G01J3/4531

Ultra-miniature spatial heterodyne spectrometer

Ultra-miniature spatial heterodyne spectrometers (SHSs) are presented. Ultra-miniature SHSs in accordance with the invention, comprise a beam-splitter and gratings configured to generate a fringe pattern for spectroscopic detection. Many embodiments include input optics and a sensor and are configured in a way to omit collimating optics and imaging optics from the SHS. Compared to conventional SHSs known in the art, the present invention enables fewer parts, significantly smaller and lighter SHSs, are more efficient and robust, and require less maintenance. Many embodiments are field-deployable, in that such embodiments can be deployed for hand held use in real-world or remote activities outside of research or diagnostic facilities.

APPARATUS, SYSTEMS, AND METHODS FOR DETECTING LIGHT
20220026193 · 2022-01-27 ·

Systems or apparatuses may include a spatial modulator for spatially modulating light to produce spatially modulated light, a dispersing element for dispersing the modulated light to produce spatially modulated and dispersed light, a polarization-sensitive displacement element for providing a polarization dependent displacement of the dispersed light, and a detector for detecting the spatially modulated, dispersed and displaced light. The system and/or apparatus may include a broadband light source for providing broadband light, a linear polarizer for polarizing the broadband light, a double path interferometer including a sample path via the object and a reference path, a beam splitter for superposing a portion of the light from the sample path and a portion of the light from the reference path to create superposed light for spatial modulation, and/or a processor for processing an output of the detector to produce a three-dimensional image of the object.

High-throughput compact static-Fourier-transform spectrometer

Systems and methods which provide a high-throughput point source light coupling structure implementing a condenser configured according to one or more condenser configuration rules are described. Embodiments of a high-throughput point source light coupling structure utilize a birefringent plate configuration in combination with a condenser and point source to provide a light coupler structure for a birefringent-static-Fourier transform interferometer implementation. According to some examples, the optical axis of a first and second birefringent plate of a birefringent plate configuration are not in the same plane. A condenser of a high-throughput point source light coupling structure of embodiments is provided in a defined (e.g., spaced, relational, etc.) relationship with respect to the point source and/or a camera lens used in capturing an interference pattern generated by the light coupling structure. High-throughput point source light coupling structures herein may be provided as external accessories for processor-based mobile devices having image capturing capabilities.

Light interference generator and interference imaging device

An interference imaging device includes a light interference generator that includes: a light wave splitter configured to reflect a part of incident light and to allow a remaining part of the incident light to pass through; a phase modulator configured to modulate a phase of incident light that has passed through the light wave splitter; and a reflector configured to reflect the phase-modulated incident light from the phase modulator so that the reflected, phase-modulated incident light overlaps with incident light that has been reflected by the light wave splitter.

FOURIER TRANSFORM SPECTROMETER

Systems and methods for spectrometry are disclosed. In some embodiments, the system comprises a Fourier Transform Spectrometer (FTS) comprising a waveguide and a delay element. In some embodiments, the method comprises determining a power spectral density of an input optical signal via the FTS.

SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY

A method for adaptive dual frequency-comb spectroscopy includes repeatedly (i) recording a single interferogram with a dual frequency-comb spectrometer, (ii) averaging the single interferogram into an averaged interferogram, and (iii) determining a signal-to-noise ratio (SNR) of the averaged interferogram, until the SNR of the averaged interferogram exceeds a SNR threshold. In certain embodiments, determining the SNR includes determining a signal amplitude of a center burst of the averaged interferogram and determining a noise level of the averaged interferogram from data points of the averaged interferogram located away from the center burst. In certain embodiments, determining the SNR includes Fourier transforming the averaged interferogram into a frequency spectrum and numerically integrating the frequency spectrum.

Monolithic assembly of miniature reflective cyclical spatial heterodyne spectrometer interferometry systems

Novel monolithic reflective spatial heterodyne spectrometers (SHS) interferometer systems are presented. Monolithic systems in accordance with the invention have a single supporting structure wherein input optics, output optics, a flat mirror, a roof mirror, and a symmetric grating are affixed. Embodiments of the invention contain only fixed parts, and the optics do not move in relation to the supporting structure. Embodiments of the present invention enables smaller, lighter, and more robust reflective SHS systems as compared to conventional interferometry. Additionally, embodiments of the present invention require less time and skill for construction and maintenance, and is a better economic option. Additional embodiments can include multiple interferometer systems in a single supporting structure.

MEMS DEVICE FOR INTERFEROMETRIC SPECTROSCOPY
20230375408 · 2023-11-23 ·

The present application relates to a system for performing time-resolved interferometric spectroscopy of incoming light. In some embodiments, the system includes one or more optical elements, a photo-detector, a capacitance detector, and one or more processors. Upon application of a varying input signal to the one or more optical elements, a change to an optical characteristic is caused resulting in a changing interference pattern produced by the incoming light incident on the one or more optical elements. During the application of the varying input signal, the photo-detector may detect an intensity of light output from the one or more optical elements and the capacitance detector may detect a capacitance of the one or more optical elements.

Fabry-Perot Fourier transform spectrometer
11415460 · 2022-08-16 · ·

A spatial Fourier transform spectrometer is disclosed. The Fourier transform spectrometer includes a Fabry-Perot interferometer with first and second optical surfaces. The gap between the first and second optical surfaces spatially varies in a direction that is orthogonal to the optical axis of the Fourier transform spectrometer. The Fabry-Perot interferometer creates an interference pattern from input light. An image of the interference pattern is captured by a detector, which is communicatively coupled to a processor. The processor is configured to process the interference pattern image to determine information about the spectral content of the input light.

Spectral measurement device and spectral measurement method

A combining light emitted from a measurement point of an object to be measured into one parallel light beam by combining optical system; dividing, by phase shifter, parallel light beam emitted from combining optical system into first and second light beam, emitting first and second light beam toward light-receiving face while providing an optical path length difference between the first and second light beam, and causing the first and second light beam to planarly enter the light-receiving face so that at least a part of an incident region of first light beam on the light-receiving face and at least a part of an incident region of second light beam overlap with each other; and obtaining an interferogram at measurement point based on intensity distribution of light in a region where an incident region of the first and second light beam on light-receiving face overlap, and acquiring spectrum by Fourier-transforming interferogram.