A refractive index distribution estimating system includes an illumination optical system configured to illuminate a sample, an imaging optical system configured to form an optical sample image, an image sensor configured to capture optical images of the sample, and a processor configured to reconstruct a refractive index distribution of the sample from images. The processor performs processing including the steps of: estimating the sample; calculating the estimated sample image from a plurality of first wavefronts emanating from a plurality of modeled light sources; optimizing a refractive index distribution of the estimated sample from a plurality of second wavefronts after the first wavefronts pass through the estimated sample, the captured image, and the image of the estimated sample; updating the estimation sample by repeating calculation of the estimated sample image and optimization of the refractive index distribution of the estimated sample; and reconstructing and outputting a structure of the estimated sample.

A deflection-type refractometer with extended measurement range having, a light source generating a beam of light; a measuring cell with a sample chamber receiving a sample liquid; an optical sensor mounted on a movable platform for detecting the deflected beam of light; a driving unit configured to move the platform; a distance measurement unit for monitoring the displacement of the platform; a control unit configured to calculate the deflection of the beam of light based on the displacement of the platform and an output signal of the optical sensor to obtain a refractive index measure of the sample liquid using the calculated deflection.

A planar waveguide device (PWD) for interacting with a fluid (FLD) is disclosed, the planar waveguide device (PWD) comprising a waveguide layer (WGL) for supporting optical confinement, a coupling arrangement (CPA) for in-coupling and out-coupling of light into and from the waveguide layer (WGL), a fluid zone (FZN) for accommodating the fluid (FLD), a filter layer (FTL) arranged between the fluid zone (FZN) and the waveguide layer (WGL) in an interaction region (IAR) of the waveguide layer (WGL),
wherein the filter layer (FTL) comprises filter openings (FOP) arranged to allow the fluid (FLD) to interact with an evanescent field of light guided by the waveguide layer (WGL),
wherein the filter openings (FOP) are adapted to prevent particles (PAR) larger than a predefined size from interacting with said evanescent field,
wherein the filter openings (FOP) are arranged as line openings having their longitudinal direction in parallel with the direction of propagation (DOP) of light guided by the waveguide layer (WGL).

A plurality of light-receiving elements that are arranged in two rows are provided on a light-receiving surface of a detector. A slit image formed on this detector. One group of a plurality of the light-receiving elements are arranged consecutively in a displacement direction of the slit image to form a row (one light-receiving elements row), and another group of a plurality of the light-receiving elements are also arranged consecutively in the displacement direction of the slit image to form a row (another light-receiving elements row). The one light-receiving elements row and the other light-receiving elements row are in contact with each other.

Methods for controlling a biological manufacturing system include directing a light beam to pass through a wall of a vessel containing a first fluid generated by the biological manufacturing system, measuring an angle of refraction of the light beam in the first fluid, the angle of refraction corresponding to an angle between a propagation direction of the light beam in the first fluid and a normal to an interface between the vessel wall and the first fluid, determining information about the first fluid based on the measured angle of refraction, and adjusting a parameter of the biological manufacturing system based on the information about the first fluid.

A sensor assembly includes a passageway for a process fluid, an optical window, an optical sensor, and a nozzle. The optical sensor configured to detect an optical property of the process fluid. The optical window includes an inner surface. The nozzle configured discharge an atomized fluid in a discharge direction that intersects the inner surface of the optical window. A sensor system includes a sensor assembly and conduits for supplying a gas and a liquid to a nozzle of the sensor assembly. A method of cleaning an optical window in a sensor assembly includes forming an atomized fluid and discharging the atomized fluid in a discharge direction that intersects the optical window.

The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.

An apparatus and a method for in-situ phase determination are provided. The apparatus includes a measurement chamber configured to retain a substance, and an entrance window mounted on a side of the measurement chamber. An exit window is mounted on an opposite side of the measurement chamber, and the exit window is parallel with the entrance window. The apparatus further includes a light source configured to generate an incident light beam. The incident light beam is directed to the entrance window at a non-zero angle of incidence with respect to a normal of the entrance window. The incident light beam passes through the entrance window, the measurement chamber and the exit window to form an output light beam. A detector is positioned under the exit window and configured to collect the output light beam passing through the exit window and generate measurement data.

An optical refraction barometer measures pressure based on refractivity changes and includes: an optical light source; an optical frequency controller; a first optical phase controller; a first polarization controller; an electronic reference arm in optical communication with the first polarization controller; a second optical phase controller in optical communication with the optical frequency controller; a second polarization controller in optical communication with the second optical phase controller; an electronic sample arm in optical communication with the second polarization controller and in electrical communication with the second optical phase controller; a second sideband frequency generator; a mixer in electrical communication with the detector and the second sideband frequency generator; and a first sideband frequency generator in electrical communication with the mixer; and a dual fixed length optical cavity refractometer.

A refractive index distribution estimating system includes an illumination optical system configured to illuminate a sample, an imaging optical system configured to form an optical sample image, an image sensor configured to capture optical images of the sample, and a processor configured to reconstruct a refractive index distribution of the sample from images. The processor performs processing including the steps of: estimating the sample; calculating the estimated sample image from a plurality of first wavefronts emanating from a plurality of modeled light sources; optimizing a refractive index distribution of the estimated sample from a plurality of second wavefronts after the first wavefronts pass through the estimated sample, the captured image, and the image of the estimated sample; updating the estimation sample by repeating calculation of the estimated sample image and optimization of the refractive index distribution of the estimated sample; and reconstructing and outputting a structure of the estimated sample.