Aspects of the disclosure relate to a self-referenced spectrometer for providing simultaneous measurement of a background or reference spectral density and a sample or other spectral density. The self-referenced spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interfering beam and a second optical path to produce a second interfering beam, where each interfering beam is produced prior to an output of the interferometer. The spectrometer further includes a detector optically coupled to simultaneously detect a first interference signal produced from the first interfering beam and a second interference signal produced from the second interfering beam, and a processor configured to process the first interference signal and the second interference signal and to utilize the second interference signal as a reference signal in processing the first interference signal.

We disclose an on-chip photonic spectroscopy system capable of dramatically improving the signal-to-noise ratio (SNR), dynamic range, and reconstruction quality of Fourier transform spectrometers. Secondly, we disclose a system of components that makes up a complete on-chip RF spectrum analyzer with low-cost and high-performance.

Systems and methods are disclosed herein for measuring a fundamental mode vibrational spectrum of materials and substances in the Mid-IR spectral range of 2.5 μm to 14 μm wavelength. In one embodiment, a Mid-infrared FT-IR spectrometer system measures, identifies, or quantifies substances in the spectral range 2.5 μm to 14 μm. The system includes an infrared Micro-Electro-Mechanical System (MEMS) single element emitter light source. The light source is configured in operation to be electrically pulsed and to emit electromagnetic radiation in the wavelength range from 2.5 μm to 14 μm and with integral energy concentrating optic to provide energy for a spectral absorption process. A scanning beam splitter is positioned in an interferometer optical path with fixed angle mirrors and a thermal detector having a sensitivity to determine a maximum optical sensitivity of the system.

An interferometer system comprises a light redirecting system for splitting an input light beam into two secondary light beams to respectively propagate along a first optical arm and a second optical arm, and for recombining the secondary light beams after exiting the optical arms. The interferometer system also comprises a multipass optical cell positioned at the second optical arm for effecting a predetermined optical path length within the second arm.

A device for the collection of X-rays includes at least one multi-reflection reflector cone. The multi-reflection reflector cone has a focal axis. A first portion of the multi-reflection reflector cone is oriented at a first angle to the focal axis, and a second portion of the multi-reflection reflector cone is oriented at a second angle to the focal axis.

An optical module includes a mirror unit and a beam splitter unit. The mirror unit includes a base with a main surface, a movable mirror, a first fixed mirror, and a drive unit. The beam splitter unit constitutes a first interference optical system for measurement light along with the movable mirror and the first fixed mirror. A mirror surface of the movable mirror and a mirror surface of the first fixed mirror follow a plane parallel to the main surface and face one side in a first direction perpendicular to the main surface. The movable mirror, the drive unit, and at least a part of an optical path between the beam splitter unit and the first fixed mirror are disposed in an airtight space.

A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The mirror device 20 is provided with a light passage portion 24 that constitutes a first portion of an optical path between the beam splitter unit 3 and the fixed mirror 16. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a second portion of the optical path between the beam splitter unit 3 and the fixed mirror 16. A second surface 21b of the base 21 and a third surface 13a of the optical function member 13 are joined to each other.

We disclose an on-chip photonic spectroscopy system capable of dramatically improving the signal-to-noise ratio (SNR), dynamic range, and reconstruction quality of Fourier transform spectrometers. Secondly, we disclose a system of components that makes up a complete on-chip RF spectrum analyzer with low-cost and high-performance.

An optical interferometer includes a beam splitter module and an optical sensor. The beam splitter module includes a lens assembly and a splitter cube. A light incident surface of the splitter cube is substantially orthogonal to an optical axis of the lens assembly. An acute angle is between the light incident surface and a light splitting surface of the splitter cube. A sampling surface of the splitter cube is substantially parallel to the light incident surface. A light reflecting surface of the splitter cube is substantially orthogonal to the light incident surface. The light incident surface is closer to the lens assembly than the sampling surface. A reference arm is defined between a splitter position on the light splitting surface and the light reflecting surface, a sample arm is defined between the splitter position and the sampling surface, and the reference arm is longer than the sample arm.

A typical configuration of the angle adjustment mechanism according to the present invention is provided with a parabolic mirror, a housing accommodating a parabolic mirror, a screw including a head arranged outside the housing and a shaft engaged with the parabolic mirror through a hole formed in the housing, and a base portion in contact with both the housing and the parabolic mirror. A force is applied to an engaging portion of the parabolic mirror in a direction approaching the housing and a force is applied to a portion of the parabolic mirror in contact with the base portion in a direction away from the housing. The angle of the parabolic mirror with respect to the housing changes in accordance with the change in the length of a portion where the shaft and the parabolic mirror engage.