The invention relates to methods and apparatus for determining properties of a surface. Embodiments disclosed include an apparatus for measuring a surface charge of a sample, comprising: a sample holder having an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the electrodes such that a planar surface of the sample is aligned orthogonal to the electrode surfaces; a measurement chamber for containing a measurement liquid and having an open end configured to receive the sample holder to position the electrodes in a preset orientation; a laser light source positioned and configured to direct a laser beam through the measurement chamber between the electrodes and parallel to the planar surface of the sample when the sample holder is received in the measurement chamber; and a detector positioned and configured to detect scattered light from the measurement volume, wherein the apparatus is configured to allow for detection of the scattered light by the detector over a range of distances from the surface of the sample.

The invention relates to methods and apparatus for determining properties of a surface. Embodiments disclosed include an apparatus for measuring a surface charge of a sample, comprising: a sample holder having an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the electrodes such that a planar surface of the sample is aligned orthogonal to the electrode surfaces; a measurement chamber for containing a measurement liquid and having an open end configured to receive the sample holder to position the electrodes in a preset orientation; a laser light source positioned and configured to direct a laser beam through the measurement chamber between the electrodes and parallel to the planar surface of the sample when the sample holder is received in the measurement chamber; and a detector positioned and configured to detect scattered light from the measurement volume, wherein the apparatus is configured to allow for detection of the scattered light by the detector over a range of distances from the surface of the sample.

The purpose of the present invention is to provide an automatic analysis device capable of efficiently performing a plurality of analyses, while reducing the footprint and cost of the device. Provided is an automatic analysis device characterized by being provided with containers for containing samples, one rack for placing the containers thereon, and a control unit, the control unit generating, with respect to the one rack, a plurality of registration patterns in which information of the positions where the containers are disposed, and information of the samples contained in the containers are correlated with each other, storing the registration patterns thus generated, applying, to the one rack, one registration pattern selected from among the registration patterns thus stored, and analyzing the samples. Also provided is an analysis method using the device.

The purpose of the present invention is to provide an automatic analysis device capable of efficiently performing a plurality of analyses, while reducing the footprint and cost of the device. Provided is an automatic analysis device characterized by being provided with containers for containing samples, one rack for placing the containers thereon, and a control unit, the control unit generating, with respect to the one rack, a plurality of registration patterns in which information of the positions where the containers are disposed, and information of the samples contained in the containers are correlated with each other, storing the registration patterns thus generated, applying, to the one rack, one registration pattern selected from among the registration patterns thus stored, and analyzing the samples. Also provided is an analysis method using the device.

This lensless imaging system comprises a receiving support configured to receive a sample, a light source configured to emit a light beam illuminating the sample in an illumination direction, the light source including a diode and a diaphragm, the diaphragm being positioned between the diode and the receiving support in the lighting direction, and a matrix photodetector configured to acquire at least one image of the sample, each image being formed by radiation emitted by the illuminated sample and including at least one elementary diffraction pattern, the receiving support being positioned between the light source and the matrix photodetector in the illumination direction.

The system further comprises a light diffuser positioned between the diode and the diaphragm.

A nephelometer that measures turbidity of low volume suspensions using measurements of light transmitted through and/or scattered by the sample. The sample suspension is placed in a tiered cuvette adapted to facilitate measuring the turbidity of low volume samples. The lower portion of the cuvette has smaller dimensions, in horizontal cross section, than the top portion. Both lower and upper portions have angled surfaces. The lower, smaller portion of the cuvette is interrogated by the nephelometer.

A nephelometer that measures turbidity of low volume suspensions using measurements of light transmitted through and/or scattered by the sample. The sample suspension is placed in a tiered cuvette adapted to facilitate measuring the turbidity of low volume samples. The lower portion of the cuvette has smaller dimensions, in horizontal cross section, than the top portion. Both lower and upper portions have angled surfaces. The lower, smaller portion of the cuvette is interrogated by the nephelometer.

Turbidity measurement systems and methods of using the same are described. A turbidity measurement system comprise a vessel configured to hold a wellbore fluid, wherein a permeable obstruction to flow is positioned in the vessel; a light source positioned to direct light at the vessel; a light detector positioned to measure light intensity of light emitted by the light source and passing through the vessel; and a backscatter detector positioned to measure the light intensity of reflected light emitted from the light source.

Turbidity measurement systems and methods of using the same are described. A turbidity measurement system comprise a vessel configured to hold a wellbore fluid, wherein a permeable obstruction to flow is positioned in the vessel; a light source positioned to direct light at the vessel; a light detector positioned to measure light intensity of light emitted by the light source and passing through the vessel; and a backscatter detector positioned to measure the light intensity of reflected light emitted from the light source.

A test unit having a light source (e.g., a laser) for illuminating an aerosol sample directed into a test chamber and a removable insert for the test unit. The test unit includes at least one detector for detecting the effect of the aerosol sample on light, i.e., the detector detects at least one property of light after the light has illuminated the aerosol sample. The removable insert may take a number of different forms. For example, the removable insert can form at least a portion of an unsealed or sealed test chamber when installed in an operating position. Further, the removable insert may include a removable support and at least one film or collection substance connected or applied to the removable support. The at least one film could be a filter or a non-filter. The filter could be a polarization filter (i.e., horizontal or vertical) or a fluorescence filter.