A method for determining the refractive index profile of a preform when the RIP is not substantially symmetrical. (i) The preform is scanned, starting with a first projection angle, and raw data are created representing the object through measured data. (ii) Optionally, the object is rotated and step (i) repeated iteratively until all projection angles have been scanned and all measured data have been created. (iii) The measured data are processed to form a sinogram and, if the optional step (ii) has been completed, the method proceeds to step (v). (iv) The object is rotated and steps (i) and (iii) are repeated iteratively until all projection angles have been scanned. (v) A 2D RIP is calculated. (vi) A line section of interest is selected within the 2D RIP. (vii) A fitting procedure is applied to the line section of interest. (viii) Finally, refractive index steps/gradients and dimensions are determined.

A biological component measurement apparatus includes an optical medium, a high thermal conductive film, an excitation light source, a probe light source, and a light position detector. The high thermal conductive film is higher in thermal conductivity than the optical medium, and is provided on a sample placement surface of the optical medium. The high thermal conductive film spreads heat generated from the sample irradiated with excitation light more in a first direction than in a second direction. The first direction is a traveling direction of probe light in plan view of the sample placement surface. The second direction is a direction orthogonal to the first direction in plan view of the sample placement surface.

A material application and analysis device may comprise at least one analysis device for optically monitoring at least a first material application and a second material application, and a material application element for applying the second material application to a substrate provided with the first material application at least in sections. The material application element is arranged between a first radiation source and detection device assembly and a second radiation source and detection device assembly, wherein by the first radiation source and detection device assembly the first material application is detectable and wherein by the second radiation source and detection device assembly the second material application is detectable. Furthermore, first image data are processed and second image data are processed, and the processed first image data are evaluated with respect to a physical parameter and the processed second image data are evaluated with respect to a geometrical parameter.

A photonic crystal fiber-based surface plasmon resonance (PCF-SPR) sensor to detect a refractive index of an analyte includes a fiber core having a first scale-down (SCD) cavity having a first diameter, multiple second SCD cavities each having a second diameter, multiple third SCD cavities each having a third diameter, and a groove. A surface of the groove is coated with a metal having a first thickness. The sensor includes an analyte channel having a second thickness and is in contact with the metal. The analyte channel surrounds the fiber core and is configured to stream the analyte. The sensor further includes an outer layer surrounding the analyte channel. The refractive index of the analyte is detected based on an intensity lost by an incident light passing through the PCF-SPR sensor due to dissipation of plasmonic energy.

A method for determining the refractive index profile of a preform when the RIP is not substantially symmetrical. (i) The preform is scanned, starting with a first projection angle, and raw data are created representing the object through measured data. (ii) Optionally, the object is rotated and step (i) repeated iteratively until all projection angles have been scanned and all measured data have been created. (iii) The measured data are processed to form a sinogram and, if the optional step (ii) has been completed, the method proceeds to step (v). (iv) The object is rotated and steps (i) and (iii) are repeated iteratively until all projection angles have been scanned. (v) A 2D RIP is calculated. (vi) A line section of interest is selected within the 2D RIP. (vii) A fitting procedure is applied to the line section of interest. (viii) Finally, refractive index steps/gradients and dimensions are determined.

Provided is a device for measuring a refraction coefficient and an extinction coefficient. The device for measuring a refraction coefficient and an extinction coefficient may comprise: a light source for generating EUV light; a target for transmitting and reflecting the EUV light generated from the light source; a reflector disposed under the target to reflect the EUV light having been transmitted through the target; and a detector for detecting an interference pattern by collecting the EUV light having re-transmitted through the target after being reflected from the reflector and the EUV light reflected from the target, wherein a refraction coefficient and an extinction coefficient of the target may be detected by comparing a first interference pattern detected through the target and having a first thickness with a second interference pattern detected through the target and having a second thickness.

A method for determining a refractive index profile of an optical object having a cylindrical surface includes: (a) scanning the surface at a first plurality of scanning locations with a pinhole aperture in a path of one or more optical beams; (b) measuring a first deflection function based detecting the optical beams after deflection by the optical object for each of the first plurality of scanning locations; (c) scanning the surface at a second plurality of scanning locations where the path of the optical beams is free of the pinhole aperture; (d) measuring a second deflection function based on detecting the optical beams after deflection by the optical object for each of the second plurality of scanning locations; (e) merging at least portions of the first and second deflection functions to obtain a composite deflection function; and (f) calculating the refractive index profile using the composite deflection function.

The invention relates to a method for determining a refractive index of an optical test object (100), which has a first surface (102) and a second surface (104) arranged at a wedge angle () to the first surface (102), the method comprising the following steps: detecting a first reflection light beam (401), a second reflection light beam (402) and a third reflection light beam (413), wherein the first reflection light beam (401) represents a light beam reflected at the first surface (102) and wherein the second reflection light beam (402) represents a light beam reflected at the second surface (104) and wherein the third reflection light beam (413) represents a light beam reflected at a mirror element (420), determining a first angle (a) between the first reflection light beam (401) and the second reflection light beam (402) and determining a second angle () with the aid of the third reflection light beam (413), and calculating (315) the refractive index (n) using the first angle (a) and the second angle ().