An artifact caused by secondary reflection is reduced. An imaging device according to an embodiment includes: a diffuser (110) that converts incident light into scattered light whose diameter is expanded in accordance with a propagation distance and outputs the scattered light; and a light receiver (132) that converts light diffused by the diffuser into an electric signal.

An artifact caused by secondary reflection is reduced. An imaging device according to an embodiment includes: a diffuser (110) that converts incident light into scattered light whose diameter is expanded in accordance with a propagation distance and outputs the scattered light; and a light receiver (132) that converts light diffused by the diffuser into an electric signal.

An additive manufacturing apparatus includes a laser and a detection system. The laser emits a laser beam to heat a powder bed to form a melt pool, and the melt pool emits light proportional to a temperature of the melt pool. The detection system includes a spectral disperser and one of a) two or more on-axis sensors or b) a line scanner. The two or more on-axis sensors or the line scanner are/is located along an axis of the emitted light, the detection system receives the emitted light from the melt pool, and an intensity of the emitted light detected by the a) two or more on-axis sensors or the b) line scanner is compared with a blackbody spectral map at a particular wavelength of the emitted light to determine a temperature of the melt pool.

An additive manufacturing apparatus includes a laser and a detection system. The laser emits a laser beam to heat a powder bed to form a melt pool, and the melt pool emits light proportional to a temperature of the melt pool. The detection system includes a spectral disperser and one of a) two or more on-axis sensors or b) a line scanner. The two or more on-axis sensors or the line scanner are/is located along an axis of the emitted light, the detection system receives the emitted light from the melt pool, and an intensity of the emitted light detected by the a) two or more on-axis sensors or the b) line scanner is compared with a blackbody spectral map at a particular wavelength of the emitted light to determine a temperature of the melt pool.

An imaging apparatus includes an imaging optical system that has a light transmission characteristic of transmitting near-infrared light in a near-infrared light wavelength range including 1550 nm, and an imaging sensor that outputs an imaging signal by imaging the near-infrared light transmitted through the imaging optical system, the imaging sensor has sensitivity to heat radiation from a subject, and the imaging signal includes information regarding a heat radiation image by the heat radiation.

A radiation thermometer 100 includes two infrared detectors 1 and 1′ and a temperature calculator 2. The infrared detectors 1 and 1′ each have a predetermined measurement visual field and detect the amount of infrared rays incident from the measurement visual field. The temperature calculator 2 calculates the temperature of a measurement target region Xa based on the amounts of infrared rays detected by the respective infrared detectors 1 and 1′. The measurement target region Xa is included in the measurement visual fields of the respective infrared detectors 1 and 1′, and the sizes of the respective measurement visual fields are set to be different frm each other with respect to the measurement target region Xa.

Epoxy-based inline infrared (IR) filter assembly, and manufacture and use of the same. Co-axial infrared filter assemblies comprise a substantially cylindrical filter body forming a central cavity characterized by opposing holes at each end. The filter body forms an outer conductor, and SMA connectors coupled to the opposing holes at each end of the body are electrically coupled to form an inner conductor positioned along a long axis of the filter body. An infrared absorbing material (such as castable epoxy resin) fills the central cavity of the filter body. Methods for producing the co-axial infrared filter include pressing SMA connectors into the respective ends of the filter body, electrically coupling the SMA connectors, and filling the filter body with epoxy. Electronic systems for operating a dark matter detector include a feedline comprising a coaxial filter configured to advantageously block infrared noise.

A method and a system method for real-time wide-field dynamic temperature sensing of an object, the method comprising producing wide-field illumination to upconverting nanoparticles at the object plane, collecting a light emitted by the upconverting nanoparticles, dividing a collected light into a reflected component and a transmitted component; imaging the reflected component into a first image, imaging the transmitted component into a second image; processing the images; and reconstruction of the object from resulting proceed images.

An apparatus for measuring a temperature of an assembly that is internal to a process chamber. The apparatus may include a light pipe positioned between a lamp radiation filtering window and the assembly, the light pipe has a first end with a bevel configured to redirect infrared radiation emitted from the assembly through the light pipe and has a second end distal to the first end, an optical assembly configured to collimate, filter, and focus infrared radiation from the second end of the light pipe, an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation, a temperature circuit that transforms the at least one signal into a temperature value, and a controller that is configured to receive the temperature value and to make adjustments to other process parameters of process chamber based on the temperature value.

An apparatus for measuring a temperature of an assembly that is internal to a process chamber. The apparatus may include a light pipe positioned between a lamp radiation filtering window and the assembly, the light pipe has a first end with a bevel configured to redirect infrared radiation emitted from the assembly through the light pipe and has a second end distal to the first end, an optical assembly configured to collimate, filter, and focus infrared radiation from the second end of the light pipe, an optical detector configured to receive an output from the optical assembly and generate at least one signal representative of the infrared radiation, a temperature circuit that transforms the at least one signal into a temperature value, and a controller that is configured to receive the temperature value and to make adjustments to other process parameters of process chamber based on the temperature value.