Provided herein is an infrared spectroscopy technique capable of performing spectroscopic analysis on infrared rays in a broad infrared range (including a near infrared range, a short infrared range, a mid-infrared range, a far infrared range, and an extreme infrared range). An apparatus and a method for spectroscopic analysis on infrared rays are provided, without using an image sensor having a limited response range, to generate a signal in which transmitted light for each wavelength passes through a plurality of filters having different transmittances for each wavelength and is spatially pattern-coded, restore the signal into an infrared transmittance image, discriminate a wavelength according to a transmittance of the filter from the infrared transmittance image, calculate an intensity of the light for each wavelength, and output infrared spectrum information.

A system for sensing analyte in at least partly translucent material, including one or more radiation sources configured for successively providing radiation at a first and a second wavelength, respectively, two or more waveguides for simultaneously transmitting the radiation at each wavelength provided by the radiation source, a first waveguide being a reference waveguide and a second being a sensing waveguide; and measuring means for measuring a phase difference between the radiation waves from the reference waveguide and the measuring waveguide, resp. The present method can be used for measuring contaminants such as Fe, Sn, and/or Pb in oil related products, such as carburant or lubricant.

A system for sensing analyte in at least partly translucent material, including one or more radiation sources configured for successively providing radiation at a first and a second wavelength, respectively, two or more waveguides for simultaneously transmitting the radiation at each wavelength provided by the radiation source, a first waveguide being a reference waveguide and a second being a sensing waveguide; and measuring means for measuring a phase difference between the radiation waves from the reference waveguide and the measuring waveguide, resp. The present method can be used for measuring contaminants such as Fe, Sn, and/or Pb in oil related products, such as carburant or lubricant.

A low cost, low power, passive optical methane monitoring system for fixed-position installation at oil and gas production well pads and gathering centers is disclosed. The optical methane monitoring system disclosed can be a scannable field of view Near Infrared (NIR) filter photometer to detect and quantify methane concentration in a two dimensional or a three dimensional grid above and around a facility. A randomized fiber optic bundle is disclosed that can be used to direct the total optical power from a collection lens to two or more isolated optical channels. Band pass filters isolate a desired wavelength range for transmission measurements for the two or more channels. Also disclosed is an absorption algorithm which accounts for variable background spectral intensity as well as correcting for water vapor and overall scattering effects to measure methane concentration for a given field of view.

A low cost, low power, passive optical methane monitoring system for fixed-position installation at oil and gas production well pads and gathering centers is disclosed. The optical methane monitoring system disclosed can be a scannable field of view Near Infrared (NIR) filter photometer to detect and quantify methane concentration in a two dimensional or a three dimensional grid above and around a facility. A randomized fiber optic bundle is disclosed that can be used to direct the total optical power from a collection lens to two or more isolated optical channels. Band pass filters isolate a desired wavelength range for transmission measurements for the two or more channels. Also disclosed is an absorption algorithm which accounts for variable background spectral intensity as well as correcting for water vapor and overall scattering effects to measure methane concentration for a given field of view.

An object is to measure absorbance of aqueous cosmetic materials that have not heretofore been studied for absorbance measurement, and particularly to form a uniform layer of thin film in order to ensure accurate measurement without causing these aqueous cosmetic materials, which are O/W emulsions, to undergo phase separation during measurement. As a means for achieving the foregoing, an absorbance measurement method is provided, wherein an absorbent aqueous composition is applied on the surface of a substrate, which surface has been plasma treated, arc-discharge treated, or corona-discharge treated, to achieve a contact angle with pure water of 0 to 70.0 degrees, and the applied absorbent aqueous composition is measured for absorbance.

An object is to measure absorbance of aqueous cosmetic materials that have not heretofore been studied for absorbance measurement, and particularly to form a uniform layer of thin film in order to ensure accurate measurement without causing these aqueous cosmetic materials, which are O/W emulsions, to undergo phase separation during measurement. As a means for achieving the foregoing, an absorbance measurement method is provided, wherein an absorbent aqueous composition is applied on the surface of a substrate, which surface has been plasma treated, arc-discharge treated, or corona-discharge treated, to achieve a contact angle with pure water of 0 to 70.0 degrees, and the applied absorbent aqueous composition is measured for absorbance.

An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

An infrared light source device includes: a heater portion which emits infrared light by being heated; and a cover member arranged to cover an entire circumference of the heater portion without contacting the heater portion, and having a hole formed therein for emitting the infrared light from the heater portion to outside. A material for the cover member is a pure aluminum (an aluminum alloy with a purity of 99% or more), which has a high heat reflectivity and is less likely to be denatured by heat dissipation from the heater portion.