The present disclosure relates to limitation of noise on light detectors using an aperture. One example embodiment includes a system. The system includes a lens disposed relative to a scene and configured to focus light from the scene onto a focal plane. The system also includes an aperture defined within an opaque material disposed at the focal plane of the lens. The aperture has a cross-sectional area. In addition, the system includes an array of light detectors disposed on a side of the focal plane opposite the lens and configured to intercept and detect diverging light focused by the lens and transmitted through the aperture. A cross-sectional area of the array of light detectors that intercepts the diverging light is greater than the cross-sectional area of the aperture.

Target devices for characterizing terahertz imaging systems are provided. The target devices include a terahertz resolution pattern having spatially distributed resolution features and one or more prism assemblies configured to provide a variable contrast level within the resolution features when used with terahertz radiation. Each prism assembly includes first and second prisms arranged in a Frustrated Total Internal Reflection (FTIR) configuration.

The present disclosure relates to limitation of noise on light detectors using an aperture. One example embodiment includes a system. The system includes a lens disposed relative to a scene and configured to focus light from the scene onto a focal plane. The system also includes an aperture defined within an opaque material disposed at the focal plane of the lens. The aperture has a cross-sectional area. In addition, the system includes an array of light detectors disposed on a side of the focal plane opposite the lens and configured to intercept and detect diverging light focused by the lens and transmitted through the aperture. A cross-sectional area of the array of light detectors that intercepts the diverging light is greater than the cross-sectional area of the aperture.

An apparatus comprises a transparent substrate (3), at least one sensor (5) for the detection of electromagnetic radiation (31), and for each sensor a corresponding mirror having a reflective surface (11). The reflective surface (11) is shaped so that electro-magnetic radiation (31) incident on the transparent substrate (3) at a specific angle, passing through the transparent substrate (3) and being reflected by the reflective surface (11) is directed towards the sensor (5). The sensor (5) comprises a two dimensional material like graphene and may be a quantum dot functionalised graphene field effect transistor. The present invention enables the incident electromagnetic radiation (31) to be focussed onto the at least one sensor (5) without the use of additional optical components like lenses or microlenses. This may enable focussed images to be obtained by the apparatus.

An electronic device may be provided with a color ambient light sensor. The color ambient light sensor may be used to measure an ambient light spectrum over a wavelength range of interest. Control circuitry in the electronic device can take actions based on the measured ambient light spectrum such as adjusting the brightness and color cast of content on a display. A display may have a display cover layer. The color ambient light sensor can be mounted under the display cover layer and may receive ambient light through the display cover layer. The color ambient light sensor may have a tunable wavelength filter such as an electrically adjustable Fabry-Perot resonator. A light collimator may be interposed between the display cover layer and the Fabry-Perot resonator to collimate ambient light that is passed to the Fabry-Perot resonator. A light detector measures the light passing through the Fabry-Perot resonator.

A method and apparatus for protecting an optical sensor is disclosed. A fixed filter having a fixed passband for light transmission is placed in front of the optical sensor. A programmable filter having a variable passband for light transmission is placed in front of the fixed filter. A controllable voltage source controls a voltage at the programmable filter that shifts the passband of the programmable filter from a first state in which the passband of the programmable filter is substantially the same as the passband of the fixed filter and a second state in which the passband of the programmable filter is different than the passband of the fixed filter.

The present disclosure includes an optical assembly position adjustment device. An embodiment of the optical assembly position adjustment device includes a base and at least one housing. The base includes an upper side and a lateral side. The upper side allows the setting of at least one optoelectronic device, and the lateral includes a first position adjustment structure. The at least one housing includes an interior side including a second position adjustment structure. The second position adjustment structure matches the first position adjustment structure for combination. In addition, the at least one housing includes an optical input/output window for optical transmission. The distance between the optical input/output window and the upper side can be adjusted by the increase or decrease of a contact area between the first and second position adjustment structures.

A light sensor assembly includes a sensor connector having a housing including a top and a bottom with power contact channels in the bottom of the housing. The sensor connector includes a circuit board supported by the housing at the top having a sensor component electrically connected to the circuit board sensing an environmental characteristic exterior of the sensor connector. The sensor connector includes power contacts received in corresponding contact channels and extending from the bottom for electrical connection with receptacle power contacts of the receptacle connector. The power contacts include a neutral power contact, a line power contact and a load power contact, where the line power contact and the load power contact are integral as a unitary contact body forming a monolithic line-load power contact.

An optical filter including a base member having a layer containing near-infrared absorbing fine particles and a dielectric multilayer film, the optical filter satisfying a requirement that, in a wavelength range of 400 nm to 650 nm, an average of transmittance of any of light incident from a direction perpendicular to the optical filter, light obliquely incident at an angle of 30 degrees, and light obliquely incident at an angle of 60 degrees is 45% or higher and lower than 85%; and a requirement that, in a wavelength range of 800 nm to 1,200 nm, an average of optical density (OD value) of any of light incident from the direction perpendicular to the optical filter, light obliquely incident at an angle of 30 degrees with respect to the perpendicular direction, and light obliquely incident at an angle of 60 degrees with respect to the perpendicular direction is 1.7 or higher.

Apparatus for determining geometrical parameters of a laser beam includes an optical system, a device for output coupling radiation, a beam diagnostic device, and a reflector element. The optical system focuses the laser beam into a processing region. The device for output coupling radiation couples out radiation that runs through the optical system in a direction opposite to a direction of the laser beam. The reflector element has a first surface which is partially reflecting and curved, where the curvature is equal to a mean curvature of a wave front of the laser beam in a positioning region of the reflector element.