first carrier plate having a first area with the first light transmitting member, and moves the first carrier plate to selectively align the first area with the first light path.

An optical inspection system includes a brightness inspection module for inspecting the brightness of a light emitting element, an integrated inspection module for inspecting the near field optical characteristic and the beam quality factor of the light emitting element, and a far field inspection module for inspecting the far field optical characteristic of the light emitting element. As a result, the optical inspection system is space-saving and capable of reducing the distance and time of the movement of the device under test.

An apparatus comprises a transparent substrate (3), at least one sensor (5) for the detection of electromagnetic radiation (31), and for each sensor a corresponding mirror having a reflective surface (11). The reflective surface (11) is shaped so that electro-magnetic radiation (31) incident on the transparent substrate (3) at a specific angle, passing through the transparent substrate (3) and being reflected by the reflective surface (11) is directed towards the sensor (5). The sensor (5) comprises a two dimensional material like graphene and may be a quantum dot functionalised graphene field effect transistor. The present invention enables the incident electromagnetic radiation (31) to be focussed onto the at least one sensor (5) without the use of additional optical components like lenses or microlenses. This may enable focussed images to be obtained by the apparatus.

Apparatus and associated methods relate to creating corrected images of a scene for a terminal-imaging seeker using an electrically-controllable coded-aperture mask pattern embodied in a programmable spatial light modulator. The coded-aperture mask pattern includes a plurality of pinhole-like apertures, each of which is configured to perform pinhole-like lensing of the scene. The plurality of pinhole-like apertures form a multiplex of overlapping images on a focal plane array aligned with the optical axis. An image processor reconstructs, based on a configuration of the plurality of pinhole-like apertures and the multiplex of overlapping images, a single image of the scene.

A LIDAR system includes a plurality of lasers that generate an optical beam having a FOV. A plurality of detectors are positioned where a FOV of at least one of the plurality of optical beams generated by the plurality of lasers overlaps a FOV of at least two of the plurality of detectors. The lens system collimates and projects the optical beams generated by the plurality of lasers. An actuator is coupled to at least one of the plurality of lasers and the lens system to cause relative motion between the plurality of lasers and the lens system in a direction that is orthogonal to an optical axis of the lens system so as to cause relative motion between the FOVs of the optical beams generated by the plurality of lasers and the FOVs of the detectors.

An imaging system includes: an image sensor sensitive to ultraviolet light and visible light; a lens configured to focus light from a subject onto the image sensor; and an image processor configured to process image signals output from the image sensor. The image processor obtains the difference between image signals A1 and A2 output from the image sensor at times t1 and t2, respectively. If the differential signal A3 is greater than or equal to a predetermined value, the image processor determines that light from the subject contains the ultraviolet light, and generates an image signal CI based on the differential signal A3.

A laser machining method includes, before laser machining: calculating the amount of focus movement on the basis of a first measurement value measured with the external optical system warmed up and being the amount of energy of a laser beam passing through a small-diameter hole and a first reference value (database D1) predetermined depending on the type of contamination of the external optical system in relation to the first measurement value; and compensating the focus position in laser machining on the basis of the calculated amount of focus movement.