Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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21/00
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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G01N21/17
Systems in which incident light is modified in accordance with the properties of the material investigated
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G01N21/41
Refractivity; Phase-affecting properties, e.g. optical path length
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G01N21/45
using interferometric methods; using Schlieren methods
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G01N2021/458
using interferential sensor, e.g. sensor fibre, possibly on optical waveguide
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