An electronic device including an optical component and an enclosure comprising a glass ceramic region is disclosed. The optical properties of the glass ceramic region and the positioning of the glass ceramic region with respect to the optical component can affect the performance of the optical component, the visual appearance of the optical component, or both.

A lens and an optical system device are provided which can measure optical characteristics of a light source or an optical element with a simple structure. A lens 1 has an optical axis, and includes an incident surface F and an emit surface B. The incident surface F and the emit surface B are formed so as to emit incident light to the incident surface F from a first position O at an irradiation angle θ relative to the optical axis from the emit surface B at an emit angle θ/m (where m>1) relative to the optical axis by refraction at the incident surface F and at the emit surface B, and formed in such a way that apparent positions of lights emitted from the emit surface B all begin from a second position P. Moreover, an optical system device includes the lens 1 and a diffuser panel that diffuses emitted light from the lens 1.

The invention relates to a method and an apparatus for the direct and precise measurement of the power and/or energy of a laser beam, which make a measurement possible even in areas close to the focus of a laser beam, A device is proposed for this purpose that contains a radiation sensor, an expansion device, and a support mount. The radiation sensor has a receiving surface and is configured for the generation of an electrical signal, which is dependent on the power of the laser beam or the energy of the laser beam. The expansion device and the radiation sensor are positioned on the support mount at a distance from one another. The expansion device is configured in such a way as to increase the angle range of the laser beam. The laser beam propagates to the radiation sensor with an increased angle range. A diameter of the laser beam propagated on the receiving surface is greater than a diameter of the laser beam in the area of the expansion device. The receiving surface of the radiation sensor encloses at least 90% of the cross-section surface of the laser beam propagated.

Instruments and methods are disclosed which measure absolute energy and irradiance of UV light sources. The response curves of exemplary optical stacks of the radiometry instruments are substantially rectangular with steep transitions at the cutoff frequencies. Angle of incidence (AOI) control in combination with one or more interference filters in the optical stack enable the full optical stack to produce repeatable and accurate measurements. Inverse response filters are disclosed for leveling optical stack response.

A detection system for light communications comprises a total internal reflection (TIR) waveguide and a light sensor adjacent to the TIR waveguide. The TIR waveguide comprises a TIR structure, a diffusive element, and a waveguide entrance. The TIR structure is configured to internally propagate light associated with optical signaling along the TIR waveguide. The diffusive element is disposed at an internal edge of the TIR structure opposite the light sensor. The diffusive element is configured to disrupt the propagation of the light such that at least some of the light is directed to the light sensor. The waveguide entrance is offset from the diffusive element along the TIR structure and configured to collect the light into the TIR structure.

A narrow band laser apparatus may include: a laser resonator; a pair of discharge electrodes; a power supply; a first wavelength measurement device configured to output a first measurement result; a second wavelength measurement device configured to output a second measurement result; and a control unit. The control unit calibrates the first measurement result, based on a difference between the second measurement result derived when the control unit controls the power supply to apply a pulsed voltage to the pair of discharge electrodes with a first repetition frequency and the second measurement result derived when the control unit controls the power supply to apply the pulsed voltage to the pair of discharge electrodes with a second repetition frequency, the second repetition frequency being higher than the first repetition frequency.

A pyranometer, comprises a thermal sensor, and a diffusing member positioned so as to be opposed to a receiving surface of the thermal sensor.

This is to provide a photometric apparatus improved in measurement precision by improving the state of light incident to a sensor, which photometric apparatus 1 comprises a photometric sensor 30 into which light which is an object to be measured is incident, a signal processing means for processing a sensor output by the photometric sensor, and optical systems 50, 100, 92, 93 and 150 which introduces external light into the photometric sensor, wherein a columnar fiber rod 100 in which a center axis is provided along a direction perpendicular to a light receiving surface of the photometric sensor is provided at a part of the optical system.

In an embodiment, an optoelectronic measuring device 1ncludes a first detector configured to provide a first detector signal, a second detector configured to provide a second detector signal, wherein each of the first detector and the second detector is configured to detect electromagnetic radiation, a signal difference determiner configured to generate a difference signal by subtracting the second detector signal from the first detector signal and a spectral filter arranged in a beam path upstream of the second detector, wherein the spectral filter is configured to filter the electromagnetic radiation before detection by the second detector, wherein the optoelectronic measuring device is configured to measure an intensity of the electromagnetic radiation impinging on the optoelectronic measuring device.

An optoelectronic sensor component for measuring light may include a first signal channel, a second signal channel, a first light-sensitive detection assembly, a second light-sensitive detection assembly, a further light-sensitive detection assembly, and an assigned further signal channel. The first signal channel may provide a first electrical signal, which represents the intensity of light incident on the sensor component. The second signal channel may provide a second electrical signal representing the intensity of the light incident on the sensor component. The first and second light-sensitive detection assemblies may generate the first and second electrical signals, respectively, and be assigned to the first and second signal channels, respectively. Both detection assemblies may have an identical spectral sensitivity and are thus redundant with respect to one another. The spectral sensitivity of both detection assemblies may have a photopic profile. The further light-sensitive detection assembly may be configured for detecting only infrared light.