An ion detection system comprising an upper plate configured for propagation of ions therethrough, a lower plate comprising a converter configured for converting ions impinging thereon to secondary electrons, a secondary electron multiplication assembly configured for receiving the secondary electrons and comprising at least one or optionally a series of oppositely facing pairs of dynodes, wherein in the optional series of oppositely facing pairs of dynodes, each pair is spaced apart from an adjacent pair, and wherein a first electric field is created in between the oppositely facing pair of dynodes. A magnetic system is provided for generating a magnetic field.

Systems and methods are disclosed for monitoring a laser system using detection of back reflection. In some embodiments, a laser system comprises a laser, at least one optical fiber, and a back-reflection monitoring sensor for detecting electromagnetic radiation reflected back from the optical fiber(s). The back-reflection monitoring sensor may be adapted to detect back-reflected electromagnetic radiation while the laser system is in use. The laser system may further comprise a computing system adapted to calculate an output power of the system based upon the back-reflected electromagnetic radiation. In some embodiments, a method of monitoring a laser system using detection of back reflection comprises transmitting electromagnetic radiation from a laser, receiving the electromagnetic radiation at one or more optical fibers, and detecting electromagnetic radiation that is back reflected at a back-reflection monitoring sensor.

A system and method. The system may include a head-up display (HUD). The HUD may include a positionable combiner optical element (COE) and a combiner alignment detector (CAD) configured to conform images displayed on the positionable COE with a view through the positionable COE. The CAD may include a mirror that moves with the positionable COE, an infrared (IR) emitter configured to emit IR pulses onto the mirror with a duty cycle of less than 1% such that an average time-based radiance of the IR pulses is compatible with a night vision imaging system (NVIS), and an IR detector configured to receive the IR pulses reflected off of the mirror.

A light-receiving element, comprising a plurality of photodiodes formed by stacking in this sequence, a lower reflection mirror, a resonator including a photoelectric conversion layer, and an upper reflection mirror on a semiconductor substrate, wherein the plurality of photodiodes share the semiconductor substrate and the lower reflection mirror, the plurality of photodiodes includes a first photodiode having a resonance wavelength λ1 and a second photodiode having a resonance wavelength λ2 that is larger than the resonance wavelength λ1, and a reflectance of the lower reflection mirror has a first peak corresponding to the resonance wavelength λ1 and a second peak corresponding to the resonance wavelength λ2.

An electronic device includes a photodiode, a switching circuit, a readout circuit, and an energy storage device. The photodiode includes a first terminal and a second terminal and is configured to generate a signal according to a light. The switching circuit is electrically connected to the first terminal and the second terminal. When the electronic device operates in a sensing mode, the switching circuit electrically isolates the photodiode from the energy storage device so that the signal is provided to the readout circuit. When the electronic device operates in a charging mode, the switching circuit electrically connects the photodiode to the energy storage device so that the signal is provided to the energy storage device.

A machine vision system can include an image sensor assembly including an image sensor, a lens assembly coupled to the image sensor assembly, an illumination assembly coupled to the lens assembly, and a removable front cover positioned in front of the illumination assembly. The illumination assembly can include a plurality of multispectral light assemblies. Each multispectral light assembly of the plurality of multispectral light assemblies can include a multispectral light source having a plurality of color LED dies configured to generate at least two different wavelengths of light, a light pipe positioned in front of the multispectral light source and having an exit surface, a diffusive surface on the exit surface of the light pipe, and a projection lens positioned in front of the diffusive surface. The machine vision system can also include an illumination sensor configured to detect light from the illumination assembly.

There is provided a circuit to improve the sensing efficiency of pixels that uses the induction effect of a capacitor to duplicate a voltage deviation caused by additional electrons and uses a circuit to cancel out the voltage deviation during reading pixel data thereby improving the sensing efficiency.

The present disclosure relates to an optical sensor, comprising: a first circuit board having at least a data processing unit and an interface to a second circuit board, wherein the interface is connected with the data processing unit; and the second circuit board having an LED, a thermistor and a capacitor, which is connected in parallel with the thermistor, wherein the capacitor is embodied specifically for the LED, and an interface to the first circuit board, wherein LED, thermistor and capacitor are connected with the interface. The present disclosure relates also to a method for identifying an LED in an optical sensor.

Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave light source) at a first intensity for a first predetermined time interval, irradiating the photodetector with the light source at a second intensity for a second predetermined time interval, integrating data signals from the photodetector over a period of time that includes the first predetermined interval and the second predetermined interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having light source and a photodetector for practicing the subject methods are also described. Non-transitory computer readable storage medium having instructions stored thereon for determining a parameter of a photodetector according to the subject methods are also provided.

Aspects of the present disclosure include methods for determining a parameter of a photodetector (e.g., a photodetector in a particle analyzer). Methods according to certain embodiments include irradiating a photodetector positioned in a particle analyzer with a light source (e.g., a continuous wave light source) at a first intensity for a first predetermined time interval, irradiating the photodetector with the light source at a second intensity for a second predetermined time interval, integrating data signals from the photodetector over a period of time that includes the first predetermined interval and the second predetermined interval and determining one or more parameters of the photodetector based on the integrated data signals. Systems (e.g., particle analyzers) having light source and a photodetector for practicing the subject methods are also described. Non-transitory computer readable storage medium having instructions stored thereon for determining a parameter of a photodetector according to the subject methods are also provided.